Dynamic ESPI with subtraction–addition method for obtaining the phase

Dynamic electronic speckle pattern interferometry (DESPI) was developed for in situ observations. The quantitative evaluation of the deformation field was performed through 2-D subtraction–addition method (SAM) for phase analysis. This method does not require additional phase modulation, which makes...

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Veröffentlicht in:	Optics communications 2002-10, Vol.212 (1), p.35-43
Hauptverfasser:	Madjarova, Violeta, Toyooka, Satoru, Widiastuti, Rini, Kadono, Hirofumi
Format:	Artikel
Sprache:	eng
Schlagworte:	Dynamic ESPI Exact sciences and technology Fundamental areas of phenomenology (including applications) Gaussian filter Imaging and optical processing In situ observations Instruments, apparatus, components and techniques common to several branches of physics and astronomy Interferometers Optical instruments, equipment and techniques Optics Phase analysis Phase retrieval Physics Plastic deformation
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