Manipulation and Detection of Electron Spins by Magnetic Resonance Force Microscopy

Manipulation and Detection of Electron Spins by Magnetic Resonance Force Microscopy

Magnetic resonance force microscopy is a technique aimed at achieving three-dimensional sub-surface imaging with atomic resolution. We discuss recent progress in using ultrasensitive force detection techniques to detect small ensembles of electron spins in SiO2. Using mass-loaded cantilevers that su...

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Hauptverfasser: Rugar, D, Budakian, R, Mamin, H J, Chui, B W
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Budakian, R
Mamin, H J
Chui, B W
description Magnetic resonance force microscopy is a technique aimed at achieving three-dimensional sub-surface imaging with atomic resolution. We discuss recent progress in using ultrasensitive force detection techniques to detect small ensembles of electron spins in SiO2. Using mass-loaded cantilevers that suppress thermal vibration noise in the upper modes, we have achieved a sensitivity of equivalent to about 2 electron spins in the natural bandwidth of the measurement (0.12 Hz).
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fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_27857032</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>27857032</sourcerecordid><originalsourceid>FETCH-LOGICAL-p116t-11b3b47b8cb8ef11c5c58288683195d1086447fe17dcddaea2a7bec01aa68e3</originalsourceid><addsrcrecordid>eNotjL1OwzAURj2ARCm8gye2SP5L7IyotIDUCIkwsFXXNzfIKNghToa-PRGwnO98y7lgGyFqUyij36_Ydc6fQqjaWrdhbQMxjMsAc0iRQ-z4A82Evy_1fD-sPq3ejiFm7s-8gY9Ic0D-SjlFiEj8kKaVTcApZUzj-YZd9jBkuv3fLWsP-7fdU3F8eXze3R-LUcpqLqT02hvrHXpHvZRYYumUc5XTsi47KVxljO1J2g67DggUWE8oJEDlSG_Z3V91nNL3Qnk-fYWMNAwQKS35pKwrrdBK_wD6jkz8</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>27857032</pqid></control><display><type>conference_proceeding</type><title>Manipulation and Detection of Electron Spins by Magnetic Resonance Force Microscopy</title><source>AIP Journals Complete</source><creator>Rugar, D ; Budakian, R ; Mamin, H J ; Chui, B W</creator><creatorcontrib>Rugar, D ; Budakian, R ; Mamin, H J ; Chui, B W</creatorcontrib><description>Magnetic resonance force microscopy is a technique aimed at achieving three-dimensional sub-surface imaging with atomic resolution. We discuss recent progress in using ultrasensitive force detection techniques to detect small ensembles of electron spins in SiO2. Using mass-loaded cantilevers that suppress thermal vibration noise in the upper modes, we have achieved a sensitivity of equivalent to about 2 electron spins in the natural bandwidth of the measurement (0.12 Hz).</description><identifier>ISSN: 0094-243X</identifier><language>eng</language><ispartof>AIP conference proceedings, 2003, Vol.696, p.45-52</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780</link.rule.ids></links><search><creatorcontrib>Rugar, D</creatorcontrib><creatorcontrib>Budakian, R</creatorcontrib><creatorcontrib>Mamin, H J</creatorcontrib><creatorcontrib>Chui, B W</creatorcontrib><title>Manipulation and Detection of Electron Spins by Magnetic Resonance Force Microscopy</title><title>AIP conference proceedings</title><description>Magnetic resonance force microscopy is a technique aimed at achieving three-dimensional sub-surface imaging with atomic resolution. We discuss recent progress in using ultrasensitive force detection techniques to detect small ensembles of electron spins in SiO2. Using mass-loaded cantilevers that suppress thermal vibration noise in the upper modes, we have achieved a sensitivity of equivalent to about 2 electron spins in the natural bandwidth of the measurement (0.12 Hz).</description><issn>0094-243X</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2003</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNotjL1OwzAURj2ARCm8gye2SP5L7IyotIDUCIkwsFXXNzfIKNghToa-PRGwnO98y7lgGyFqUyij36_Ydc6fQqjaWrdhbQMxjMsAc0iRQ-z4A82Evy_1fD-sPq3ejiFm7s-8gY9Ic0D-SjlFiEj8kKaVTcApZUzj-YZd9jBkuv3fLWsP-7fdU3F8eXze3R-LUcpqLqT02hvrHXpHvZRYYumUc5XTsi47KVxljO1J2g67DggUWE8oJEDlSG_Z3V91nNL3Qnk-fYWMNAwQKS35pKwrrdBK_wD6jkz8</recordid><startdate>20031201</startdate><enddate>20031201</enddate><creator>Rugar, D</creator><creator>Budakian, R</creator><creator>Mamin, H J</creator><creator>Chui, B W</creator><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20031201</creationdate><title>Manipulation and Detection of Electron Spins by Magnetic Resonance Force Microscopy</title><author>Rugar, D ; Budakian, R ; Mamin, H J ; Chui, B W</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p116t-11b3b47b8cb8ef11c5c58288683195d1086447fe17dcddaea2a7bec01aa68e3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rugar, D</creatorcontrib><creatorcontrib>Budakian, R</creatorcontrib><creatorcontrib>Mamin, H J</creatorcontrib><creatorcontrib>Chui, B W</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rugar, D</au><au>Budakian, R</au><au>Mamin, H J</au><au>Chui, B W</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Manipulation and Detection of Electron Spins by Magnetic Resonance Force Microscopy</atitle><btitle>AIP conference proceedings</btitle><date>2003-12-01</date><risdate>2003</risdate><volume>696</volume><spage>45</spage><epage>52</epage><pages>45-52</pages><issn>0094-243X</issn><abstract>Magnetic resonance force microscopy is a technique aimed at achieving three-dimensional sub-surface imaging with atomic resolution. We discuss recent progress in using ultrasensitive force detection techniques to detect small ensembles of electron spins in SiO2. Using mass-loaded cantilevers that suppress thermal vibration noise in the upper modes, we have achieved a sensitivity of equivalent to about 2 electron spins in the natural bandwidth of the measurement (0.12 Hz).</abstract><tpages>8</tpages></addata></record>
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title Manipulation and Detection of Electron Spins by Magnetic Resonance Force Microscopy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T04%3A58%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Manipulation%20and%20Detection%20of%20Electron%20Spins%20by%20Magnetic%20Resonance%20Force%20Microscopy&rft.btitle=AIP%20conference%20proceedings&rft.au=Rugar,%20D&rft.date=2003-12-01&rft.volume=696&rft.spage=45&rft.epage=52&rft.pages=45-52&rft.issn=0094-243X&rft_id=info:doi/&rft_dat=%3Cproquest%3E27857032%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=27857032&rft_id=info:pmid/&rfr_iscdi=true