$In situ high temperature x-ray diffraction measurements on a (TiO sub 2 ) sub 0.18 (SiO sub 2 ) sub 0.82 xerogel using a curved image-plate$

In situ high temperature x-ray diffraction measurements on a (TiO sub 2 ) sub 0.18 (SiO sub 2 ) sub 0.82 xerogel using a curved image-plate

In situ high temperature x-ray diffraction measurements have been performed on a (TiO sub 2 ) sub 0.18 (SiO sub 2 ) sub 0.82 xerogel using a 185 mm radius curved image-plate. The results clearly show that the coordination of Ti in this material changes from predominantly sixfold to predominantly fou...

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Veröffentlicht in:	Journal of physics. Condensed matter 2000-04, Vol.12 (15), p.3521-3529
Hauptverfasser:	Pickup, D M, Mountjoy, G, Roberts, M A, Wallidge, G W, Newport, R J, Smith, M E
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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