EFFECTS OF Pt/SrRuO3 TOP ELECTRODES ON FERROELECTRIC PROPERTIES OF EPITAXIAL (Pb, La)(Zr, Ti)O3 THIN FILMS
Epitaxially c-axis oriented PLZT films with the composition (Pb0.925La0.075)(Zr0.4Ti0.6)O3 were deposited on Pt/MgO(100) substrate by rf-magnetron sputtering using a compacted powder target with the composition (0.8PLZT+0.2PbO). Pt/SrRuO3(SRO)/PLZT/Pt capacitors were fabricated by forming Pt/SRO top...
Gespeichert in:
Veröffentlicht in: | Jpn.J.Appl.Phys ,Part 1. Vol. 39, no. 9B, pp. 5451-5455. 2000 Part 1. Vol. 39, no. 9B, pp. 5451-5455. 2000, 2000, Vol.39 (9B), p.5451-5455 |
---|---|
Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 5455 |
---|---|
container_issue | 9B |
container_start_page | 5451 |
container_title | Jpn.J.Appl.Phys ,Part 1. Vol. 39, no. 9B, pp. 5451-5455. 2000 |
container_volume | 39 |
creator | Kobune, M Matsuura, O Matsuzaki, T Mineshige, A Fujii, S Fujisawa, H |
description | Epitaxially c-axis oriented PLZT films with the composition (Pb0.925La0.075)(Zr0.4Ti0.6)O3 were deposited on Pt/MgO(100) substrate by rf-magnetron sputtering using a compacted powder target with the composition (0.8PLZT+0.2PbO). Pt/SrRuO3(SRO)/PLZT/Pt capacitors were fabricated by forming Pt/SRO top electrodes onto PLZT films. The 206-nm-thick PLZT films with layered Pt/SRO top electrodes exhibited a slightly high leakage current at a low electric field, compared with PLZT films with the same thickness and a single Pt top electrode. The values of switchable polarization after 1010 cycles for Pt/PLZT/Pt capacitors decreased up to around 17% of their initial values, whereas the switchable polarization for Pt/SRO/PLZT/Pt capacitors hardly exhibited any fatigue degradation due to polarization reversal. The layered Pt/SRO is useful as a top-electrode material for fabricating the low leakage and high endurance ferroelectric capacitors. 7 refs. |
doi_str_mv | 10.1143/JJAP.39.5451 |
format | Article |
fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_27521061</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>27521061</sourcerecordid><originalsourceid>FETCH-LOGICAL-j247t-a1c9ddc267c5720a6da7addbec8bc8e35a3f0d5860ea5ca33e9ae85f550673cd3</originalsourceid><addsrcrecordid>eNotjMlOwzAARH0AiVK48QE-oVZqWi9xlmMUnNZVwFYSJMSlcmxXahQoZPl_AuU0mhm9B8ADRmuMfbrZ7xO1pvGa-QxfgRlCBHt-TMgNuO37ZqoB8_EMNDzLeFqVUGZQDZuyK0ZJYSUV5Pm0F_KJT98LzHhRyMskUqgKqXhRCf7HcSWq5E0kOVyoegVzvVy8dytYnZa_qp2YaJE_l3fg-qjb3t3_5xy8ZrxKd14utyJNcq8hfjh4GpvYWkOC0LCQIB1YHWpra2ei2kSOMk2PyLIoQE4zoyl1sXYROzKGgpAaS-fg8eL96s7fo-uHw8epN65t9ac7j_2BhIxgFGD6AydUUJU</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27521061</pqid></control><display><type>article</type><title>EFFECTS OF Pt/SrRuO3 TOP ELECTRODES ON FERROELECTRIC PROPERTIES OF EPITAXIAL (Pb, La)(Zr, Ti)O3 THIN FILMS</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Kobune, M ; Matsuura, O ; Matsuzaki, T ; Mineshige, A ; Fujii, S ; Fujisawa, H</creator><creatorcontrib>Kobune, M ; Matsuura, O ; Matsuzaki, T ; Mineshige, A ; Fujii, S ; Fujisawa, H</creatorcontrib><description>Epitaxially c-axis oriented PLZT films with the composition (Pb0.925La0.075)(Zr0.4Ti0.6)O3 were deposited on Pt/MgO(100) substrate by rf-magnetron sputtering using a compacted powder target with the composition (0.8PLZT+0.2PbO). Pt/SrRuO3(SRO)/PLZT/Pt capacitors were