The application of de-polarization analysis to polarimetric characterization and classification of metallic and dielectric samples
Reflection polarization transformations by a given sample depends both on the composition and surface state and on the illumination angle. In the present work, the evolution of polarization transformation given by dielectric samples and metallic surfaces has been studied. The initial metallic surfac...
Gespeichert in:
| Veröffentlicht in: | Journal of physics. D, Applied physics Applied physics, 1997-09, Vol.30 (18), p.2520-2529 |
|---|---|
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 2529 |
|---|---|
| container_issue | 18 |
| container_start_page | 2520 |
| container_title | Journal of physics. D, Applied physics |
| container_volume | 30 |
| creator | Eliès, Philippe Jeune, Bernard Le Olivard, Pascal Cariou, Jack Lotrian, Jean |
| description | Reflection polarization transformations by a given sample depends both on the composition and surface state and on the illumination angle. In the present work, the evolution of polarization transformation given by dielectric samples and metallic surfaces has been studied. The initial metallic surface was polished up to 1 mu m and then progressively debased. The polarimetric characteristics are described by using the Mueller matrix, which provides the depolarization index, namely the mean depolarization power, and the degree of polarization for all the pure incident states of polarization. The polarization of each sample is measured for various angles of incidence. The noise is reduced by a statistical method to optimize the matrix elements. The results obtained are first presented in a global matrix form and then the depolarization phenomenon is analysed. In the last step the studied samples are characterized and classified. |
| doi_str_mv | 10.1088/0022-3727/30/18/005 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_pasca</sourceid><recordid>TN_cdi_proquest_miscellaneous_27397209</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>27397209</sourcerecordid><originalsourceid>FETCH-LOGICAL-c381t-c4b433cbc447ff54bfb25f95f948125af0a05b6caa095eb9f1008daa56b977893</originalsourceid><addsrcrecordid>eNqNkM9LwzAUx4MoOKd_gZcexINQlzRNkx5l-AsGXuY5vKYJi2RtTbrDPPqXm65jDPQgPHi89z7fb8gXoWuC7wkWYoZxlqWUZ3xG8YwMMztBE0ILkhZ5QU_R5ECco4sQPnAkCkEm6Hu50gl0nbMKets2SWuSWqdd68Dbr3EFDbhtsCHp22Q8rHXvrUrUCjyoXh-RdaIchGDNkV-kwcUHdufaaqfVTh5g3TkdLtGZARf01b5P0fvT43L-ki7enl_nD4tUUUH6VOVVTqmqVJ5zY1hemSpjpoyVC5IxMBgwqwoFgEumq9IQjEUNwIqq5FyUdIpuR9_Ot58bHXq5tkFp56DR7SbIjNOSZ3gA6Qgq34bgtZFd_DL4rSRYDnnLIU05pClp3Awzi6qbvT0EBc54aJQNB2kmsMCcR-x-xGzb_dP37rfgD1B2taE_5VCeGQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27397209</pqid></control><display><type>article</type><title>The application of de-polarization analysis to polarimetric characterization and classification of metallic and dielectric samples</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Eliès, Philippe ; Jeune, Bernard Le ; Olivard, Pascal ; Cariou, Jack ; Lotrian, Jean</creator><creatorcontrib>Eliès, Philippe ; Jeune, Bernard Le ; Olivard, Pascal ; Cariou, Jack ; Lotrian, Jean</creatorcontrib><description>Reflection polarization transformations by a given sample depends both on the composition and surface state and on the illumination angle. In the present work, the evolution of polarization transformation given by dielectric samples and metallic surfaces has been studied. The initial metallic surface was polished up to 1 mu m and then progressively debased. The polarimetric characteristics are described by using the Mueller matrix, which provides the depolarization index, namely the mean depolarization power, and the degree of polarization for all the pure incident states of polarization. The polarization of each sample is measured for various angles of incidence. The noise is reduced by a statistical method to optimize the matrix elements. The results obtained are first presented in a global matrix form and then the depolarization phenomenon is analysed. In the last step the studied samples are characterized and classified.</description><identifier>ISSN: 0022-3727</identifier><identifier>EISSN: 1361-6463</identifier><identifier>DOI: 10.1088/0022-3727/30/18/005</identifier><identifier>CODEN: JPAPBE</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Dielectric properties of solids and liquids ; Dielectrics, piezoelectrics, and ferroelectrics and their properties ; Exact sciences and technology ; Physics ; Polarization and depolarization</subject><ispartof>Journal of physics. D, Applied physics, 1997-09, Vol.30 (18), p.2520-2529</ispartof><rights>1997 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c381t-c4b433cbc447ff54bfb25f95f948125af0a05b6caa095eb9f1008daa56b977893</citedby><cites>FETCH-LOGICAL-c381t-c4b433cbc447ff54bfb25f95f948125af0a05b6caa095eb9f1008daa56b977893</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/0022-3727/30/18/005/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,27903,27904,53808,53888</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2808077$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Eliès, Philippe</creatorcontrib><creatorcontrib>Jeune, Bernard Le</creatorcontrib><creatorcontrib>Olivard, Pascal</creatorcontrib><creatorcontrib>Cariou, Jack</creatorcontrib><creatorcontrib>Lotrian, Jean</creatorcontrib><title>The application of de-polarization analysis to polarimetric characterization and classification of metallic and dielectric samples</title><title>Journal of physics. D, Applied physics</title><description>Reflection polarization transformations by a given sample depends both on the composition and surface state and on the illumination angle. In the present work, the evolution of polarization transformation given by dielectric samples and metallic surfaces has been studied. The initial metallic surface was polished up to 1 mu m and then progressively debased. The polarimetric characteristics are described by using the Mueller matrix, which provides the depolarization index, namely the mean depolarization power, and the degree of polarization for all the pure incident states of polarization. The polarization of each sample is measured for various angles of incidence. The noise is reduced by a statistical method to optimize the matrix elements. The results obtained are first presented in a global matrix form and then the depolarization phenomenon is analysed. In the last step the studied samples are characterized and classified.