Characterization of single-event upsets in a flash analog-to-digital converter (AD9058)
Single-event upsets were observed in a flash analog-to-digital converter (AD9058) included as part of a radiation effects experiment on board a satellite. The origins of the upsets were identified using a pulsed laser and confirmed by exposing the AD9058 to both heavy ions and protons at accelerator...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2000-12, Vol.47 (6), p.2358-2364 |
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| container_end_page | 2364 |
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| container_issue | 6 |
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| container_title | IEEE transactions on nuclear science |
| container_volume | 47 |
| creator | Buchner, S.P. Meehan, T.J. Campbell, A.B. Clark, K.A. McMorrow, D. |
| description | Single-event upsets were observed in a flash analog-to-digital converter (AD9058) included as part of a radiation effects experiment on board a satellite. The origins of the upsets were identified using a pulsed laser and confirmed by exposing the AD9058 to both heavy ions and protons at accelerator facilities. The salient result of this work is that the single-event-upset cross-section depends on the value of the analog input but does not appear to depend on clock frequency. Therefore, using a single value for the analog input during ground testing may give an incorrect estimate of the error rate expected during operation in space where the input can vary over the full voltage range. |
| doi_str_mv | 10.1109/23.903777 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_27230408</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>903777</ieee_id><sourcerecordid>914639729</sourcerecordid><originalsourceid>FETCH-LOGICAL-c399t-6c98ec591c8235bc6b99123607a7935690437259bc8f8fc23ddd1fefebe532323</originalsourceid><addsrcrecordid>eNqF0UtLAzEQB_AgCtbqwaungODjsJrHZpM5lvoEwYvicUnT2RpZNzXZFvTTm9LiwYMmhzDMj2HIn5BDzi44Z3Ap5AUwqbXeIgOulCm40mabDBjjpoASYJfspfSWy1IxNSAv41cbresx-i_b-9DR0NDku1mLBS6x6-linrBP1HfU0qa16ZXazrZhVvShmPqZ721LXeiWGPMQeja6AqbM-T7ZaWyb8GDzDsnzzfXT-K54eLy9H48eCicB-qJyYNAp4M4IqSaumgBwISumrQapKmCl1ELBxJnGNE7I6XTKG2xwgkqKfIfkdD13HsPHAlNfv_vksG1th2GRauBlJUELyPLkTymMMVzm8z8UrBJG_w-1kKxkJsPjX_AtLGL-xVRzxkQpgVWrBc_XysWQUsSmnkf_buNnRvUq3FrIeh1utkdr6xHxx22a3xYxm98</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1002439069</pqid></control><display><type>article</type><title>Characterization of single-event upsets in a flash analog-to-digital converter (AD9058)</title><source>IEEE Electronic Library (IEL)</source><creator>Buchner, S.P. ; Meehan, T.J. ; Campbell, A.B. ; Clark, K.A. ; McMorrow, D.</creator><creatorcontrib>Buchner, S.P. ; Meehan, T.J. ; Campbell, A.B. ; Clark, K.A. ; McMorrow, D.</creatorcontrib><description>Single-event upsets were observed in a flash analog-to-digital converter (AD9058) included as part of a radiation effects experiment on board a satellite. The origins of the upsets were identified using a pulsed laser and confirmed by exposing the AD9058 to both heavy ions and protons at accelerator facilities. The salient result of this work is that the single-event-upset cross-section depends on the value of the analog input but does not appear to depend on clock frequency. Therefore, using a single value for the analog input during ground testing may give an incorrect estimate of the error rate expected during operation in space where the input can vary over the full voltage range.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/23.903777</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Accelerators ; Analog to digital conversion ; Analog-digital conversion ; Clocks ; Converters ; Cross sections ; Electric potential ; Error analysis ; Frequency ; Ion accelerators ; Optical pulses ; Proton accelerators ; Pulsed lasers ; Radiation effects ; Satellites ; Testing ; Voltage</subject><ispartof>IEEE transactions on nuclear science, 2000-12, Vol.47 (6), p.2358-2364</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2000</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c399t-6c98ec591c8235bc6b99123607a7935690437259bc8f8fc23ddd1fefebe532323</citedby><cites>FETCH-LOGICAL-c399t-6c98ec591c8235bc6b99123607a7935690437259bc8f8fc23ddd1fefebe532323</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/903777$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,778,782,794,27907,27908,54741</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/903777$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Buchner, S.P.</creatorcontrib><creatorcontrib>Meehan, T.J.</creatorcontrib><creatorcontrib>Campbell, A.B.</creatorcontrib><creatorcontrib>Clark, K.A.</creatorcontrib><creatorcontrib>McMorrow, D.</creatorcontrib><title>Characterization of single-event upsets in a flash analog-to-digital converter (AD9058)</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><description>Single-event upsets were observed in a flash analog-to-digital converter (AD9058) included as part of a radiation effects experiment on board a satellite. The origins of the upsets were identified using a pulsed laser and confirmed by exposing the AD9058 to both heavy ions and protons at accelerator facilities. The salient result of this work is that the single-event-upset cross-section depends on the value of the analog input but does not appear to depend on clock frequency. Therefore, using a single value for the analog input during ground testing may give an incorrect estimate of the error rate expected during operation in space where the input can vary over the full voltage range.