A study on structures and formation mechanisms of self-assembled monolayers of n-alkyltrichlorosilanes using infrared spectroscopy and atomic force microscopy
The structures and formation mechanisms of self-assembled monolayers of n-alkyltrichlorosilanes on glass substrates have been examined systematically using Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM). The adsorption temperature dependency of FTIR frequencies and...
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| Veröffentlicht in: | Thin solid films 2000-12, Vol.379 (1), p.230-239 |
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| creator | Iimura, Ken-ichi Nakajima, Yayoi Kato, Teiji |
| description | The structures and formation mechanisms of self-assembled monolayers of
n-alkyltrichlorosilanes on glass substrates have been examined systematically using Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM). The adsorption temperature dependency of FTIR frequencies and intensities of CH
2 stretching vibration bands indicates the existence of a characteristic temperature,
T
c
, for each monolayer. The hydrocarbon chains observe an ordered and closely packed state when the monolayers are prepared below
T
c
, whilst disordered monolayers with low molecular density are formed above
T
c
. AFM observation clearly demonstrates an island-type growth of monolayers prepared below
T
c
. The results obtained contribute to an understanding of the growth behavior of the monolayers and the physical meaning of the
T
c
. |
| doi_str_mv | 10.1016/S0040-6090(00)01544-3 |
| format | Article |
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n-alkyltrichlorosilanes on glass substrates have been examined systematically using Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM). The adsorption temperature dependency of FTIR frequencies and intensities of CH
2 stretching vibration bands indicates the existence of a characteristic temperature,
T
c
, for each monolayer. The hydrocarbon chains observe an ordered and closely packed state when the monolayers are prepared below
T
c
, whilst disordered monolayers with low molecular density are formed above
T
c
. AFM observation clearly demonstrates an island-type growth of monolayers prepared below
T
c
. The results obtained contribute to an understanding of the growth behavior of the monolayers and the physical meaning of the
T
c
.</description><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>DOI: 10.1016/S0040-6090(00)01544-3</identifier><identifier>CODEN: THSFAP</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Atomic force microscopy (AFM) ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Fourier transform infrared spectroscopy (FTIR) ; Materials science ; Monolayers ; Nanoscale materials and structures: fabrication and characterization ; Physics ; Silane ; Structure and morphology; thickness ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology</subject><ispartof>Thin solid films, 2000-12, Vol.379 (1), p.230-239</ispartof><rights>2000 Elsevier Science B.V.</rights><rights>2001 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c432t-cdb5d4842c124dede68708afb0d2f3f8f8be692ff086e49d44ccb3c8e77c28543</citedby><cites>FETCH-LOGICAL-c432t-cdb5d4842c124dede68708afb0d2f3f8f8be692ff086e49d44ccb3c8e77c28543</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/S0040-6090(00)01544-3$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=840927$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Iimura, Ken-ichi</creatorcontrib><creatorcontrib>Nakajima, Yayoi</creatorcontrib><creatorcontrib>Kato, Teiji</creatorcontrib><title>A study on structures and formation mechanisms of self-assembled monolayers of n-alkyltrichlorosilanes using infrared spectroscopy and atomic force microscopy</title><title>Thin solid films</title><description>The structures and formation mechanisms of self-assembled monolayers of
n-alkyltrichlorosilanes on glass substrates have been examined systematically using Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM). The adsorption temperature dependency of FTIR frequencies and intensities of CH
2 stretching vibration bands indicates the existence of a characteristic temperature,
T
c
, for each monolayer. The hydrocarbon chains observe an ordered and closely packed state when the monolayers are prepared below
T
c
, whilst disordered monolayers with low molecular density are formed above
T
c
. AFM observation clearly demonstrates an island-type growth of monolayers prepared below
T
c
