Defect production by the TEM beam - the first application of the positron microprobe

In cooperation with the ZEISS/LEO GmbH a positron microprobe has been constructed. Additionally, a conventional scanning electron microscope (SEM) is integrated in the setup. Measurements on radiation defects in Mo and Cu samples, made by 1 MeV electron irradiation in a transmission electron microsc...

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Veröffentlicht in:	Applied surface science 1998-09, Vol.149 (1-4), p.217-220
Hauptverfasser:	Mannig, U, Bennewitz, K, Bihr, H, Haaks, M, Sigle, W, Zamponi, C, Maier, K
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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