Transmission electron microscopy investigation of Bi-2223/Ag tapes
The microstructure of (Bi,Pb) 2Sr 2Ca 2Cu 3O x (Bi-2223) tapes has been investigated by means of transmission electron microscopy (TEM) and high-resolution TEM. The emphasis has been placed on: (1) an examination of the grain morphology and size, (2) grain and colony boundary angles, which are forme...
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| Veröffentlicht in: | Physica. C, Superconductivity Superconductivity, 2001-05, Vol.353 (3), p.251-257 |
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| container_title | Physica. C, Superconductivity |
| container_volume | 353 |
| creator | Gottschalck Andersen, L. Bals, S. Van Tendeloo, G. Poulsen, H.F. Liu, Y.L. |
| description | The microstructure of (Bi,Pb)
2Sr
2Ca
2Cu
3O
x
(Bi-2223) tapes has been investigated by means of transmission electron microscopy (TEM) and high-resolution TEM. The emphasis has been placed on: (1) an examination of the grain morphology and size, (2) grain and colony boundary angles, which are formed during the tape processing, (3) a study of the grain boundaries on an atomic scale, including intergrowth investigations. Tapes with different process parameters have been compared with respect to the microstructure. A fully processed tape has on the average 50% thicker Bi-2223 grains than a tape after the first annealing. The angles of
c-axis tilt grain boundaries are on average 14° and 26° for the fully processed tape and the tape after the first annealing, respectively. The intergrowth content (15%) and distribution are similar in these two tapes. |
| doi_str_mv | 10.1016/S0921-4534(00)01755-X |
| format | Article |
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2Sr
2Ca
2Cu
3O
x
(Bi-2223) tapes has been investigated by means of transmission electron microscopy (TEM) and high-resolution TEM. The emphasis has been placed on: (1) an examination of the grain morphology and size, (2) grain and colony boundary angles, which are formed during the tape processing, (3) a study of the grain boundaries on an atomic scale, including intergrowth investigations. Tapes with different process parameters have been compared with respect to the microstructure. A fully processed tape has on the average 50% thicker Bi-2223 grains than a tape after the first annealing. The angles of
c-axis tilt grain boundaries are on average 14° and 26° for the fully processed tape and the tape after the first annealing, respectively. The intergrowth content (15%) and distribution are similar in these two tapes.</description><identifier>ISSN: 0921-4534</identifier><identifier>EISSN: 1873-2143</identifier><identifier>DOI: 10.1016/S0921-4534(00)01755-X</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Bi-2223 ; Grain size ; Intergrowth ; Texture ; Transmission electron microscopy</subject><ispartof>Physica. C, Superconductivity, 2001-05, Vol.353 (3), p.251-257</ispartof><rights>2001 Elsevier Science B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c369t-de5ab2b49c6b6946c9068543b76a1dabebbb395a7d1117e3756894c878fca1ad3</citedby><cites>FETCH-LOGICAL-c369t-de5ab2b49c6b6946c9068543b76a1dabebbb395a7d1117e3756894c878fca1ad3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/S0921-4534(00)01755-X$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids></links><search><creatorcontrib>Gottschalck Andersen, L.</creatorcontrib><creatorcontrib>Bals, S.</creatorcontrib><creatorcontrib>Van Tendeloo, G.</creatorcontrib><creatorcontrib>Poulsen, H.F.</creatorcontrib><creatorcontrib>Liu, Y.L.</creatorcontrib><title>Transmission electron microscopy investigation of Bi-2223/Ag tapes</title><title>Physica. C, Superconductivity</title><description>The microstructure of (Bi,Pb)
2Sr
2Ca
2Cu
3O
x
(Bi-2223) tapes has been investigated by means of transmission electron microscopy (TEM) and high-resolution TEM. The emphasis has been placed on: (1) an examination of the grain morphology and size, (2) grain and colony boundary angles, which are formed during the tape processing, (3) a study of the grain boundaries on an atomic scale, including intergrowth investigations. Tapes with different process parameters have been compared with respect to the microstructure. A fully processed tape has on the average 50% thicker Bi-2223 grains than a tape after the first annealing. The angles of
