A study on structures and formation mechanisms of self-assembled monolayers of n-alkyltrichlorosilanes using infrared spectroscopy and atomic force microscopy

The structures and formation mechanisms of self-assembled monolayers of n-alkyltrichlorosilanes on glass substrates have been examined systematically using Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM). The adsorption temperature dependency of FTIR frequencies and...

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Veröffentlicht in:	Thin solid films 2000-12, Vol.379 (1), p.230-239
Hauptverfasser:	Iimura, Ken-ichi, Nakajima, Yayoi, Kato, Teiji
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic force microscopy (AFM) Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Fourier transform infrared spectroscopy (FTIR) Materials science Monolayers Nanoscale materials and structures: fabrication and characterization Physics Silane Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology
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