Vibrational spectroscopy of thin films and nanostructures by inelastic nuclear resonant scattering
The technique of inelastic nuclear resonant scattering is applied to measure the phonon density of states of thin films and nanostructured materials. Interference effects in grazing incidence geometry significantly enhance the inelastic signal from low-dimensional systems. Combined with the outstand...
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Veröffentlicht in: | Journal of physics. Condensed matter 2001-08, Vol.13 (34), p.7659-7677 |
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container_title | Journal of physics. Condensed matter |
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creator | Rohlsberger, R |
description | The technique of inelastic nuclear resonant scattering is applied to measure the phonon density of states of thin films and nanostructured materials. Interference effects in grazing incidence geometry significantly enhance the inelastic signal from low-dimensional systems. Combined with the outstanding brilliance of modern synchrotron radiation sources this allows one to determine vibrational properties with monolayer sensitivity. An introduction into the basic principles of the method is given, and several experimental examples are discussed. (Materials noted: Fe, W, Pd; substrate: glass ceramics ZERODUR.) |
doi_str_mv | 10.1088/0953-8984/13/34/312 |
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Condensed matter</title><description>The technique of inelastic nuclear resonant scattering is applied to measure the phonon density of states of thin films and nanostructured materials. Interference effects in grazing incidence geometry significantly enhance the inelastic signal from low-dimensional systems. Combined with the outstanding brilliance of modern synchrotron radiation sources this allows one to determine vibrational properties with monolayer sensitivity. An introduction into the basic principles of the method is given, and several experimental examples are discussed. 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subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Lattice dynamics Phonons in low-dimensional structures and small particles Physics |
title | Vibrational spectroscopy of thin films and nanostructures by inelastic nuclear resonant scattering |
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