Peak-profile analysis of electroless nickel coatings

Peak-profile analysis (PPA) of X-ray diffraction patterns and differential scanning calorimetry of electroless nickel (EN) coatings were done to determine the changes in the structure with annealing. As-deposited medium phosphorus EN coating exhibit broadened X-ray reflections indicative of a semi-a...

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Veröffentlicht in:	Journal of alloys and compounds 2000-11, Vol.312 (1), p.30-40
Hauptverfasser:	Martyak, Nicholas M, Drake, Kerry
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Condensed matter: structure, mechanical and thermal properties Electroless nickel Exact sciences and technology Heat treatment Metals. Metallurgy Particle size Peak profile analysis Physics Strain Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology X-ray diffraction
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