Field Emission from GaN Self-Organized Nanotips
GaN self-organized nanotips were applied to the cold cathode field emitter, which was fabricated by reactive ion etching (RIE). Field emission from the GaN nanotips was observed for the first time. The microscopic current I through the anode hole (f=20 mu m) at the anode electrode was 0.1 nA at 900...
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Veröffentlicht in: | Japanese Journal of Applied Physics 2002-11, Vol.41 (Part 2, No. 11A), p.L1194-L1196 |
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container_end_page | L1196 |
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container_issue | Part 2, No. 11A |
container_start_page | L1194 |
container_title | Japanese Journal of Applied Physics |
container_volume | 41 |
creator | Terada, Yuusuke Yoshida, Harumasa Urushido, Tatsuhiro Miyake, Hideto Hiramatsu, Kazumasa |
description | GaN self-organized nanotips were applied to the cold cathode field emitter, which was fabricated by reactive ion etching (RIE). Field emission from the GaN nanotips was observed for the first time. The microscopic current I through the anode hole (f=20 mu m) at the anode electrode was 0.1 nA at 900 V. The field enhancement factor b d, which is related to the top structure of the emitter and is the product of the field conversion factor b and the sample-anode gap d, was estimated to be 300 from the Fowler-Nordheim (F-N) plot. The microscopic current I was stable at 12.5 nA for 3600 s from the onset of voltage application (standard deviation 0.64 nA). 11 refs. |
doi_str_mv | 10.1143/JJAP.41.L1194 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_27137375</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>27137375</sourcerecordid><originalsourceid>FETCH-LOGICAL-c414t-ccf682caf907d800b68808d56f147d83e87c38910af991f9c6e7359c073194ac3</originalsourceid><addsrcrecordid>eNotkLFOwzAURT2ARCmM7JnYkvrFTmyPVdWWVlGLBMyWcWxklMTBTgf4elzKdPWujp6uDkIPgAsAShb7_fK5oFA0AIJeoRnGJeRUlOUNuo3xM511RWGGFhtnujZb9y5G54fMBt9nW3XIXkxn82P4UIP7MW12UIOf3Bjv0LVVXTT3_zlHb5v16-opb47b3WrZ5JoCnXKtbc1LrazArOUYv9ecY95WtQWaCmI404QLwIkQYIWuDSOV0JiRtFdpMkePl79j8F8nEyeZFmrTdWow_hRlyYAwwqoE5hdQBx9jMFaOwfUqfEvA8qxCnlVICvJPBfkFTJtRkA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27137375</pqid></control><display><type>article</type><title>Field Emission from GaN Self-Organized Nanotips</title><source>Institute of Physics Journals</source><creator>Terada, Yuusuke ; Yoshida, Harumasa ; Urushido, Tatsuhiro ; Miyake, Hideto ; Hiramatsu, Kazumasa</creator><creatorcontrib>Terada, Yuusuke ; Yoshida, Harumasa ; Urushido, Tatsuhiro ; Miyake, Hideto ; Hiramatsu, Kazumasa</creatorcontrib><description>GaN self-organized nanotips were applied to the cold cathode field emitter, which was fabricated by reactive ion etching (RIE). Field emission from the GaN nanotips was observed for the first time. The microscopic current I through the anode hole (f=20 mu m) at the anode electrode was 0.1 nA at 900 V. The field enhancement factor b d, which is related to the top structure of the emitter and is the product of the field conversion factor b and the sample-anode gap d, was estimated to be 300 from the Fowler-Nordheim (F-N) plot. The microscopic current I was stable at 12.5 nA for 3600 s from the onset of voltage application (standard deviation 0.64 nA). 11 refs.