Approaching the Ni percolation threshold by thin-film irradiation

We have reproduced a percolating structure in thin Ni films by an inhomogeneous sputtering process. The morphological disorder has been studied using TEM and in situ transport measurements during ion irradiation. The fluence dependence of the resistance shows a singularity following a 2D percolation...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Journal of physics. Condensed matter 1997-04, Vol.9 (14), p.2999-3009
Hauptverfasser:	Aprili, M, Nédellec, P
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Electrical properties of specific thin films Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Ion radiation effects Materials science Metal and metallic alloys Metals and metallic alloys Metals. Metallurgy Physical radiation effects, radiation damage Physics Radiation treatment (particle and electromagnetic) Radiation treatments Structure of solids and liquids crystallography Treatment of materials and its effects on microstructure and properties
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!