Ordered cerium oxide thin films grown on Ru(0001) and Ni(111)

Cerium oxide thin films between 1–10 ML thick have been grown in situ on the Ru(0001) and Ni(111) surfaces. The films were highly ordered with an orientation determined by the orientation of the substrate on which they were grown, as shown by ion scattering spectroscopy and low-energy electron diffr...

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Veröffentlicht in:	Surface science 1999-06, Vol.429 (1), p.186-198
Hauptverfasser:	Mullins, D.R., Radulovic, P.V., Overbury, S.H.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Cerium oxide Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Low energy ion scattering (LEIS) Low index single crystal surfaces Metals. Metallurgy Nickel Physics Ruthenium Soft X-ray photoelectron spectroscopy Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Synchrotron radiation photoelectron spectroscopy Thin film structure and morphology
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