fabricated by forming Pt/SRO top electrodes onto PLZT films. The 206-nm-thick PLZT films with layered Pt/SRO top electrodes exhibited a slightly high leakage current at a low electric field, compared with PLZT films with the same thickness and a single Pt top electrode. The values of switchable polarization after 1010 cycles for Pt/PLZT/Pt capacitors decreased up to around 17% of their initial values, whereas the switchable polarization for Pt/SRO/PLZT/Pt capacitors hardly exhibited any fatigue degradation due to polarization reversal. The layered Pt/SRO is useful as a top-electrode material for fabricating the low leakage and high endurance ferroelectric capacitors. 7 refs.</description><identifier>ISSN: 0021-4922</identifier><identifier>DOI: 10.1143/JJAP.39.5451</identifier><language>eng</language><ispartof>Jpn.J.Appl.Phys ,Part 1. Vol. 39, no. 9B, pp. 5451-5455. 2000, 2000, Vol.39 (9B), p.5451-5455</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,781,4010,27904,27905,27906</link.rule.ids></links><search><creatorcontrib>Kobune, M</creatorcontrib><creatorcontrib>Matsuura, O</creatorcontrib><creatorcontrib>Matsuzaki, T</creatorcontrib><creatorcontrib>Mineshige, A</creatorcontrib><creatorcontrib>Fujii, S</creatorcontrib><creatorcontrib>Fujisawa, H</creatorcontrib><title>EFFECTS OF Pt/SrRuO3 TOP ELECTRODES ON FERROELECTRIC PROPERTIES OF EPITAXIAL (Pb, La)(Zr, Ti)O3 THIN FILMS</title><title>Jpn.J.Appl.Phys ,Part 1. Vol. 39, no. 9B, pp. 5451-5455. 2000</title><description>Epitaxially c-axis oriented PLZT films with the composition (Pb0.925La0.075)(Zr0.4Ti0.6)O3 were deposited on Pt/MgO(100) substrate by rf-magnetron sputtering using a compacted powder target with the composition (0.8PLZT+0.2PbO). Pt/SrRuO3(SRO)/PLZT/Pt capacitors were fabricated by forming Pt/SRO top electrodes onto PLZT films. The 206-nm-thick PLZT films with layered Pt/SRO top electrodes exhibited a slightly high leakage current at a low electric field, compared with PLZT films with the same thickness and a single Pt top electrode. The values of switchable polarization after 1010 cycles for Pt/PLZT/Pt capacitors decreased up to around 17% of their initial values, whereas the switchable polarization for Pt/SRO/PLZT/Pt capacitors hardly exhibited any fatigue degradation due to polarization reversal. The layered Pt/SRO is useful as a top-electrode material for fabricating the low leakage and high endurance ferroelectric capacitors. 7 refs.</description><issn>0021-4922</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><recordid>eNotjMlOwzAARH0AiVK48QE-oVZqWi9xlmMUnNZVwFYSJMSlcmxXahQoZPl_AuU0mhm9B8ADRmuMfbrZ7xO1pvGa-QxfgRlCBHt-TMgNuO37ZqoB8_EMNDzLeFqVUGZQDZuyK0ZJYSUV5Pm0F_KJT98LzHhRyMskUqgKqXhRCf7HcSWq5E0kOVyoegVzvVy8dytYnZa_qp2YaJE_l3fg-qjb3t3_5xy8ZrxKd14utyJNcq8hfjh4GpvYWkOC0LCQIB1YHWpra2ei2kSOMk2PyLIoQE4zoyl1sXYROzKGgpAaS-fg8eL96s7fo-uHw8epN65t9ac7j_2BhIxgFGD6AydUUJU</recordid><startdate>2000</startdate><enddate>2000</enddate><creator>Kobune, M</creator><creator>Matsuura, O</creator><creator>Matsuzaki, T</creator><creator>Mineshige, A</creator><creator>Fujii, S</creator><creator>Fujisawa, H</creator><scope>7QQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>2000</creationdate><title>EFFECTS OF Pt/SrRuO3 TOP ELECTRODES ON FERROELECTRIC PROPERTIES OF EPITAXIAL (Pb, La)(Zr, Ti)O3 