Modeling of short-gap ESD under consideration of different discharge mechanisms
Simulation of short gap electrostatic discharge (ESD) in air needs to consider two processes: a surface process and an avalanche process. Two models, a phenomenological approach and a physical approach, considering both discharge processes are proposed for the simulation of short-gap ESD. A new math...
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| Veröffentlicht in: | IEEE transactions on plasma science 2003-08, Vol.31 (4), p.736-744 |
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| container_end_page | 744 |
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| container_title | IEEE transactions on plasma science |
| container_volume | 31 |
| creator | Bonisch, S. Kalkner, W. Pommerenke, D. |
| description | Simulation of short gap electrostatic discharge (ESD) in air needs to consider two processes: a surface process and an avalanche process. Two models, a phenomenological approach and a physical approach, considering both discharge processes are proposed for the simulation of short-gap ESD. A new mathematical derivation for the modeling of the surface process is discussed in detail. A new technique to combine surface and avalanche process models is described. Measured and simulated data based on short-gap ESD are provided and compared. Advantages and drawbacks of the proposed models are discussed. Attained results should help to optimize ESD testing. |
| doi_str_mv | 10.1109/TPS.2003.815823 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_27849504</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1221860</ieee_id><sourcerecordid>27849504</sourcerecordid><originalsourceid>FETCH-LOGICAL-c412t-68b525797dc749c6b784c573ee1fc1fe2c61092773fbb768ed0d582aa22312403</originalsourceid><addsrcrecordid>eNqFkc1rGzEQxUVpoG6Scw-9LIU2p3VG0molHUu-ISEBu2cha0f2mrXkSutD_vvKcSCQQ3OaB_N7wzweId8oTCkFfT5_mk0ZAJ8qKhTjn8iEaq5rzaX4TCYAmtdcUf6FfM15DUAbAWxCHh9ih0MfllX0VV7FNNZLu62uZpfVLnSYKhdD7ouwYx_DHup67zFhGIvKbmXTEqsNFhH6vMkn5MjbIePp6zwmf66v5he39f3jzd3F7_vaNZSNdasWggmpZedko127kKpxQnJE6h31yFxbMjEpuV8sZKuwg66kspYxTlkD_JicHe5uU_y7wzyaTfkGh8EGjLtsNFAJnEteyF__JZniChpoPgbLj1q8gD_egeu4S6HENVQL2upW6QKdHyCXYs4JvdmmfmPTs6Fg9oWZUpjZF2YOhRXHz9ezNjs7-GSD6_ObTUBJo2Thvh-4HhHf1oxR1QL_B1w4nFM</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>195169689</pqid></control><display><type>article</type><title>Modeling of short-gap ESD under consideration of different discharge mechanisms</title><source>IEEE Electronic Library (IEL)</source><creator>Bonisch, S. ; Kalkner, W. ; Pommerenke, D.</creator><creatorcontrib>Bonisch, S. ; Kalkner, W. ; Pommerenke, D.</creatorcontrib><description>Simulation of short gap electrostatic discharge (ESD) in air needs to consider two processes: a surface process and an avalanche process. Two models, a phenomenological approach and a physical approach, considering both discharge processes are proposed for the simulation of short-gap ESD. A new mathematical derivation for the modeling of the surface process is discussed in detail. A new technique to combine surface and avalanche process models is described. Measured and simulated data based on short-gap ESD are provided and compared. Advantages and drawbacks of the proposed models are discussed. Attained results should help to optimize ESD testing.</description><identifier>ISSN: 0093-3813</identifier><identifier>EISSN: 1939-9375</identifier><identifier>DOI: 10.1109/TPS.2003.815823</identifier><identifier>CODEN: ITPSBD</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Avalanches ; Circuit simulation ; Coaxial components ; Computer simulation ; Current measurement ; Derivation ; Discharge ; Electric discharges ; Electrodes ; Electronics ; Electrostatic discharge ; Electrostatic discharges ; Exact sciences and technology ; Mathematical models ; Other gas discharges ; Physics ; Physics of gases, plasmas and electric discharges ; Physics of plasmas and electric discharges ; Plasma ; Rough surfaces ; Sparks ; Surface discharges ; Surface roughness ; Voltage</subject><ispartof>IEEE transactions on plasma science, 2003-08, Vol.31 (4), p.736-744</ispartof><rights>2003 INIST-CNRS</rights><rights>Copyright Institute of Electrical and Electronics Engineers, Inc. (IEEE) Aug 2003</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c412t-68b525797dc749c6b784c573ee1fc1fe2c61092773fbb768ed0d582aa22312403</citedby><cites>FETCH-LOGICAL-c412t-68b525797dc749c6b784c573ee1fc1fe2c61092773fbb768ed0d582aa22312403</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1221860$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1221860$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=15073387$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Bonisch, S.</creatorcontrib><creatorcontrib>Kalkner, W.</creatorcontrib><creatorcontrib>Pommerenke, D.</creatorcontrib><title>Modeling of short-gap ESD under consideration of different discharge mechanisms</title><title>IEEE transactions on plasma science</title><addtitle>TPS</addtitle><description>Simulation of short gap electrostatic discharge (ESD) in air needs to consider two processes: a surface process and an avalanche process. Two models, a phenomenological approach and a physical approach, considering both discharge processes are proposed for the simulation of short-gap ESD. A new mathematical derivation for the modeling of the surface process is discussed in detail. A new technique to combine surface and avalanche process models is described. Measured and simulated data based on short-gap ESD are provided and compared. Advantages and drawbacks of the proposed models are discussed. Attained results should help to optimize ESD testing.