Preparation and characterization of lead zirconate titanate thin films by liquid source misted chemical deposition
Liquid source misted chemical deposition (LSMCD) uses micron sized droplets of precursor solution to produce thin films. As with other chemical solution methods, adjusting the composition of precursor solution can easily achieve the desired composition of final film. And the small droplet size is ex...
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description | Liquid source misted chemical deposition (LSMCD) uses micron sized droplets of precursor solution to produce thin films. As with other chemical solution methods, adjusting the composition of precursor solution can easily achieve the desired composition of final film. And the small droplet size is expected to give better step coverage. In this study, lead zirconate titanate (PZT) thin films were prepared by LSMCD and their structural and electrical properties were investigated. The films were polycrystalline and had [100] preferred orientation for films annealed at 600°C. The surface morphology showed a densely packed grain structure with no rosette structure. The remanent polarization and the coercive field were 17 μC/cm
2, and 50 kV/cm, respectively. The coercive field of this work was similar to those of other preparation methods. However, the remanent polarization was smaller than reported values. The dielectric constant and tan
δ at 100 kHz were 614 and 0.058, respectively. The leakage current density at 3 V was 5.54×10
−7 A/cm
2. |
doi_str_mv | 10.1016/S0040-6090(99)00735-X |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_27664660</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S004060909900735X</els_id><sourcerecordid>27664660</sourcerecordid><originalsourceid>FETCH-LOGICAL-c433t-b0850040adcc1db4855a7a8e66c30ca237d0a3ca05d905ba2245b468bb3d85ad3</originalsourceid><addsrcrecordid>eNqFkF1rFTEQhoNY8Nj6E4RciOjF6uxmk91ciRS_oGChCr0Ls8ksHdmzOU1yhPbXu9steunVfPDMOzOvEC9reFdDbd5fAbRQGbDwxtq3AJ3S1fUTsav7zlZNp-qnYvcXeSae5_wLAOqmUTuRLhMdMGHhOEucg_Q3S-ULJb7fmnGUE2GQ95x8nLGQLFxwS254liNP-yyHOznx7ZGDzPGYPMk950KrHO3Z4yQDHWLmVfFMnIw4ZXrxGE_Fz8-ffpx_rS6-f_l2_vGi8q1SpRqg1-vVGLyvw9D2WmOHPRnjFXhsVBcAlUfQwYIesGlaPbSmHwYVeo1BnYrXm-4hxdsj5eKWmzxNE84Uj9k1nTGtMbCAegN9ijknGt0h8R7TnavBrQ67B4fdap-z1j047K6XuVePCzAvL44JZ8_537DqrW3tgn3YMFqe_c2UXPZMs6fAiXxxIfJ_Fv0BMXCSjg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27664660</pqid></control><display><type>article</type><title>Preparation and characterization of lead zirconate titanate thin films by liquid source misted chemical deposition</title><source>Elsevier ScienceDirect Journals</source><creator>Moon, Won Seok ; Woo, Seong Ihl ; Park, Seung Bin</creator><creatorcontrib>Moon, Won Seok ; Woo, Seong Ihl ; Park, Seung Bin</creatorcontrib><description>Liquid source misted chemical deposition (LSMCD) uses micron sized droplets of precursor solution to produce thin films. As with other chemical solution methods, adjusting the composition of precursor solution can easily achieve the desired composition of final film. And the small droplet size is expected to give better step coverage. In this study, lead zirconate titanate (PZT) thin films were prepared by LSMCD and their structural and electrical properties were investigated. The films were polycrystalline and had [100] preferred orientation for films annealed at 600°C. The surface morphology showed a densely packed grain structure with no rosette structure. The remanent polarization and the coercive field were 17 μC/cm
2, and 50 kV/cm, respectively. The coercive field of this work was similar to those of other preparation methods. However, the remanent polarization was smaller than reported values. The dielectric constant and tan
δ at 100 kHz were 614 and 0.058, respectively. The leakage current density at 3 V was 5.54×10
−7 A/cm
2.</description><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>DOI: 10.1016/S0040-6090(99)00735-X</identifier><identifier>CODEN: THSFAP</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Cross-disciplinary physics: materials science; rheology ; Dielectric, piezoelectric, ferroelectric and antiferroelectric materials ; Dielectrics, piezoelectrics, and ferroelectrics and their properties ; Exact sciences and technology ; Lead zirconate titanate thin films ; Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids) ; Liquid source misted chemical deposition ; Materials science ; Methods of deposition of films and coatings; film growth and epitaxy ; Niobates, titanates, tantalates, pzt ceramics, etc ; Physics ; Polycrystalline ; Small droplet size</subject><ispartof>Thin solid films, 2000-01, Vol.359 (1), p.77-81</ispartof><rights>2000 Elsevier Science S.A.</rights><rights>2000 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c433t-b0850040adcc1db4855a7a8e66c30ca237d0a3ca05d905ba2245b468bb3d85ad3</citedby><cites>FETCH-LOGICAL-c433t-b0850040adcc1db4855a7a8e66c30ca237d0a3ca05d905ba2245b468bb3d85ad3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S004060909900735X$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1389949$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Moon, Won Seok</creatorcontrib><creatorcontrib>Woo, Seong Ihl</creatorcontrib><creatorcontrib>Park, Seung Bin</creatorcontrib><title>Preparation and characterization of lead zirconate titanate thin films by liquid source misted chemical deposition</title><title>Thin solid films</title><description>Liquid source misted chemical deposition (LSMCD) uses micron sized droplets of precursor solution to produce thin films. As with other chemical solution methods, adjusting the composition of precursor solution can easily achieve the desired composition of final film. And the small droplet size is expected to give better step coverage. In this study, lead zirconate titanate (PZT) thin films were prepared by LSMCD and their structural and electrical properties were investigated. The films were polycrystalline and had [100] preferred orientation for films annealed at 600°C. The surface morphology showed a densely packed grain structure with no rosette structure. The remanent polarization and the coercive field were 17 μC/cm
