X-ray photoelectron diffraction investigation of the (2 × 2) overlayers of Cs and K on Cu(111)
X-ray photoelectron diffraction measurements have been made for the Cu(111)(2 × 2)-Cs and Cu(111)(2 × 2)-K systems to explore the possibility of using substrate emission XPD for the elucidation of adsorbate-substrate registry in these cases of strongly scattering adsorbate atoms and anticipated atop...
Gespeichert in:
| Veröffentlicht in: | Surface science 1994-12, Vol.320 (3), p.315-319 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 319 |
|---|---|
| container_issue | 3 |
| container_start_page | 315 |
| container_title | Surface science |
| container_volume | 320 |
| creator | de Carvalho, A.V. Woodruff, D.P. Kerkar, M. |
| description | X-ray photoelectron diffraction measurements have been made for the Cu(111)(2 × 2)-Cs and Cu(111)(2 × 2)-K systems to explore the possibility of using substrate emission XPD for the elucidation of adsorbate-substrate registry in these cases of strongly scattering adsorbate atoms and anticipated atop adsorption sites. Although scattering effects within the substrate, for sub-surface emitters, clearly complicate the interpretation of the data, simple symmetry arguments do give substantial support to the identification of atop adsorption sites in both systems. |
| doi_str_mv | 10.1016/0039-6028(94)90319-0 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_27308232</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>0039602894903190</els_id><sourcerecordid>27308232</sourcerecordid><originalsourceid>FETCH-LOGICAL-c364t-bb654dbc65f5f368e30c9b8481d7fdfa2715eba6b1c7d8651253c51bf015b733</originalsourceid><addsrcrecordid>eNp9kLtOwzAUQC0EEqXwBwweEGqHgB9x7CxIKOIlKrF0YLMcx6ZGaVzstFK_hA_ix3Ba1BEv9pXPfR0ALjG6wQgXtwjRMisQEZMyn5aI4jJDR2CEBS8zwpk4BqMDcgrOYvxE6eQlGwH5ngW1hauF771pje6D72DjrA1K9y69XbcxsXcfahd5C_uFgRMCf74hmUK_MaFVWxPi8FVFqLoGvsJEVusJxnh6Dk6saqO5-LvHYP74MK-es9nb00t1P8s0LfI-q-uC5U2tC2aZpYUwFOmyFrnADbeNVYRjZmpV1FjzRhQME0Y1w7VFmNWc0jG43pddBf-1TgPLpYvatK3qjF9HSThFglCSwHwP6uBjDMbKVXBLFbYSIznIlIMpOZiSZS53MiVKaVd_9VXUqk12Ou3iIZdSmnMuEna3x0xadeNMkFE702nTuJDcysa7__v8AqIHhsA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27308232</pqid></control><display><type>article</type><title>X-ray photoelectron diffraction investigation of the (2 × 2) overlayers of Cs and K on Cu(111)</title><source>Elsevier ScienceDirect Journals Complete</source><creator>de Carvalho, A.V. ; Woodruff, D.P. ; Kerkar, M.</creator><creatorcontrib>de Carvalho, A.V. ; Woodruff, D.P. ; Kerkar, M.</creatorcontrib><description>X-ray photoelectron diffraction measurements have been made for the Cu(111)(2 × 2)-Cs and Cu(111)(2 × 2)-K systems to explore the possibility of using substrate emission XPD for the elucidation of adsorbate-substrate registry in these cases of strongly scattering adsorbate atoms and anticipated atop adsorption sites. Although scattering effects within the substrate, for sub-surface emitters, clearly complicate the interpretation of the data, simple symmetry arguments do give substantial support to the identification of atop adsorption sites in both systems.</description><identifier>ISSN: 0039-6028</identifier><identifier>EISSN: 1879-2758</identifier><identifier>DOI: 10.1016/0039-6028(94)90319-0</identifier><identifier>CODEN: SUSCAS</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Adsorbed layers and thin films ; Applied sciences ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Electron and ion emission by liquids and solids; impact phenomena ; Exact sciences and technology ; Metals. Metallurgy ; Photoemission and photoelectron spectra ; Physics ; Solid surfaces and solid-solid interfaces ; Surface structure and topography ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><ispartof>Surface science, 1994-12, Vol.320 (3), p.315-319</ispartof><rights>1994</rights><rights>1995 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-bb654dbc65f5f368e30c9b8481d7fdfa2715eba6b1c7d8651253c51bf015b733</citedby><cites>FETCH-LOGICAL-c364t-bb654dbc65f5f368e30c9b8481d7fdfa2715eba6b1c7d8651253c51bf015b733</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/0039-6028(94)90319-0$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>315,781,785,3551,27929,27930,46000</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=3334778$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>de Carvalho, A.V.</creatorcontrib><creatorcontrib>Woodruff, D.P.</creatorcontrib><creatorcontrib>Kerkar, M.</creatorcontrib><title>X-ray photoelectron diffraction investigation of the (2 × 2) overlayers of Cs and K on Cu(111)</title><title>Surface science</title><description>X-ray photoelectron diffraction measurements have been made for the Cu(111)(2 × 2)-Cs and Cu(111)(2 × 2)-K systems to explore the possibility of using substrate emission XPD for the elucidation of adsorbate-substrate registry in these cases of strongly scattering adsorbate atoms and anticipated atop adsorption sites. Although scattering effects within the substrate, for sub-surface emitters, clearly complicate the interpretation of the data, simple symmetry arguments do give substantial support to the identification of atop adsorption sites in both systems.