Ellipsometric and photocurrent characterization of oxide films formed on copper in borax solution with and without benzotriazol
The effect of the addition of benzotriazol on the passive behaviour of copper in borax solutions was analyzed in the potential region −0.32 to 0.71 V vs. RHE using voltammetric, photocurrent and ellipsometric techniques. Oxide formation can be explained as a sequence of Cu 2O growth (inner layer ipp...
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| Veröffentlicht in: | Electrochimica acta 1999-11, Vol.45 (4), p.819-825 |
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| container_title | Electrochimica acta |
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| creator | Zerbino, J.O. |
| description | The effect of the addition of benzotriazol on the passive behaviour of copper in borax solutions was analyzed in the potential region −0.32 to 0.71 V vs. RHE using voltammetric, photocurrent and ellipsometric techniques. Oxide formation can be explained as a sequence of Cu
2O growth (inner layer ippl) and dissolution precipitation of Cu(II), (outer hydrated oxide layer (oppl)). The resulting photocurrent was proportional to the thickness of the ippl. However, significant variations in the amplitude and phase of the photocurrent were detected as a function of the potential region and the composition of the electrolyte. These effects are related to changes in the excess of cations accumulated in the ippl. |
| doi_str_mv | 10.1016/S0013-4686(99)00260-1 |
| format | Article |
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2O growth (inner layer ippl) and dissolution precipitation of Cu(II), (outer hydrated oxide layer (oppl)). The resulting photocurrent was proportional to the thickness of the ippl. However, significant variations in the amplitude and phase of the photocurrent were detected as a function of the potential region and the composition of the electrolyte. These effects are related to changes in the excess of cations accumulated in the ippl.</description><identifier>ISSN: 0013-4686</identifier><identifier>EISSN: 1873-3859</identifier><identifier>DOI: 10.1016/S0013-4686(99)00260-1</identifier><identifier>CODEN: ELCAAV</identifier><language>eng</language><publisher>Oxford: Elsevier Ltd</publisher><subject>Benzotriazol ; Chemistry ; Copper oxide ; Electrochemistry ; Electrodeposition ; Ellipsometry ; Exact sciences and technology ; General and physical chemistry ; Photocurrent ; Semiconductor ; Study of interfaces</subject><ispartof>Electrochimica acta, 1999-11, Vol.45 (4), p.819-825</ispartof><rights>1999 Elsevier Science Ltd</rights><rights>2000 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c367t-595cdfa0528ab5ad469bf43e29af335be07b7f6abf43c2282b65cafca3f2dc043</citedby><cites>FETCH-LOGICAL-c367t-595cdfa0528ab5ad469bf43e29af335be07b7f6abf43c2282b65cafca3f2dc043</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/S0013-4686(99)00260-1$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,3550,23930,23931,25140,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1219985$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Zerbino, J.O.</creatorcontrib><title>Ellipsometric and photocurrent characterization of oxide films formed on copper in borax solution with and without benzotriazol</title><title>Electrochimica acta</title><description>The effect of the addition of benzotriazol on the passive behaviour of copper in borax solutions was analyzed in the potential region −0.32 to 0.71 V vs. RHE using voltammetric, photocurrent and ellipsometric techniques. Oxide formation can be explained as a sequence of Cu
2O growth (inner layer ippl) and dissolution precipitation of Cu(II), (outer hydrated oxide layer (oppl)). The resulting photocurrent was proportional to the thickness of the ippl. However, significant variations in the amplitude and phase of the photocurrent were detected as a function of the potential region and the composition of the electrolyte. These effects are related to changes in the excess of cations accumulated in the ippl.</description><subject>Benzotriazol</subject><subject>Chemistry</subject><subject>Copper oxide</subject><subject>Electrochemistry</subject><subject>Electrodeposition</subject><subject>Ellipsometry</subject><subject>Exact sciences and technology</subject><subject>General and physical chemistry</subject><subject>Photocurrent</subject><subject>Semiconductor</subject><subject>Study of interfaces</subject><issn>0013-4686</issn><issn>1873-3859</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><recordid>eNqFkE9v1DAQxS0EEkvhIyD5gBA9BPxn7cQnhKpCK1XiUDhbE2esNXLiYDtQ9tKv3uxuBUdOM5r5vXmaR8hrzt5zxvWHW8a4bLa60--MOWdMaNbwJ2TDu1Y2slPmKdn8RZ6TF6X8YIy1umUbcn8ZY5hLGrHm4ChMA513qSa35IxTpW4HGVzFHPZQQ5po8jTdhQGpD3Es1Kc84kDXhUvzjJmGifYpwx0tKS5Hxe9Qd8fDhyYtlfY47dNqB_sUX5JnHmLBV4_1jHz_fPnt4qq5-frl-uLTTeOkbmujjHKDB6ZEB72CYatN77cShQEvpeqRtX3rNRyGTohO9Fo58A6kF4NjW3lG3p7uzjn9XLBUO4biMEaYMC3FCm062WqxguoEupxKyejtnMMI-Y_lzB7itse47SFLa4w9xm35qnvzaADFQfQZJhfKP7HgxnRqxT6eMFyf_RUw2-ICTg6HkNFVO6TwH6MHo2aYoA</recordid><startdate>19991101</startdate><enddate>19991101</enddate><creator>Zerbino, J.O.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19991101</creationdate><title>Ellipsometric and photocurrent characterization of oxide films formed on copper in borax solution with and without benzotriazol</title><author>Zerbino, J.O.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c367t-595cdfa0528ab5ad469bf43e29af335be07b7f6abf43c2282b65cafca3f2dc043</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><topic>Benzotriazol</topic><topic>Chemistry</topic><topic>Copper oxide</topic><topic>Electrochemistry</topic><topic>Electrodeposition</topic><topic>Ellipsometry</topic><topic>Exact sciences and technology</topic><topic>General and physical chemistry</topic><topic>Photocurrent</topic><topic>Semiconductor</topic><topic>Study of interfaces</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zerbino, J.O.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Electrochimica acta</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zerbino, J.O.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Ellipsometric and photocurrent characterization of oxide films formed on copper in borax solution with and without benzotriazol</atitle><jtitle>Electrochimica acta</jtitle><date>1999-11-01</date><risdate>1999</risdate><volume>45</volume><issue>4</issue><spage>819</spage><epage>825</epage><pages>819-825</pages><issn>0013-4686</issn><eissn>1873-3859</eissn><coden>ELCAAV</coden><abstract>The effect of the addition of benzotriazol on the passive behaviour of copper in borax solutions was analyzed in the potential region −0.32 to 0.71 V vs. RHE using voltammetric, photocurrent and ellipsometric techniques. Oxide formation can be explained as a sequence of Cu
2O growth (inner layer ippl) and dissolution precipitation of Cu(II), (outer hydrated oxide layer (oppl)). The resulting photocurrent was proportional to the thickness of the ippl. However, significant variations in the amplitude and phase of the photocurrent were detected as a function of the potential region and the composition of the electrolyte. These effects are related to changes in the excess of cations accumulated in the ippl.</abstract><cop>Oxford</cop><pub>Elsevier Ltd</pub><doi>10.1016/S0013-4686(99)00260-1</doi><tpages>7</tpages></addata></record> |
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| issn | 0013-4686 1873-3859 |
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| subjects | Benzotriazol Chemistry Copper oxide Electrochemistry Electrodeposition Ellipsometry Exact sciences and technology General and physical chemistry Photocurrent Semiconductor Study of interfaces |
| title | Ellipsometric and photocurrent characterization of oxide films formed on copper in borax solution with and without benzotriazol |
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