. The results obtained contribute to an understanding of the growth behavior of the monolayers and the physical meaning of the
T
c
.</description><subject>Atomic force microscopy (AFM)</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Fourier transform infrared spectroscopy (FTIR)</subject><subject>Materials science</subject><subject>Monolayers</subject><subject>Nanoscale materials and structures: fabrication and characterization</subject><subject>Physics</subject><subject>Silane</subject><subject>Structure and morphology; thickness</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><recordid>eNqFUV2LFDEQDKLguvoThAFB9GE0XzOTfZLjUO_gwAf1OWSSjhfNJGt6Rpg_4281s7vcqxBIQ1V3dVcR8pLRd4yy_v1XSiVte3qgbyh9S1knZSsekR1Tw6Hlg2CPye6B8pQ8Q_xJKWWcix35e9XgvLi1yakWZbHzUgAbk1zjc5nMHCowgb03KeCETfYNQvStQYRpjOCaKacczQrlBKbWxF9rnEuw9zGXjCGaVAcuGNKPJiRfTKlNeAQ7V9Tm43oSM3Oegt00LTS1umDPyRNvIsKLy78n3z99_HZ90959-Xx7fXXXWin43Fo3dk4qyS3j0oGDXg1UGT9Sx73wyqsR-gP3nqoe5MFJae0orIJhsFx1UuzJ6_PcY8m_F8BZTwEtxG35vKDmwyAEZ10ldmfitiEW8PpYwmTKqhnVWxr6lIberNa0vi0NLWrfq4uAQWtitSHZgA_NStJDTWpPPpxZUG_9E6BotAGSBRdKNUy7HP6j8w_claPE</recordid><startdate>20001201</startdate><enddate>20001201</enddate><creator>Iimura, Ken-ichi</creator><creator>Nakajima, Yayoi</creator><creator>Kato, Teiji</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20001201</creationdate><title>A study on structures and formation mechanisms of self-assembled monolayers of n-alkyltrichlorosilanes using infrared spectroscopy and atomic force microscopy</title><author>Iimura, Ken-ichi ; Nakajima, Yayoi ; Kato, Teiji</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c432t-cdb5d4842c124dede68708afb0d2f3f8f8be692ff086e49d44ccb3c8e77c28543</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Atomic force microscopy (AFM)</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Fourier transform infrared spectroscopy (FTIR)</topic><topic>Materials science</topic><topic>Monolayers</topic><topic>Nanoscale materials and structures: fabrication and characterization</topic><topic>Physics</topic><topic>Silane</topic><topic>Structure and morphology; thickness</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Iimura, Ken-ichi</creatorcontrib><creatorcontrib>Nakajima, Yayoi</creatorcontrib><creatorcontrib>Kato, Teiji</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Iimura, Ken-ichi</au><au>Nakajima, Yayoi</au><au>Kato, Teiji</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A study on structures and formation mechanisms of self-assembled monolayers of n-alkyltrichlorosilanes using infrared spectroscopy and atomic force microscopy</atitle><jtitle>Thin solid films</jtitle><date>2000-12-01</date><risdate>2000</risdate><volume>379</volume><issue>1</issue><spage>230</spage><epage>239</epage><pages>230-239</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><coden>THSFAP</coden><abstract>The structures and formation mechanisms of self-assembled monolayers of
n-alkyltrichlorosilanes on glass substrates have been examined systematically using Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM). The adsorption temperature dependency of FTIR frequencies and intensities of CH
2 stretching vibration bands indicates the existence of a characteristic temperature,
T
c
, for each monolayer. The hydrocarbon chains observe an ordered and closely packed state when the monolayers are prepared below
T
c
, whilst disordered monolayers with low molecular density are formed above
T
c
. AFM observation clearly demonstrates an island-type growth of monolayers prepared below
T
c
. The results obtained contribute to an understanding of the growth behavior of the monolayers and the physical meaning of the
T
c
.</abstract><cop>Lausanne</cop><pub>Elsevier B.V</pub><doi>10.1016/S0040-6090(00)01544-3</doi><tpages>10</tpages></addata></record> |
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| ispartof | Thin solid films, 2000-12, Vol.379 (1), p.230-239 |
| issn | 0040-6090 1879-2731 |
| language | eng |
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| source | Access via ScienceDirect (Elsevier) |
| subjects | Atomic force microscopy (AFM) Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Fourier transform infrared spectroscopy (FTIR) Materials science Monolayers Nanoscale materials and structures: fabrication and characterization Physics Silane Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology |
| title | A study on structures and formation mechanisms of self-assembled monolayers of n-alkyltrichlorosilanes using infrared spectroscopy and atomic force microscopy |
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