c-axis tilt grain boundaries are on average 14° and 26° for the fully processed tape and the tape after the first annealing, respectively. The intergrowth content (15%) and distribution are similar in these two tapes.</description><subject>Bi-2223</subject><subject>Grain size</subject><subject>Intergrowth</subject><subject>Texture</subject><subject>Transmission electron microscopy</subject><issn>0921-4534</issn><issn>1873-2143</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNqNkE1LAzEQhoMoWKs_QdiT6GFtJtkkm5O0xS8oeLBCbyGbzZbIdndNtoX-e7OteNW5zByeGeZ9ELoGfA8Y-OQdSwJpxmh2i_EdBsFYujpBI8gFTQlk9BSNfpFzdBHCJ44FEkZotvS6CRsXgmubxNbW9D4OG2d8G0zb7RPX7Gzo3Vr3A9FWycylhBA6ma6TXnc2XKKzStfBXv30Mfp4elzOX9LF2_PrfLpIDeWyT0vLdEGKTBpecJlxIzHPWUYLwTWUurBFUVDJtCgBQFgqGM9lZnKRV0aDLukY3Rzvdr792safVHzb2LrWjW23QRGBKQXM_wWSHPIIsiM4hA3eVqrzbqP9XgFWg1p1UKsGbwpjdVCrVnHv4bhnY9yds14F42xjbOl8FKjK1v1x4Rvcx4Ao</recordid><startdate>20010515</startdate><enddate>20010515</enddate><creator>Gottschalck Andersen, L.</creator><creator>Bals, S.</creator><creator>Van Tendeloo, G.</creator><creator>Poulsen, H.F.</creator><creator>Liu, Y.L.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>7QQ</scope><scope>JG9</scope></search><sort><creationdate>20010515</creationdate><title>Transmission electron microscopy investigation of Bi-2223/Ag tapes</title><author>Gottschalck Andersen, L. ; Bals, S. ; Van Tendeloo, G. ; Poulsen, H.F. ; Liu, Y.L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c369t-de5ab2b49c6b6946c9068543b76a1dabebbb395a7d1117e3756894c878fca1ad3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Bi-2223</topic><topic>Grain size</topic><topic>Intergrowth</topic><topic>Texture</topic><topic>Transmission electron microscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gottschalck Andersen, L.</creatorcontrib><creatorcontrib>Bals, S.</creatorcontrib><creatorcontrib>Van Tendeloo, G.</creatorcontrib><creatorcontrib>Poulsen, H.F.</creatorcontrib><creatorcontrib>Liu, Y.L.</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Ceramic Abstracts</collection><collection>Materials Research Database</collection><jtitle>Physica. C, Superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Gottschalck Andersen, L.</au><au>Bals, S.</au><au>Van Tendeloo, G.</au><au>Poulsen, H.F.</au><au>Liu, Y.L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Transmission electron microscopy investigation of Bi-2223/Ag tapes</atitle><jtitle>Physica. C, Superconductivity</jtitle><date>2001-05-15</date><risdate>2001</risdate><volume>353</volume><issue>3</issue><spage>251</spage><epage>257</epage><pages>251-257</pages><issn>0921-4534</issn><eissn>1873-2143</eissn><abstract>The microstructure of (Bi,Pb)
2Sr
2Ca
2Cu
3O
x
(Bi-2223) tapes has been investigated by means of transmission electron microscopy (TEM) and high-resolution TEM. The emphasis has been placed on: (1) an examination of the grain morphology and size, (2) grain and colony boundary angles, which are formed during the tape processing, (3) a study of the grain boundaries on an atomic scale, including intergrowth investigations. Tapes with different process parameters have been compared with respect to the microstructure. A fully processed tape has on the average 50% thicker Bi-2223 grains than a tape after the first annealing. The angles of
c-axis tilt grain boundaries are on average 14° and 26° for the fully processed tape and the tape after the first annealing, respectively. The intergrowth content (15%) and distribution are similar in these two tapes.</abstract><pub>Elsevier B.V</pub><doi>10.1016/S0921-4534(00)01755-X</doi><tpages>7</tpages></addata></record> |
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| subjects | Bi-2223 Grain size Intergrowth Texture Transmission electron microscopy |
| title | Transmission electron microscopy investigation of Bi-2223/Ag tapes |
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