</description><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Dielectric properties of solids and liquids</subject><subject>Dielectrics, piezoelectrics, and ferroelectrics and their properties</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>Polarization and depolarization</subject><issn>0022-3727</issn><issn>1361-6463</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNqNkM9LwzAUx4MoOKd_gZcexINQlzRNkx5l-AsGXuY5vKYJi2RtTbrDPPqXm65jDPQgPHi89z7fb8gXoWuC7wkWYoZxlqWUZ3xG8YwMMztBE0ILkhZ5QU_R5ECco4sQPnAkCkEm6Hu50gl0nbMKets2SWuSWqdd68Dbr3EFDbhtsCHp22Q8rHXvrUrUCjyoXh-RdaIchGDNkV-kwcUHdufaaqfVTh5g3TkdLtGZARf01b5P0fvT43L-ki7enl_nD4tUUUH6VOVVTqmqVJ5zY1hemSpjpoyVC5IxMBgwqwoFgEumq9IQjEUNwIqq5FyUdIpuR9_Ot58bHXq5tkFp56DR7SbIjNOSZ3gA6Qgq34bgtZFd_DL4rSRYDnnLIU05pClp3Awzi6qbvT0EBc54aJQNB2kmsMCcR-x-xGzb_dP37rfgD1B2taE_5VCeGQ</recordid><startdate>19970921</startdate><enddate>19970921</enddate><creator>Eliès, Philippe</creator><creator>Jeune, Bernard Le</creator><creator>Olivard, Pascal</creator><creator>Cariou, Jack</creator><creator>Lotrian, Jean</creator><general>IOP Publishing</general><general>Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19970921</creationdate><title>The application of de-polarization analysis to polarimetric characterization and classification of metallic and dielectric samples</title><author>Eliès, Philippe ; Jeune, Bernard Le ; Olivard, Pascal ; Cariou, Jack ; Lotrian, Jean</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c381t-c4b433cbc447ff54bfb25f95f948125af0a05b6caa095eb9f1008daa56b977893</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Dielectric properties of solids and liquids</topic><topic>Dielectrics, piezoelectrics, and ferroelectrics and their properties</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>Polarization and depolarization</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Eliès, Philippe</creatorcontrib><creatorcontrib>Jeune, Bernard Le</creatorcontrib><creatorcontrib>Olivard, Pascal</creatorcontrib><creatorcontrib>Cariou, Jack</creatorcontrib><creatorcontrib>Lotrian, Jean</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of physics. D, Applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Eliès, Philippe</au><au>Jeune, Bernard Le</au><au>Olivard, Pascal</au><au>Cariou, Jack</au><au>Lotrian, Jean</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The application of de-polarization analysis to polarimetric characterization and classification of metallic and dielectric samples</atitle><jtitle>Journal of physics. D, Applied physics</jtitle><date>1997-09-21</date><risdate>1997</risdate><volume>30</volume><issue>18</issue><spage>2520</spage><epage>2529</epage><pages>2520-2529</pages><issn>0022-3727</issn><eissn>1361-6463</eissn><coden>JPAPBE</coden><abstract>Reflection polarization transformations by a given sample depends both on the composition and surface state and on the illumination angle. In the present work, the evolution of polarization transformation given by dielectric samples and metallic surfaces has been studied. The initial metallic surface was polished up to 1 mu m and then progressively debased. The polarimetric characteristics are described by using the Mueller matrix, which provides the depolarization index, namely the mean depolarization power, and the degree of polarization for all the pure incident states of polarization. The polarization of each sample is measured for various angles of incidence. The noise is reduced by a statistical method to optimize the matrix elements. The results obtained are first presented in a global matrix form and then the depolarization phenomenon is analysed. In the last step the studied samples are characterized and classified.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/0022-3727/30/18/005</doi><tpages>10</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0022-3727 |
| ispartof | Journal of physics. D, Applied physics, 1997-09, Vol.30 (18), p.2520-2529 |
| issn | 0022-3727 1361-6463 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_27397209 |
| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectric properties of solids and liquids Dielectrics, piezoelectrics, and ferroelectrics and their properties Exact sciences and technology Physics Polarization and depolarization |
| title | The application of de-polarization analysis to polarimetric characterization and classification of metallic and dielectric samples |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T04%3A23%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pasca&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20application%20of%20de-polarization%20analysis%20to%20polarimetric%20characterization%20and%20classification%20of%20metallic%20and%20dielectric%20samples&rft.jtitle=Journal%20of%20physics.%20D,%20Applied%20physics&rft.au=Eli%C3%A8s,%20Philippe&rft.date=1997-09-21&rft.volume=30&rft.issue=18&rft.spage=2520&rft.epage=2529&rft.pages=2520-2529&rft.issn=0022-3727&rft.eissn=1361-6463&rft.coden=JPAPBE&rft_id=info:doi/10.1088/0022-3727/30/18/005&rft_dat=%3Cproquest_pasca%3E27397209%3C/proquest_pasca%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=27397209&rft_id=info:pmid/&rfr_iscdi=true |