EPMA present and future

In electron probe microanalysis the objective has always been to gain the maximum information from a sample. To this end efforts have been directed at increasing detection efficiency, reducing the size of the excitation volume, analysing more difficult specimens and improving the accuracy of quantit...

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Veröffentlicht in:Mikrochimica acta (1966) 2002-01, Vol.138 (3-4), p.115-124
1. Verfasser: LOVE, Glyn
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container_title Mikrochimica acta (1966)
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creator LOVE, Glyn
description In electron probe microanalysis the objective has always been to gain the maximum information from a sample. To this end efforts have been directed at increasing detection efficiency, reducing the size of the excitation volume, analysing more difficult specimens and improving the accuracy of quantitative measurements whilst, at the same time, attempting to minimise the complexity of the analysis. The present paper comments on the progress that has been made in these areas, focuses on the latest hardware and software developments taking place and looks forward to how these may impact on the technique of EPMA. [Materials include Fe.]
doi_str_mv 10.1007/s006040200018
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_27166198</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>27166198</sourcerecordid><originalsourceid>FETCH-LOGICAL-c296t-d89017860ea654ddf01495351da537c2cf1c09fff9cf0670b569aabd236c584e3</originalsourceid><addsrcrecordid>eNpVjzFLxDAYhoMoWE9Hce2iW_RL0nxJxuO4U-FEB51DLk2g0mtr0g7-eyt3IE7v8rwPPIRcM7hnAOohAyBUwAGA6RNSsEoglaDEKSkAOFKBip-Ti5w_Z0Ihrwpys357WZZDCjl0Y-m6uozTOKVwSc6ia3O4Ou6CfGzW76snun19fF4tt9RzgyOttZlNGiE4lFVdR2CVkUKy2kmhPPeReTAxRuMjoIKdROPcruYCvdRVEAtyd_AOqf-aQh7tvsk-tK3rQj9lyxVDZEbPID2APvU5pxDtkJq9S9-Wgf3Nt__yZ_72KHbZuzYm1_km_50EaqWUFD8GZVb1</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27166198</pqid></control><display><type>article</type><title>EPMA present and future</title><source>Springer Nature - Complete Springer Journals</source><creator>LOVE, Glyn</creator><creatorcontrib>LOVE, Glyn</creatorcontrib><description>In electron probe microanalysis the objective has always been to gain the maximum information from a sample. To this end efforts have been directed at increasing detection efficiency, reducing the size of the excitation volume, analysing more difficult specimens and improving the accuracy of quantitative measurements whilst, at the same time, attempting to minimise the complexity of the analysis. The present paper comments on the progress that has been made in these areas, focuses on the latest hardware and software developments taking place and looks forward to how these may impact on the technique of EPMA. [Materials include Fe.]</description><identifier>ISSN: 0026-3672</identifier><identifier>EISSN: 1436-5073</identifier><identifier>DOI: 10.1007/s006040200018</identifier><identifier>CODEN: MIACAQ</identifier><language>eng</language><publisher>Wien: Springer</publisher><subject>Exact sciences and technology ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Physics ; X- and γ-ray instruments and techniques ; X- and γ-ray spectrometers ; X-ray and γ-ray spectrometers</subject><ispartof>Mikrochimica acta (1966), 2002-01, Vol.138 (3-4), p.115-124</ispartof><rights>2002 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c296t-d89017860ea654ddf01495351da537c2cf1c09fff9cf0670b569aabd236c584e3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,778,782,787,788,23917,23918,25127,27911,27912</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=13687775$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>LOVE, Glyn</creatorcontrib><title>EPMA present and future</title><title>Mikrochimica acta (1966)</title><description>In electron probe microanalysis the objective has always been to gain the maximum information from a sample. To this end efforts have been directed at increasing detection efficiency, reducing the size of the excitation volume, analysing more difficult specimens and improving the accuracy of quantitative measurements whilst, at the same time, attempting to minimise the complexity of the analysis. The present paper comments on the progress that has been made in these areas, focuses on the latest hardware and software developments taking place and looks forward to how these may impact on the technique of EPMA. [Materials include Fe.]</description><subject>Exact sciences and technology</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Physics</subject><subject>X- and γ-ray instruments and techniques</subject><subject>X- and γ-ray spectrometers</subject><subject>X-ray and γ-ray spectrometers</subject><issn>0026-3672</issn><issn>1436-5073</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><recordid>eNpVjzFLxDAYhoMoWE9Hce2iW_RL0nxJxuO4U-FEB51DLk2g0mtr0g7-eyt3IE7v8rwPPIRcM7hnAOohAyBUwAGA6RNSsEoglaDEKSkAOFKBip-Ti5w_Z0Ihrwpys357WZZDCjl0Y-m6uozTOKVwSc6ia3O4Ou6CfGzW76snun19fF4tt9RzgyOttZlNGiE4lFVdR2CVkUKy2kmhPPeReTAxRuMjoIKdROPcruYCvdRVEAtyd_AOqf-aQh7tvsk-tK3rQj9lyxVDZEbPID2APvU5pxDtkJq9S9-Wgf3Nt__yZ_72KHbZuzYm1_km_50EaqWUFD8GZVb1</recordid><startdate>20020101</startdate><enddate>20020101</enddate><creator>LOVE, Glyn</creator><general>Springer</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20020101</creationdate><title>EPMA present and future</title><author>LOVE, Glyn</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c296t-d89017860ea654ddf01495351da537c2cf1c09fff9cf0670b569aabd236c584e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Exact sciences and technology</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Physics</topic><topic>X- and γ-ray instruments and techniques</topic><topic>X- and γ-ray spectrometers</topic><topic>X-ray and γ-ray spectrometers</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>LOVE, Glyn</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Mikrochimica acta (1966)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>LOVE, Glyn</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>EPMA present and future</atitle><jtitle>Mikrochimica acta (1966)</jtitle><date>2002-01-01</date><risdate>2002</risdate><volume>138</volume><issue>3-4</issue><spage>115</spage><epage>124</epage><pages>115-124</pages><issn>0026-3672</issn><eissn>1436-5073</eissn><coden>MIACAQ</coden><abstract>In electron probe microanalysis the objective has always been to gain the maximum information from a sample. To this end efforts have been directed at increasing detection efficiency, reducing the size of the excitation volume, analysing more difficult specimens and improving the accuracy of quantitative measurements whilst, at the same time, attempting to minimise the complexity of the analysis. The present paper comments on the progress that has been made in these areas, focuses on the latest hardware and software developments taking place and looks forward to how these may impact on the technique of EPMA. [Materials include Fe.]</abstract><cop>Wien</cop><cop>New York, NY</cop><pub>Springer</pub><doi>10.1007/s006040200018</doi><tpages>10</tpages></addata></record>
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issn 0026-3672
1436-5073
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recordid cdi_proquest_miscellaneous_27166198
source Springer Nature - Complete Springer Journals
subjects Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
X- and γ-ray instruments and techniques
X- and γ-ray spectrometers
X-ray and γ-ray spectrometers
title EPMA present and future
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T22%3A15%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=EPMA%20present%20and%20future&rft.jtitle=Mikrochimica%20acta%20(1966)&rft.au=LOVE,%20Glyn&rft.date=2002-01-01&rft.volume=138&rft.issue=3-4&rft.spage=115&rft.epage=124&rft.pages=115-124&rft.issn=0026-3672&rft.eissn=1436-5073&rft.coden=MIACAQ&rft_id=info:doi/10.1007/s006040200018&rft_dat=%3Cproquest_cross%3E27166198%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=27166198&rft_id=info:pmid/&rfr_iscdi=true