</description><identifier>ISSN: 0021-4922</identifier><identifier>DOI: 10.1143/JJAP.41.L1194</identifier><language>eng</language><ispartof>Japanese Journal of Applied Physics, 2002-11, Vol.41 (Part 2, No. 11A), p.L1194-L1196</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c414t-ccf682caf907d800b68808d56f147d83e87c38910af991f9c6e7359c073194ac3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Terada, Yuusuke</creatorcontrib><creatorcontrib>Yoshida, Harumasa</creatorcontrib><creatorcontrib>Urushido, Tatsuhiro</creatorcontrib><creatorcontrib>Miyake, Hideto</creatorcontrib><creatorcontrib>Hiramatsu, Kazumasa</creatorcontrib><title>Field Emission from GaN Self-Organized Nanotips</title><title>Japanese Journal of Applied Physics</title><description>GaN self-organized nanotips were applied to the cold cathode field emitter, which was fabricated by reactive ion etching (RIE). Field emission from the GaN nanotips was observed for the first time. The microscopic current I through the anode hole (f=20 mu m) at the anode electrode was 0.1 nA at 900 V. The field enhancement factor b d, which is related to the top structure of the emitter and is the product of the field conversion factor b and the sample-anode gap d, was estimated to be 300 from the Fowler-Nordheim (F-N) plot. The microscopic current I was stable at 12.5 nA for 3600 s from the onset of voltage application (standard deviation 0.64 nA). 11 refs.</description><issn>0021-4922</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><recordid>eNotkLFOwzAURT2ARCmM7JnYkvrFTmyPVdWWVlGLBMyWcWxklMTBTgf4elzKdPWujp6uDkIPgAsAShb7_fK5oFA0AIJeoRnGJeRUlOUNuo3xM511RWGGFhtnujZb9y5G54fMBt9nW3XIXkxn82P4UIP7MW12UIOf3Bjv0LVVXTT3_zlHb5v16-opb47b3WrZ5JoCnXKtbc1LrazArOUYv9ecY95WtQWaCmI404QLwIkQYIWuDSOV0JiRtFdpMkePl79j8F8nEyeZFmrTdWow_hRlyYAwwqoE5hdQBx9jMFaOwfUqfEvA8qxCnlVICvJPBfkFTJtRkA</recordid><startdate>20021101</startdate><enddate>20021101</enddate><creator>Terada, Yuusuke</creator><creator>Yoshida, Harumasa</creator><creator>Urushido, Tatsuhiro</creator><creator>Miyake, Hideto</creator><creator>Hiramatsu, Kazumasa</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20021101</creationdate><title>Field Emission from GaN Self-Organized Nanotips</title><author>Terada, Yuusuke ; Yoshida, Harumasa ; Urushido, Tatsuhiro ; Miyake, Hideto ; Hiramatsu, Kazumasa</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c414t-ccf682caf907d800b68808d56f147d83e87c38910af991f9c6e7359c073194ac3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Terada, Yuusuke</creatorcontrib><creatorcontrib>Yoshida, Harumasa</creatorcontrib><creatorcontrib>Urushido, Tatsuhiro</creatorcontrib><creatorcontrib>Miyake, Hideto</creatorcontrib><creatorcontrib>Hiramatsu, Kazumasa</creatorcontrib><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Terada, Yuusuke</au><au>Yoshida, Harumasa</au><au>Urushido, Tatsuhiro</au><au>Miyake, Hideto</au><au>Hiramatsu, Kazumasa</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Field Emission from GaN Self-Organized Nanotips</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>2002-11-01</date><risdate>2002</risdate><volume>41</volume><issue>Part 2, No. 11A</issue><spage>L1194</spage><epage>L1196</epage><pages>L1194-L1196</pages><issn>0021-4922</issn><abstract>GaN self-organized nanotips were applied to the cold cathode field emitter, which was fabricated by reactive ion etching (RIE). Field emission from the GaN nanotips was observed for the first time. The microscopic current I through the anode hole (f=20 mu m) at the anode electrode was 0.1 nA at 900 V. The field enhancement factor b d, which is related to the top structure of the emitter and is the product of the field conversion factor b and the sample-anode gap d, was estimated to be 300 from the Fowler-Nordheim (F-N) plot. The microscopic current I was stable at 12.5 nA for 3600 s from the onset of voltage application (standard deviation 0.64 nA). 11 refs.</abstract><doi>10.1143/JJAP.41.L1194</doi></addata></record> |
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title | Field Emission from GaN Self-Organized Nanotips |
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