</description><subject>Adsorbed layers and thin films</subject><subject>Applied sciences</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Electron and ion emission by liquids and solids; impact phenomena</subject><subject>Exact sciences and technology</subject><subject>Metals. Metallurgy</subject><subject>Photoemission and photoelectron spectra</subject><subject>Physics</subject><subject>Solid surfaces and solid-solid interfaces</subject><subject>Surface structure and topography</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0039-6028</issn><issn>1879-2758</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1994</creationdate><recordtype>article</recordtype><recordid>eNp9kLtOwzAUQC0EEqXwBwweEGqHgB9x7CxIKOIlKrF0YLMcx6ZGaVzstFK_hA_ix3Ba1BEv9pXPfR0ALjG6wQgXtwjRMisQEZMyn5aI4jJDR2CEBS8zwpk4BqMDcgrOYvxE6eQlGwH5ngW1hauF771pje6D72DjrA1K9y69XbcxsXcfahd5C_uFgRMCf74hmUK_MaFVWxPi8FVFqLoGvsJEVusJxnh6Dk6saqO5-LvHYP74MK-es9nb00t1P8s0LfI-q-uC5U2tC2aZpYUwFOmyFrnADbeNVYRjZmpV1FjzRhQME0Y1w7VFmNWc0jG43pddBf-1TgPLpYvatK3qjF9HSThFglCSwHwP6uBjDMbKVXBLFbYSIznIlIMpOZiSZS53MiVKaVd_9VXUqk12Ou3iIZdSmnMuEna3x0xadeNMkFE702nTuJDcysa7__v8AqIHhsA</recordid><startdate>19941201</startdate><enddate>19941201</enddate><creator>de Carvalho, A.V.</creator><creator>Woodruff, D.P.</creator><creator>Kerkar, M.</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19941201</creationdate><title>X-ray photoelectron diffraction investigation of the (2 × 2) overlayers of Cs and K on Cu(111)</title><author>de Carvalho, A.V. ; Woodruff, D.P. ; Kerkar, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-bb654dbc65f5f368e30c9b8481d7fdfa2715eba6b1c7d8651253c51bf015b733</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1994</creationdate><topic>Adsorbed layers and thin films</topic><topic>Applied sciences</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Electron and ion emission by liquids and solids; impact phenomena</topic><topic>Exact sciences and technology</topic><topic>Metals. Metallurgy</topic><topic>Photoemission and photoelectron spectra</topic><topic>Physics</topic><topic>Solid surfaces and solid-solid interfaces</topic><topic>Surface structure and topography</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>de Carvalho, A.V.</creatorcontrib><creatorcontrib>Woodruff, D.P.</creatorcontrib><creatorcontrib>Kerkar, M.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>de Carvalho, A.V.</au><au>Woodruff, D.P.</au><au>Kerkar, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>X-ray photoelectron diffraction investigation of the (2 × 2) overlayers of Cs and K on Cu(111)</atitle><jtitle>Surface science</jtitle><date>1994-12-01</date><risdate>1994</risdate><volume>320</volume><issue>3</issue><spage>315</spage><epage>319</epage><pages>315-319</pages><issn>0039-6028</issn><eissn>1879-2758</eissn><coden>SUSCAS</coden><abstract>X-ray photoelectron diffraction measurements have been made for the Cu(111)(2 × 2)-Cs and Cu(111)(2 × 2)-K systems to explore the possibility of using substrate emission XPD for the elucidation of adsorbate-substrate registry in these cases of strongly scattering adsorbate atoms and anticipated atop adsorption sites. Although scattering effects within the substrate, for sub-surface emitters, clearly complicate the interpretation of the data, simple symmetry arguments do give substantial support to the identification of atop adsorption sites in both systems.</abstract><cop>Lausanne</cop><cop>Amsterdam</cop><cop>New York, NY</cop><pub>Elsevier B.V</pub><doi>10.1016/0039-6028(94)90319-0</doi><tpages>5</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0039-6028 |
| ispartof | Surface science, 1994-12, Vol.320 (3), p.315-319 |
| issn | 0039-6028 1879-2758 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_27308232 |
| source | Elsevier ScienceDirect Journals Complete |
| subjects | Adsorbed layers and thin films Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Electron and ion emission by liquids and solids impact phenomena Exact sciences and technology Metals. Metallurgy Photoemission and photoelectron spectra Physics Solid surfaces and solid-solid interfaces Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
| title | X-ray photoelectron diffraction investigation of the (2 × 2) overlayers of Cs and K on Cu(111) |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-13T13%3A19%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=X-ray%20photoelectron%20diffraction%20investigation%20of%20the%20(2%20%C3%97%202)%20overlayers%20of%20Cs%20and%20K%20on%20Cu(111)&rft.jtitle=Surface%20science&rft.au=de%20Carvalho,%20A.V.&rft.date=1994-12-01&rft.volume=320&rft.issue=3&rft.spage=315&rft.epage=319&rft.pages=315-319&rft.issn=0039-6028&rft.eissn=1879-2758&rft.coden=SUSCAS&rft_id=info:doi/10.1016/0039-6028(94)90319-0&rft_dat=%3Cproquest_cross%3E27308232%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=27308232&rft_id=info:pmid/&rft_els_id=0039602894903190&rfr_iscdi=true |