Interferometric probing of thin Niobium layers under high electrical field using the zinc X-ray laser at PALS

Interferometric probing of thin Niobium layers under high electrical field using the zinc X-ray laser at PALS

We report on interferometric investigation of perturbed surfaces under high electric field by using the 21.2 nm zinc soft X-ray laser operating in a half cavity configuration. dc electric fields of up to 100 MV/m were applied to the surface of a niobium sample. Both positive and negative polarizatio...

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Hauptverfasser: Mocek, T, Ros, D, Rus, B, Joyeux, D, Praeg, A R, Kozlova, M, Carillon, A, Phalippou, D, Ballester, F, Jacques, E
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container_volume 641
creator Mocek, T
Ros, D
Rus, B
Joyeux, D
Praeg, A R
Kozlova, M
Carillon, A
Phalippou, D
Ballester, F
Jacques, E
description We report on interferometric investigation of perturbed surfaces under high electric field by using the 21.2 nm zinc soft X-ray laser operating in a half cavity configuration. dc electric fields of up to 100 MV/m were applied to the surface of a niobium sample. Both positive and negative polarizations of the electric field were examined. Single shot, high-quality X-ray interferograms were recorded with a double-mirror Fresnel interferometer and surface maps were obtained from the experimental data by holographic reconstruction.
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title Interferometric probing of thin Niobium layers under high electrical field using the zinc X-ray laser at PALS
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