2, and 50 kV/cm, respectively. The coercive field of this work was similar to those of other preparation methods. However, the remanent polarization was smaller than reported values. The dielectric constant and tan
δ at 100 kHz were 614 and 0.058, respectively. The leakage current density at 3 V was 5.54×10
−7 A/cm
2.</description><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Dielectric, piezoelectric, ferroelectric and antiferroelectric materials</subject><subject>Dielectrics, piezoelectrics, and ferroelectrics and their properties</subject><subject>Exact sciences and technology</subject><subject>Lead zirconate titanate thin films</subject><subject>Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)</subject><subject>Liquid source misted chemical deposition</subject><subject>Materials science</subject><subject>Methods of deposition of films and coatings; film growth and epitaxy</subject><subject>Niobates, titanates, tantalates, pzt ceramics, etc</subject><subject>Physics</subject><subject>Polycrystalline</subject><subject>Small droplet size</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><recordid>eNqFkF1rFTEQhoNY8Nj6E4RciOjF6uxmk91ciRS_oGChCr0Ls8ksHdmzOU1yhPbXu9steunVfPDMOzOvEC9reFdDbd5fAbRQGbDwxtq3AJ3S1fUTsav7zlZNp-qnYvcXeSae5_wLAOqmUTuRLhMdMGHhOEucg_Q3S-ULJb7fmnGUE2GQ95x8nLGQLFxwS254liNP-yyHOznx7ZGDzPGYPMk950KrHO3Z4yQDHWLmVfFMnIw4ZXrxGE_Fz8-ffpx_rS6-f_l2_vGi8q1SpRqg1-vVGLyvw9D2WmOHPRnjFXhsVBcAlUfQwYIesGlaPbSmHwYVeo1BnYrXm-4hxdsj5eKWmzxNE84Uj9k1nTGtMbCAegN9ijknGt0h8R7TnavBrQ67B4fdap-z1j047K6XuVePCzAvL44JZ8_537DqrW3tgn3YMFqe_c2UXPZMs6fAiXxxIfJ_Fv0BMXCSjg</recordid><startdate>20000101</startdate><enddate>20000101</enddate><creator>Moon, Won Seok</creator><creator>Woo, Seong Ihl</creator><creator>Park, Seung Bin</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20000101</creationdate><title>Preparation and characterization of lead zirconate titanate thin films by liquid source misted chemical deposition</title><author>Moon, Won Seok ; Woo, Seong Ihl ; Park, Seung Bin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c433t-b0850040adcc1db4855a7a8e66c30ca237d0a3ca05d905ba2245b468bb3d85ad3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Dielectric, piezoelectric, ferroelectric and antiferroelectric materials</topic><topic>Dielectrics, piezoelectrics, and ferroelectrics and their properties</topic><topic>Exact sciences and technology</topic><topic>Lead zirconate titanate thin films</topic><topic>Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)</topic><topic>Liquid source misted chemical deposition</topic><topic>Materials science</topic><topic>Methods of deposition of films and coatings; film growth and epitaxy</topic><topic>Niobates, titanates, tantalates, pzt ceramics, etc</topic><topic>Physics</topic><topic>Polycrystalline</topic><topic>Small droplet size</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Moon, Won Seok</creatorcontrib><creatorcontrib>Woo, Seong Ihl</creatorcontrib><creatorcontrib>Park, Seung Bin</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Moon, Won Seok</au><au>Woo, Seong Ihl</au><au>Park, Seung Bin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Preparation and characterization of lead zirconate titanate thin films by liquid source misted chemical deposition</atitle><jtitle>Thin solid films</jtitle><date>2000-01-01</date><risdate>2000</risdate><volume>359</volume><issue>1</issue><spage>77</spage><epage>81</epage><pages>77-81</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><coden>THSFAP</coden><abstract>Liquid source misted chemical deposition (LSMCD) uses micron sized droplets of precursor solution to produce thin films. As with other chemical solution methods, adjusting the composition of precursor solution can easily achieve the desired composition of final film. And the small droplet size is expected to give better step coverage. In this study, lead zirconate titanate (PZT) thin films were prepared by LSMCD and their structural and electrical properties were investigated. The films were polycrystalline and had [100] preferred orientation for films annealed at 600°C. The surface morphology showed a densely packed grain structure with no rosette structure. The remanent polarization and the coercive field were 17 μC/cm
2, and 50 kV/cm, respectively. The coercive field of this work was similar to those of other preparation methods. However, the remanent polarization was smaller than reported values. The dielectric constant and tan
δ at 100 kHz were 614 and 0.058, respectively. The leakage current density at 3 V was 5.54×10
−7 A/cm
2.</abstract><cop>Lausanne</cop><pub>Elsevier B.V</pub><doi>10.1016/S0040-6090(99)00735-X</doi><tpages>5</tpages></addata></record> |
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subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Dielectric, piezoelectric, ferroelectric and antiferroelectric materials Dielectrics, piezoelectrics, and ferroelectrics and their properties Exact sciences and technology Lead zirconate titanate thin films Liquid phase epitaxy deposition from liquid phases (melts, solutions, and surface layers on liquids) Liquid source misted chemical deposition Materials science Methods of deposition of films and coatings film growth and epitaxy Niobates, titanates, tantalates, pzt ceramics, etc Physics Polycrystalline Small droplet size |
title | Preparation and characterization of lead zirconate titanate thin films by liquid source misted chemical deposition |
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