</description><subject>Avalanches</subject><subject>Circuit simulation</subject><subject>Coaxial components</subject><subject>Computer simulation</subject><subject>Current measurement</subject><subject>Derivation</subject><subject>Discharge</subject><subject>Electric discharges</subject><subject>Electrodes</subject><subject>Electronics</subject><subject>Electrostatic discharge</subject><subject>Electrostatic discharges</subject><subject>Exact sciences and technology</subject><subject>Mathematical models</subject><subject>Other gas discharges</subject><subject>Physics</subject><subject>Physics of gases, plasmas and electric discharges</subject><subject>Physics of plasmas and electric discharges</subject><subject>Plasma</subject><subject>Rough surfaces</subject><subject>Sparks</subject><subject>Surface discharges</subject><subject>Surface roughness</subject><subject>Voltage</subject><issn>0093-3813</issn><issn>1939-9375</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqFkc1rGzEQxUVpoG6Scw-9LIU2p3VG0molHUu-ISEBu2cha0f2mrXkSutD_vvKcSCQQ3OaB_N7wzweId8oTCkFfT5_mk0ZAJ8qKhTjn8iEaq5rzaX4TCYAmtdcUf6FfM15DUAbAWxCHh9ih0MfllX0VV7FNNZLu62uZpfVLnSYKhdD7ouwYx_DHup67zFhGIvKbmXTEqsNFhH6vMkn5MjbIePp6zwmf66v5he39f3jzd3F7_vaNZSNdasWggmpZedko127kKpxQnJE6h31yFxbMjEpuV8sZKuwg66kspYxTlkD_JicHe5uU_y7wzyaTfkGh8EGjLtsNFAJnEteyF__JZniChpoPgbLj1q8gD_egeu4S6HENVQL2upW6QKdHyCXYs4JvdmmfmPTs6Fg9oWZUpjZF2YOhRXHz9ezNjs7-GSD6_ObTUBJo2Thvh-4HhHf1oxR1QL_B1w4nFM</recordid><startdate>20030801</startdate><enddate>20030801</enddate><creator>Bonisch, S.</creator><creator>Kalkner, W.</creator><creator>Pommerenke, D.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>H8D</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20030801</creationdate><title>Modeling of short-gap ESD under consideration of different discharge mechanisms</title><author>Bonisch, S. ; Kalkner, W. ; Pommerenke, D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c412t-68b525797dc749c6b784c573ee1fc1fe2c61092773fbb768ed0d582aa22312403</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Avalanches</topic><topic>Circuit simulation</topic><topic>Coaxial components</topic><topic>Computer simulation</topic><topic>Current measurement</topic><topic>Derivation</topic><topic>Discharge</topic><topic>Electric discharges</topic><topic>Electrodes</topic><topic>Electronics</topic><topic>Electrostatic discharge</topic><topic>Electrostatic discharges</topic><topic>Exact sciences and technology</topic><topic>Mathematical models</topic><topic>Other gas discharges</topic><topic>Physics</topic><topic>Physics of gases, plasmas and electric discharges</topic><topic>Physics of plasmas and electric discharges</topic><topic>Plasma</topic><topic>Rough surfaces</topic><topic>Sparks</topic><topic>Surface discharges</topic><topic>Surface roughness</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bonisch, S.</creatorcontrib><creatorcontrib>Kalkner, W.</creatorcontrib><creatorcontrib>Pommerenke, D.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Aerospace Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on plasma science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bonisch, S.</au><au>Kalkner, W.</au><au>Pommerenke, D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Modeling of short-gap ESD under consideration of different discharge mechanisms</atitle><jtitle>IEEE transactions on plasma science</jtitle><stitle>TPS</stitle><date>2003-08-01</date><risdate>2003</risdate><volume>31</volume><issue>4</issue><spage>736</spage><epage>744</epage><pages>736-744</pages><issn>0093-3813</issn><eissn>1939-9375</eissn><coden>ITPSBD</coden><abstract>Simulation of short gap electrostatic discharge (ESD) in air needs to consider two processes: a surface process and an avalanche process. Two models, a phenomenological approach and a physical approach, considering both discharge processes are proposed for the simulation of short-gap ESD. A new mathematical derivation for the modeling of the surface process is discussed in detail. A new technique to combine surface and avalanche process models is described. Measured and simulated data based on short-gap ESD are provided and compared. Advantages and drawbacks of the proposed models are discussed. Attained results should help to optimize ESD testing.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TPS.2003.815823</doi><tpages>9</tpages></addata></record> |
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| ispartof | IEEE transactions on plasma science, 2003-08, Vol.31 (4), p.736-744 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Avalanches Circuit simulation Coaxial components Computer simulation Current measurement Derivation Discharge Electric discharges Electrodes Electronics Electrostatic discharge Electrostatic discharges Exact sciences and technology Mathematical models Other gas discharges Physics Physics of gases, plasmas and electric discharges Physics of plasmas and electric discharges Plasma Rough surfaces Sparks Surface discharges Surface roughness Voltage |
| title | Modeling of short-gap ESD under consideration of different discharge mechanisms |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T12%3A59%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Modeling%20of%20short-gap%20ESD%20under%20consideration%20of%20different%20discharge%20mechanisms&rft.jtitle=IEEE%20transactions%20on%20plasma%20science&rft.au=Bonisch,%20S.&rft.date=2003-08-01&rft.volume=31&rft.issue=4&rft.spage=736&rft.epage=744&rft.pages=736-744&rft.issn=0093-3813&rft.eissn=1939-9375&rft.coden=ITPSBD&rft_id=info:doi/10.1109/TPS.2003.815823&rft_dat=%3Cproquest_RIE%3E27849504%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=195169689&rft_id=info:pmid/&rft_ieee_id=1221860&rfr_iscdi=true |