Lattice-matched Al0.95Ga0.05AsSb oxide for current confinement in InP-based long wavelength VCSELs
We examine, for the first time, Al0.95Ga0.05AsSb-oxide as the lateral current confining layer for InP-based optoelectronic devices including vertical cavity surface emitting lasers. In this paper, Al0.95Ga0.05AsSb-oxide confined broad area edge emitting lasers were used to study current confinement...
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Veröffentlicht in: | Journal of crystal growth 2003-04, Vol.251 (1-4), p.766-770 |
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container_title | Journal of crystal growth |
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creator | REDDY, M. H. M BUELL, D. A ASANO, T KODA, R FEEZELL, D HUNTINGTON, A. S COLDREN, L. A |
description | We examine, for the first time, Al0.95Ga0.05AsSb-oxide as the lateral current confining layer for InP-based optoelectronic devices including vertical cavity surface emitting lasers. In this paper, Al0.95Ga0.05AsSb-oxide confined broad area edge emitting lasers were used to study current confinement and optical loss. Results show that the threshold current density scales effectively down to a confining layer width of 6.5 *mm and the differential efficiency remains unchanged down to 4 *mm, indicating no aperture induced excess loss. This suggests that thin AlGaAsSb layers, at low oxidation temperatures, may get oxidized homogeneously without leaving metallic-Sb behind. |
doi_str_mv | 10.1016/S0022-0248(02)02389-8 |
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A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Lattice-matched Al0.95Ga0.05AsSb oxide for current confinement in InP-based long wavelength VCSELs</atitle><jtitle>Journal of crystal growth</jtitle><date>2003-04-01</date><risdate>2003</risdate><volume>251</volume><issue>1-4</issue><spage>766</spage><epage>770</epage><pages>766-770</pages><issn>0022-0248</issn><eissn>1873-5002</eissn><coden>JCRGAE</coden><abstract>We examine, for the first time, Al0.95Ga0.05AsSb-oxide as the lateral current confining layer for InP-based optoelectronic devices including vertical cavity surface emitting lasers. In this paper, Al0.95Ga0.05AsSb-oxide confined broad area edge emitting lasers were used to study current confinement and optical loss. Results show that the threshold current density scales effectively down to a confining layer width of 6.5 *mm and the differential efficiency remains unchanged down to 4 *mm, indicating no aperture induced excess loss. 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source | ScienceDirect Journals (5 years ago - present) |
subjects | Exact sciences and technology Fundamental areas of phenomenology (including applications) Lasers Optics Physics Semiconductor lasers laser diodes |
title | Lattice-matched Al0.95Ga0.05AsSb oxide for current confinement in InP-based long wavelength VCSELs |
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