Mapping of unstressed lattice parameters using pulsed neutron transmission diffraction

Stress measurement by neutron diffraction depends critically on knowledge of the unstressed lattice parameter (a0) of the specimen under study. As a result, measurement of stress profiles in components where a0 is not homogeneous throughout the sample, such as welds or carburized surfaces, can be pa...

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Veröffentlicht in:	Journal of applied crystallography 2002-08, Vol.35 (4), p.497-504
Hauptverfasser:	Santisteban, Javier Roberto, Steuwer, A., Edwards, L., Withers, P. J., Fitzpatrick, M. E.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Condensed matter: structure, mechanical and thermal properties Exact sciences and technology lattice parameters Metals. Metallurgy Neutron diffraction and scattering Physics pulsed neutron transmission diffraction Single-crystal and powder diffraction stress Structure of solids and liquids crystallography time-of-flight neutron transmission
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