Preferred crystallographic orientation relationships of nickel films deposited on (100) cubic-zirconia substrates

Preferred crystallographic orientation relationships between nickel films grown on (100) cubic-zirconia substrates were studied by a variety of electron diffraction techniques. The predominant orientation relationship found was Ni (111)//ZrO 2 (100); Ni 〈 1 ̄ 10〉//ZrO 2 [010], while a secondary cube...

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Veröffentlicht in:	Thin solid films 2000-09, Vol.372 (1), p.37-44
Hauptverfasser:	Dickey, E.C., Bagiyono, Y.Maa, Lian, G.D., Sinnott, S.B., Wagner, T.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Condensed matter: structure, mechanical and thermal properties Electron backscattered diffraction Exact sciences and technology Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties Metals. Metallurgy Near coincident site lattice theory Nickel Physics Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology Zirconia
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