THIN FILMS</title><author>Kobune, M ; Matsuura, O ; Matsuzaki, T ; Mineshige, A ; Fujii, S ; Fujisawa, H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-j247t-a1c9ddc267c5720a6da7addbec8bc8e35a3f0d5860ea5ca33e9ae85f550673cd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kobune, M</creatorcontrib><creatorcontrib>Matsuura, O</creatorcontrib><creatorcontrib>Matsuzaki, T</creatorcontrib><creatorcontrib>Mineshige, A</creatorcontrib><creatorcontrib>Fujii, S</creatorcontrib><creatorcontrib>Fujisawa, H</creatorcontrib><collection>Ceramic Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Jpn.J.Appl.Phys ,Part 1. Vol. 39, no. 9B, pp. 5451-5455. 2000</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kobune, M</au><au>Matsuura, O</au><au>Matsuzaki, T</au><au>Mineshige, A</au><au>Fujii, S</au><au>Fujisawa, H</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>EFFECTS OF Pt/SrRuO3 TOP ELECTRODES ON FERROELECTRIC PROPERTIES OF EPITAXIAL (Pb, La)(Zr, Ti)O3 THIN FILMS</atitle><jtitle>Jpn.J.Appl.Phys ,Part 1. Vol. 39, no. 9B, pp. 5451-5455. 2000</jtitle><date>2000</date><risdate>2000</risdate><volume>39</volume><issue>9B</issue><spage>5451</spage><epage>5455</epage><pages>5451-5455</pages><issn>0021-4922</issn><abstract>Epitaxially c-axis oriented PLZT films with the composition (Pb0.925La0.075)(Zr0.4Ti0.6)O3 were deposited on Pt/MgO(100) substrate by rf-magnetron sputtering using a compacted powder target with the composition (0.8PLZT+0.2PbO). Pt/SrRuO3(SRO)/PLZT/Pt capacitors were fabricated by forming Pt/SRO top electrodes onto PLZT films. The 206-nm-thick PLZT films with layered Pt/SRO top electrodes exhibited a slightly high leakage current at a low electric field, compared with PLZT films with the same thickness and a single Pt top electrode. The values of switchable polarization after 1010 cycles for Pt/PLZT/Pt capacitors decreased up to around 17% of their initial values, whereas the switchable polarization for Pt/SRO/PLZT/Pt capacitors hardly exhibited any fatigue degradation due to polarization reversal. The layered Pt/SRO is useful as a top-electrode material for fabricating the low leakage and high endurance ferroelectric capacitors. 7 refs.</abstract><doi>10.1143/JJAP.39.5451</doi><tpages>5</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0021-4922 |
ispartof | Jpn.J.Appl.Phys ,Part 1. Vol. 39, no. 9B, pp. 5451-5455. 2000, 2000, Vol.39 (9B), p.5451-5455 |
issn | 0021-4922 |
language | eng |
recordid | cdi_proquest_miscellaneous_27521061 |
source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
title | EFFECTS OF Pt/SrRuO3 TOP ELECTRODES ON FERROELECTRIC PROPERTIES OF EPITAXIAL (Pb, La)(Zr, Ti)O3 THIN FILMS |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T02%3A41%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=EFFECTS%20OF%20Pt/SrRuO3%20TOP%20ELECTRODES%20ON%20FERROELECTRIC%20PROPERTIES%20OF%20EPITAXIAL%20(Pb,%20La)(Zr,%20Ti)O3%20THIN%20FILMS&rft.jtitle=Jpn.J.Appl.Phys%20,Part%201.%20Vol.%2039,%20no.%209B,%20pp.%205451-5455.%202000&rft.au=Kobune,%20M&rft.date=2000&rft.volume=39&rft.issue=9B&rft.spage=5451&rft.epage=5455&rft.pages=5451-5455&rft.issn=0021-4922&rft_id=info:doi/10.1143/JJAP.39.5451&rft_dat=%3Cproquest%3E27521061%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=27521061&rft_id=info:pmid/&rfr_iscdi=true |