Double pinhole diffraction of white synchrotron radiation
The spatial coherence of hard X-rays provided by a bending magnet of the storage ring BESSY II was investigated by performing Young's interference experiment. The interference pattern was created by the diffraction of two 2 μm pinholes drilled into a thin tantalum foil by focused ion sputtering...
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| Veröffentlicht in: | Physica. B, Condensed matter Condensed matter, 2003-08, Vol.336 (1), p.63-67 |
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| container_end_page | 67 |
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| container_issue | 1 |
| container_start_page | 63 |
| container_title | Physica. B, Condensed matter |
| container_volume | 336 |
| creator | Leitenberger, W. Wendrock, H. Bischoff, L. Panzner, T. Pietsch, U. Grenzer, J. Pucher, A. |
| description | The spatial coherence of hard X-rays provided by a bending magnet of the storage ring BESSY II was investigated by performing Young's interference experiment. The interference pattern was created by the diffraction of two 2
μm pinholes drilled into a thin tantalum foil by focused ion sputtering. Using an energy-dispersive detector with an energy resolution of 200
eV the interference patterns were detected simultaneously between 5
keV<
E |
| doi_str_mv | 10.1016/S0921-4526(03)00270-9 |
| format | Article |
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μm pinholes drilled into a thin tantalum foil by focused ion sputtering. Using an energy-dispersive detector with an energy resolution of 200
eV the interference patterns were detected simultaneously between 5
keV<
E<16
keV scanning a 5
μm pinhole through the detector window. The set-up is suitable to characterize the coherence properties of the beamline in a simple manner, i.e. to deduce parameters as the effective source size, the coherence length and the visibility. For the present case the visibility was close to 100% at 5
keV and decreased to 20% at 16
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μm pinholes drilled into a thin tantalum foil by focused ion sputtering. Using an energy-dispersive detector with an energy resolution of 200
eV the interference patterns were detected simultaneously between 5
keV<
E<16
keV scanning a 5
μm pinhole through the detector window. The set-up is suitable to characterize the coherence properties of the beamline in a simple manner, i.e. to deduce parameters as the effective source size, the coherence length and the visibility. For the present case the visibility was close to 100% at 5
keV and decreased to 20% at 16
keV.</description><subject>Coherent X-rays</subject><subject>Double slit experiment</subject><subject>Exact sciences and technology</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Physics</subject><subject>Synchrotron radiation instrumentation</subject><subject>White X-ray radiation</subject><subject>X- and γ-ray instruments and techniques</subject><issn>0921-4526</issn><issn>1873-2135</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNqFkElLBDEQhYMoOI7-BKEvih5as3RnOYmMKwx4UM8hna4wkZ7OmPQo8-_NLOjRuhRUfa8e9RA6JfiKYMKvX7GipKxqyi8wu8SYClyqPTQiUrCSElbvo9EvcoiOUvrAuYggI6TuwrLpoFj4fhZyb71z0djBh74Irvie-QGKtOrtLIYh5mE0rTfr9TE6cKZLcLLrY_T-cP82eSqnL4_Pk9tpaRmXQ-kqJwxIIQ1piKKCKGUb4yhvgQlnhFSVJC3BDsua08YKq0wjhLK8taZqgI3R-fbuIobPJaRBz32y0HWmh7BMmgpJuah5BustaGNIKYLTi-jnJq40wXodlN4EpdcpaMz0Jiitsu5sZ2CSNV1-v7c-_YkrqSSvWeZuthzkb788RJ2sh95C6yPYQbfB_-P0A8CpfSs</recordid><startdate>20030801</startdate><enddate>20030801</enddate><creator>Leitenberger, W.</creator><creator>Wendrock, H.</creator><creator>Bischoff, L.</creator><creator>Panzner, T.</creator><creator>Pietsch, U.</creator><creator>Grenzer, J.</creator><creator>Pucher, A.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20030801</creationdate><title>Double pinhole diffraction of white synchrotron radiation</title><author>Leitenberger, W. ; Wendrock, H. ; Bischoff, L. ; Panzner, T. ; Pietsch, U. ; Grenzer, J. ; Pucher, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c368t-f4f7ae878a1b1927199cbaf26de37fa789481d10f08562bc7c9ab779c6dca4be3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Coherent X-rays</topic><topic>Double slit experiment</topic><topic>Exact sciences and technology</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Physics</topic><topic>Synchrotron radiation instrumentation</topic><topic>White X-ray radiation</topic><topic>X- and γ-ray instruments and techniques</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Leitenberger, W.</creatorcontrib><creatorcontrib>Wendrock, H.</creatorcontrib><creatorcontrib>Bischoff, L.</creatorcontrib><creatorcontrib>Panzner, T.</creatorcontrib><creatorcontrib>Pietsch, U.</creatorcontrib><creatorcontrib>Grenzer, J.</creatorcontrib><creatorcontrib>Pucher, A.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Physica. B, Condensed matter</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Leitenberger, W.</au><au>Wendrock, H.</au><au>Bischoff, L.</au><au>Panzner, T.</au><au>Pietsch, U.</au><au>Grenzer, J.</au><au>Pucher, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Double pinhole diffraction of white synchrotron radiation</atitle><jtitle>Physica. B, Condensed matter</jtitle><date>2003-08-01</date><risdate>2003</risdate><volume>336</volume><issue>1</issue><spage>63</spage><epage>67</epage><pages>63-67</pages><issn>0921-4526</issn><eissn>1873-2135</eissn><abstract>The spatial coherence of hard X-rays provided by a bending magnet of the storage ring BESSY II was investigated by performing Young's interference experiment. The interference pattern was created by the diffraction of two 2
μm pinholes drilled into a thin tantalum foil by focused ion sputtering. Using an energy-dispersive detector with an energy resolution of 200
eV the interference patterns were detected simultaneously between 5
keV<
E<16
keV scanning a 5
μm pinhole through the detector window. The set-up is suitable to characterize the coherence properties of the beamline in a simple manner, i.e. to deduce parameters as the effective source size, the coherence length and the visibility. For the present case the visibility was close to 100% at 5
keV and decreased to 20% at 16
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| issn | 0921-4526 1873-2135 |
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| source | Access via ScienceDirect (Elsevier) |
| subjects | Coherent X-rays Double slit experiment Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Synchrotron radiation instrumentation White X-ray radiation X- and γ-ray instruments and techniques |
| title | Double pinhole diffraction of white synchrotron radiation |
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