Spin polarised neutron and X-ray reflectivity study of a Co/Cu multilayer deposited under ion bombardment
Spin polarised neutron reflectivity and X-ray reflectivity measurements were performed on a Co/Cu multilayer deposited under ion bombardment. It was found that an average ion energy of ∼200 eV caused a reduction in interface roughness towards the surface. The average moment per atom in the cobalt la...
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| Veröffentlicht in: | Journal of magnetism and magnetic materials 1999-06, Vol.198, p.692-694 |
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| container_title | Journal of magnetism and magnetic materials |
| container_volume | 198 |
| creator | Telling, N.D. Langridge, S. Tang, C.C. |
| description | Spin polarised neutron reflectivity and X-ray reflectivity measurements were performed on a Co/Cu multilayer deposited under ion bombardment. It was found that an average ion energy of ∼200
eV caused a reduction in interface roughness towards the surface. The average moment per atom in the cobalt layers in the bulk of the film was calculated from the polarised neutron reflectivity data to be 1.48±0.12μ
b. |
| doi_str_mv | 10.1016/S0304-8853(98)01204-9 |
| format | Article |
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eV caused a reduction in interface roughness towards the surface. The average moment per atom in the cobalt layers in the bulk of the film was calculated from the polarised neutron reflectivity data to be 1.48±0.12μ
b.</description><identifier>ISSN: 0304-8853</identifier><identifier>DOI: 10.1016/S0304-8853(98)01204-9</identifier><identifier>CODEN: JMMMDC</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Applied sciences ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; Interface structure and roughness ; Interfacial magnetic properties (multilayers, magnetic quantum wells, superlattices, magnetic heterostructures) ; Ion-assisted deposition ; Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties ; Magnetic properties and materials ; Magnetic properties of surface, thin films and multilayers ; Metals. Metallurgy ; Physics ; Polarised neutron reflectivity ; Solid surfaces and solid-solid interfaces ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; X-ray reflectivity</subject><ispartof>Journal of magnetism and magnetic materials, 1999-06, Vol.198, p.692-694</ispartof><rights>1999 Elsevier Science B.V.</rights><rights>1999 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c315t-4540784e39506f036f0c634514120019074844450f4504e2254e174233b2f9203</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/S0304-8853(98)01204-9$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,3548,23928,23929,25138,27922,27923,45993</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1846244$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Telling, N.D.</creatorcontrib><creatorcontrib>Langridge, S.</creatorcontrib><creatorcontrib>Tang, C.C.</creatorcontrib><title>Spin polarised neutron and X-ray reflectivity study of a Co/Cu multilayer deposited under ion bombardment</title><title>Journal of magnetism and magnetic materials</title><description>Spin polarised neutron reflectivity and X-ray reflectivity measurements were performed on a Co/Cu multilayer deposited under ion bombardment. It was found that an average ion energy of ∼200
eV caused a reduction in interface roughness towards the surface. The average moment per atom in the cobalt layers in the bulk of the film was calculated from the polarised neutron reflectivity data to be 1.48±0.12μ
b.</description><subject>Applied sciences</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>Interface structure and roughness</subject><subject>Interfacial magnetic properties (multilayers, magnetic quantum wells, superlattices, magnetic heterostructures)</subject><subject>Ion-assisted deposition</subject><subject>Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties</subject><subject>Magnetic properties and materials</subject><subject>Magnetic properties of surface, thin films and multilayers</subject><subject>Metals. Metallurgy</subject><subject>Physics</subject><subject>Polarised neutron reflectivity</subject><subject>Solid surfaces and solid-solid interfaces</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>X-ray reflectivity</subject><issn>0304-8853</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><recordid>eNqFkEtLxTAQhbtQ8PkThCxEdFFNmkmbrkQuvkBwoYK7kJtOIdImNUmF_nujV3TpYhhmOHOG8xXFEaPnjLL64olyCqWUgp-28oyyKk_tVrH7u94p9mJ8o5QykPVuYZ8m68jkBx1sxI44nFPwjmjXkdcy6IUE7Ac0yX7YtJCY5m4hviearPzFaibjPCQ76AUD6XDy0aZsMrsuzzbbrP241qEb0aWDYrvXQ8TDn75fvNxcP6_uyofH2_vV1UNpOBOpBAG0kYC8FbTuKc9lag6CQc5CWUsbkAAgaJ8LsKoEIGug4nxd9W1F-X5xsvGdgn-fMSY12mhwGLRDP0dVNYw3shFZKDZCE3yMOaaagh11WBSj6gum-oapvqipVqpvmKrNd8c_D3Q0euiDdsbGv2MJdQWQZZcbGeawHxaDisaiM9jZkHmqztt_Hn0ClKyJGQ</recordid><startdate>19990601</startdate><enddate>19990601</enddate><creator>Telling, N.D.</creator><creator>Langridge, S.</creator><creator>Tang, C.C.</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19990601</creationdate><title>Spin polarised neutron and X-ray reflectivity study of a Co/Cu multilayer deposited under ion bombardment</title><author>Telling, N.D. ; Langridge, S. ; Tang, C.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c315t-4540784e39506f036f0c634514120019074844450f4504e2254e174233b2f9203</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><topic>Applied sciences</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Interface structure and roughness</topic><topic>Interfacial magnetic properties (multilayers, magnetic quantum wells, superlattices, magnetic heterostructures)</topic><topic>Ion-assisted deposition</topic><topic>Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties</topic><topic>Magnetic properties and materials</topic><topic>Magnetic properties of surface, thin films and multilayers</topic><topic>Metals. Metallurgy</topic><topic>Physics</topic><topic>Polarised neutron reflectivity</topic><topic>Solid surfaces and solid-solid interfaces</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>X-ray reflectivity</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Telling, N.D.</creatorcontrib><creatorcontrib>Langridge, S.</creatorcontrib><creatorcontrib>Tang, C.C.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of magnetism and magnetic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Telling, N.D.</au><au>Langridge, S.</au><au>Tang, C.C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Spin polarised neutron and X-ray reflectivity study of a Co/Cu multilayer deposited under ion bombardment</atitle><jtitle>Journal of magnetism and magnetic materials</jtitle><date>1999-06-01</date><risdate>1999</risdate><volume>198</volume><spage>692</spage><epage>694</epage><pages>692-694</pages><issn>0304-8853</issn><coden>JMMMDC</coden><abstract>Spin polarised neutron reflectivity and X-ray reflectivity measurements were performed on a Co/Cu multilayer deposited under ion bombardment. It was found that an average ion energy of ∼200
eV caused a reduction in interface roughness towards the surface. The average moment per atom in the cobalt layers in the bulk of the film was calculated from the polarised neutron reflectivity data to be 1.48±0.12μ
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| ispartof | Journal of magnetism and magnetic materials, 1999-06, Vol.198, p.692-694 |
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| language | eng |
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| source | Elsevier ScienceDirect Journals Complete |
| subjects | Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Interface structure and roughness Interfacial magnetic properties (multilayers, magnetic quantum wells, superlattices, magnetic heterostructures) Ion-assisted deposition Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties Magnetic properties and materials Magnetic properties of surface, thin films and multilayers Metals. Metallurgy Physics Polarised neutron reflectivity Solid surfaces and solid-solid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) X-ray reflectivity |
| title | Spin polarised neutron and X-ray reflectivity study of a Co/Cu multilayer deposited under ion bombardment |
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