Chemical structure and bonding characteristics of metal hydrogen systems studied by the surface analytical techniques SIMS and XPS

Secondary ion mass spectrometry (SIMS) as well as photoelectron spectroscopy (XPS) are powerful tools for studying special properties of metal hydrogen systems and the interaction of hydrogen and metals. SIMS experiments have now also been extended to transition metal hydrogen systems with small hyd...

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Veröffentlicht in:	Journal of alloys and compounds 1998-10, Vol.293-295, p.202-212
Hauptverfasser:	Zuchner, H, Kintrup, J, Dobrileit, R, Untiedt, I
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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