Grain rotation in thin films of gold
We present transmission electron microscope observations of microstructural development in thin, fine-grained, columnar, 〈111〉 textured films of gold. In a sequential annealing experiment, we find that individual grains constantly rotate about the film normal in apparently random, and randomly chang...
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| Veröffentlicht in: | Acta materialia 1998-05, Vol.46 (8), p.2623-2633 |
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| container_title | Acta materialia |
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| creator | Harris, K.E. Singh, V.V. King, A.H. |
| description | We present transmission electron microscope observations of microstructural development in thin, fine-grained, columnar, 〈111〉 textured films of gold. In a sequential annealing experiment, we find that individual grains constantly rotate about the film normal in apparently random, and randomly changing directions. This contributes to the rearrangement of grain boundaries by allowing their individual energies to vary, thus promoting triple-line motion. We perform an analysis of the kinetics of grain rotation: assuming that its rate is limited by grain boundary diffusion, we obtain very good agreement between the observed and predicted rates and the rotation rate is predicted to be very sensitive to the grain size. A simple computer model is developed to investigate the structural consequences of grain rotation, which include reduction in the total grain boundary energy in a specimen, and changes in the populations of the various CSL-related boundaries. |
| doi_str_mv | 10.1016/S1359-6454(97)00467-9 |
| format | Article |
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In a sequential annealing experiment, we find that individual grains constantly rotate about the film normal in apparently random, and randomly changing directions. This contributes to the rearrangement of grain boundaries by allowing their individual energies to vary, thus promoting triple-line motion. We perform an analysis of the kinetics of grain rotation: assuming that its rate is limited by grain boundary diffusion, we obtain very good agreement between the observed and predicted rates and the rotation rate is predicted to be very sensitive to the grain size. A simple computer model is developed to investigate the structural consequences of grain rotation, which include reduction in the total grain boundary energy in a specimen, and changes in the populations of the various CSL-related boundaries.</description><identifier>ISSN: 1359-6454</identifier><identifier>EISSN: 1873-2453</identifier><identifier>DOI: 10.1016/S1359-6454(97)00467-9</identifier><language>eng</language><publisher>Oxford: Elsevier Ltd</publisher><subject>Applied sciences ; Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; Metals. 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In a sequential annealing experiment, we find that individual grains constantly rotate about the film normal in apparently random, and randomly changing directions. This contributes to the rearrangement of grain boundaries by allowing their individual energies to vary, thus promoting triple-line motion. We perform an analysis of the kinetics of grain rotation: assuming that its rate is limited by grain boundary diffusion, we obtain very good agreement between the observed and predicted rates and the rotation rate is predicted to be very sensitive to the grain size. A simple computer model is developed to investigate the structural consequences of grain rotation, which include reduction in the total grain boundary energy in a specimen, and changes in the populations of the various CSL-related boundaries.</description><subject>Applied sciences</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>Metals. Metallurgy</subject><subject>Physics</subject><subject>Structure and morphology; thickness</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><issn>1359-6454</issn><issn>1873-2453</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNqFkE1LAzEQhoMoWKs_QdhDET2sJpl8bE4iRatQ8KCeQ8wmGtluarIV_PemH3r1MvMOPO8M8yJ0SvAlwURcPRHgqhaMs3MlLzBmQtZqD41II6GmjMN-0b_IITrK-QNjQiXDIzSZJRP6KsXBDCH2VdHDeyk-dItcRV-9xa49RgfedNmd7PoYvdzdPk_v6_nj7GF6M68tCDnUFIxXLaYteEsBBLxaoI3n3jeMgGlAMCmoK5Pn0hLu25Z6qyjm4JiwGMbobLt3meLnyuVBL0K2rutM7-Iqayo5NEDWIN-CNsWck_N6mcLCpG9NsF5nojeZ6PXDWkm9yUSr4pvsDphsTeeT6W3If2ZawpINFOx6i7ny7FdwSWcbXG9dG5Kzg25j-OfQD69tc48</recordid><startdate>19980501</startdate><enddate>19980501</enddate><creator>Harris, K.E.</creator><creator>Singh, V.V.</creator><creator>King, A.H.</creator><general>Elsevier Ltd</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19980501</creationdate><title>Grain rotation in thin films of gold</title><author>Harris, K.E. ; Singh, V.V. ; King, A.H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c367t-23af9d02d3fc23363bc328f5ff8413a8364762ef84f57c15fdd2fc92053e46c03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Applied sciences</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Metals. Metallurgy</topic><topic>Physics</topic><topic>Structure and morphology; thickness</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Harris, K.E.</creatorcontrib><creatorcontrib>Singh, V.V.</creatorcontrib><creatorcontrib>King, A.H.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Acta materialia</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Harris, K.E.</au><au>Singh, V.V.</au><au>King, A.H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Grain rotation in thin films of gold</atitle><jtitle>Acta materialia</jtitle><date>1998-05-01</date><risdate>1998</risdate><volume>46</volume><issue>8</issue><spage>2623</spage><epage>2633</epage><pages>2623-2633</pages><issn>1359-6454</issn><eissn>1873-2453</eissn><abstract>We present transmission electron microscope observations of microstructural development in thin, fine-grained, columnar, 〈111〉 textured films of gold. In a sequential annealing experiment, we find that individual grains constantly rotate about the film normal in apparently random, and randomly changing directions. This contributes to the rearrangement of grain boundaries by allowing their individual energies to vary, thus promoting triple-line motion. We perform an analysis of the kinetics of grain rotation: assuming that its rate is limited by grain boundary diffusion, we obtain very good agreement between the observed and predicted rates and the rotation rate is predicted to be very sensitive to the grain size. A simple computer model is developed to investigate the structural consequences of grain rotation, which include reduction in the total grain boundary energy in a specimen, and changes in the populations of the various CSL-related boundaries.</abstract><cop>Oxford</cop><pub>Elsevier Ltd</pub><doi>10.1016/S1359-6454(97)00467-9</doi><tpages>11</tpages></addata></record> |
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| ispartof | Acta materialia, 1998-05, Vol.46 (8), p.2623-2633 |
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| subjects | Applied sciences Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Metals. Metallurgy Physics Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology |
| title | Grain rotation in thin films of gold |
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