</description><subject>Accelerators</subject><subject>Analog to digital conversion</subject><subject>Analog-digital conversion</subject><subject>Clocks</subject><subject>Converters</subject><subject>Cross sections</subject><subject>Electric potential</subject><subject>Error analysis</subject><subject>Frequency</subject><subject>Ion accelerators</subject><subject>Optical pulses</subject><subject>Proton accelerators</subject><subject>Pulsed lasers</subject><subject>Radiation effects</subject><subject>Satellites</subject><subject>Testing</subject><subject>Voltage</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqF0UtLAzEQB_AgCtbqwaungODjsJrHZpM5lvoEwYvicUnT2RpZNzXZFvTTm9LiwYMmhzDMj2HIn5BDzi44Z3Ap5AUwqbXeIgOulCm40mabDBjjpoASYJfspfSWy1IxNSAv41cbresx-i_b-9DR0NDku1mLBS6x6-linrBP1HfU0qa16ZXazrZhVvShmPqZ721LXeiWGPMQeja6AqbM-T7ZaWyb8GDzDsnzzfXT-K54eLy9H48eCicB-qJyYNAp4M4IqSaumgBwISumrQapKmCl1ELBxJnGNE7I6XTKG2xwgkqKfIfkdD13HsPHAlNfv_vksG1th2GRauBlJUELyPLkTymMMVzm8z8UrBJG_w-1kKxkJsPjX_AtLGL-xVRzxkQpgVWrBc_XysWQUsSmnkf_buNnRvUq3FrIeh1utkdr6xHxx22a3xYxm98</recordid><startdate>20001201</startdate><enddate>20001201</enddate><creator>Buchner, S.P.</creator><creator>Meehan, T.J.</creator><creator>Campbell, A.B.</creator><creator>Clark, K.A.</creator><creator>McMorrow, D.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QL</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7T7</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>M7N</scope><scope>P64</scope></search><sort><creationdate>20001201</creationdate><title>Characterization of single-event upsets in a flash analog-to-digital converter (AD9058)</title><author>Buchner, S.P. ; Meehan, T.J. ; Campbell, A.B. ; Clark, K.A. ; McMorrow, D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c399t-6c98ec591c8235bc6b99123607a7935690437259bc8f8fc23ddd1fefebe532323</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Accelerators</topic><topic>Analog to digital conversion</topic><topic>Analog-digital conversion</topic><topic>Clocks</topic><topic>Converters</topic><topic>Cross sections</topic><topic>Electric potential</topic><topic>Error analysis</topic><topic>Frequency</topic><topic>Ion accelerators</topic><topic>Optical pulses</topic><topic>Proton accelerators</topic><topic>Pulsed lasers</topic><topic>Radiation effects</topic><topic>Satellites</topic><topic>Testing</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Buchner, S.P.</creatorcontrib><creatorcontrib>Meehan, T.J.</creatorcontrib><creatorcontrib>Campbell, A.B.</creatorcontrib><creatorcontrib>Clark, K.A.</creatorcontrib><creatorcontrib>McMorrow, D.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Bacteriology Abstracts (Microbiology B)</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Industrial and Applied Microbiology Abstracts (Microbiology A)</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Algology Mycology and Protozoology Abstracts (Microbiology C)</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Buchner, S.P.</au><au>Meehan, T.J.</au><au>Campbell, A.B.</au><au>Clark, K.A.</au><au>McMorrow, D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characterization of single-event upsets in a flash analog-to-digital converter (AD9058)</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>2000-12-01</date><risdate>2000</risdate><volume>47</volume><issue>6</issue><spage>2358</spage><epage>2364</epage><pages>2358-2364</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>Single-event upsets were observed in a flash analog-to-digital converter (AD9058) included as part of a radiation effects experiment on board a satellite. The origins of the upsets were identified using a pulsed laser and confirmed by exposing the AD9058 to both heavy ions and protons at accelerator facilities. The salient result of this work is that the single-event-upset cross-section depends on the value of the analog input but does not appear to depend on clock frequency. Therefore, using a single value for the analog input during ground testing may give an incorrect estimate of the error rate expected during operation in space where the input can vary over the full voltage range.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/23.903777</doi><tpages>7</tpages></addata></record> |
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| source | IEEE Electronic Library (IEL) |
| subjects | Accelerators Analog to digital conversion Analog-digital conversion Clocks Converters Cross sections Electric potential Error analysis Frequency Ion accelerators Optical pulses Proton accelerators Pulsed lasers Radiation effects Satellites Testing Voltage |
| title | Characterization of single-event upsets in a flash analog-to-digital converter (AD9058) |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T07%3A49%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Characterization%20of%20single-event%20upsets%20in%20a%20flash%20analog-to-digital%20converter%20(AD9058)&rft.jtitle=IEEE%20transactions%20on%20nuclear%20science&rft.au=Buchner,%20S.P.&rft.date=2000-12-01&rft.volume=47&rft.issue=6&rft.spage=2358&rft.epage=2364&rft.pages=2358-2364&rft.issn=0018-9499&rft.eissn=1558-1578&rft.coden=IETNAE&rft_id=info:doi/10.1109/23.903777&rft_dat=%3Cproquest_RIE%3E914639729%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1002439069&rft_id=info:pmid/&rft_ieee_id=903777&rfr_iscdi=true |