Electrical properties of (Ba,Sr)TiO sub(3) on (Sr,Ca)RuO sub(3) electrode
A perovskite (Sr,Ca)RuO sub(3) [SCR] electrode has been explored in order to utilize its advantages in structural match with (Ba,Sr)TiO sub(3) [BST] films, which may enhance the electrical properties of BST films. The SCR electrode led to the leakage current density (10 super(-7) A/cm super(2)) of B...
Gespeichert in:
Veröffentlicht in: | Journal of materials science 1999-01, Vol.34 (24), p.6115-6119 |
---|---|
Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 6119 |
---|---|
container_issue | 24 |
container_start_page | 6115 |
container_title | Journal of materials science |
container_volume | 34 |
creator | Son, Seung Young Kim, Boum Seock Oh, Se Hoon Choi, Duck Kyun Yoo, Cha Young Lee, Sang In Dai, Z R Ohuchi, Fumio S |
description | A perovskite (Sr,Ca)RuO sub(3) [SCR] electrode has been explored in order to utilize its advantages in structural match with (Ba,Sr)TiO sub(3) [BST] films, which may enhance the electrical properties of BST films. The SCR electrode led to the leakage current density (10 super(-7) A/cm super(2)) of BST films an order lower than that on RuO sub(2). The leakage current was not sensitive to the composition of the SCR electrodes, while the dielectric constant of the BST thin film capacitor ranged from 160 to 280 depending on the Sr/Ca ratio in SCR electrodes. The BST/SCR (Sr/Ca identical with 7/3) system resulted in a 5-nm thick interfacial layer. Furthermore, the interfacial layer turned out to be partially crystallized according to the lattice image taken by an HRTEM. It is believed that such enhancement in electrical properties of BST films could be induced by the improvement of interfacial characteristics through structural matching. |
format | Article |
fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_26981924</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>26981924</sourcerecordid><originalsourceid>FETCH-proquest_miscellaneous_269819243</originalsourceid><addsrcrecordid>eNpjYeA0MDAy0jUyMTPkYOAqLs4yMDAwNTcy5GTwdM1JTS4pykxOzFEoKMovSC0qyUwtVshPU9BwStQJLtIMyfRXKC5N0jDWVMjPU9AILtJxTtQMKoULpoL156ek8jCwpiXmFKfyQmluBjU31xBnD12gsYWlqcUl8bmZxcmpOTmJean5pcXxRmaWFoaWRibGRCsEACu_PAE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>26981924</pqid></control><display><type>article</type><title>Electrical properties of (Ba,Sr)TiO sub(3) on (Sr,Ca)RuO sub(3) electrode</title><source>SpringerLink Journals - AutoHoldings</source><creator>Son, Seung Young ; Kim, Boum Seock ; Oh, Se Hoon ; Choi, Duck Kyun ; Yoo, Cha Young ; Lee, Sang In ; Dai, Z R ; Ohuchi, Fumio S</creator><creatorcontrib>Son, Seung Young ; Kim, Boum Seock ; Oh, Se Hoon ; Choi, Duck Kyun ; Yoo, Cha Young ; Lee, Sang In ; Dai, Z R ; Ohuchi, Fumio S</creatorcontrib><description>A perovskite (Sr,Ca)RuO sub(3) [SCR] electrode has been explored in order to utilize its advantages in structural match with (Ba,Sr)TiO sub(3) [BST] films, which may enhance the electrical properties of BST films. The SCR electrode led to the leakage current density (10 super(-7) A/cm super(2)) of BST films an order lower than that on RuO sub(2). The leakage current was not sensitive to the composition of the SCR electrodes, while the dielectric constant of the BST thin film capacitor ranged from 160 to 280 depending on the Sr/Ca ratio in SCR electrodes. The BST/SCR (Sr/Ca identical with 7/3) system resulted in a 5-nm thick interfacial layer. Furthermore, the interfacial layer turned out to be partially crystallized according to the lattice image taken by an HRTEM. It is believed that such enhancement in electrical properties of BST films could be induced by the improvement of interfacial characteristics through structural matching.</description><identifier>ISSN: 0022-2461</identifier><language>eng</language><ispartof>Journal of materials science, 1999-01, Vol.34 (24), p.6115-6119</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780</link.rule.ids></links><search><creatorcontrib>Son, Seung Young</creatorcontrib><creatorcontrib>Kim, Boum Seock</creatorcontrib><creatorcontrib>Oh, Se Hoon</creatorcontrib><creatorcontrib>Choi, Duck Kyun</creatorcontrib><creatorcontrib>Yoo, Cha Young</creatorcontrib><creatorcontrib>Lee, Sang In</creatorcontrib><creatorcontrib>Dai, Z R</creatorcontrib><creatorcontrib>Ohuchi, Fumio S</creatorcontrib><title>Electrical properties of (Ba,Sr)TiO sub(3) on (Sr,Ca)RuO sub(3) electrode</title><title>Journal of materials science</title><description>A perovskite (Sr,Ca)RuO sub(3) [SCR] electrode has been explored in order to utilize its advantages in structural match with (Ba,Sr)TiO sub(3) [BST] films, which may enhance the electrical properties of BST films. The SCR electrode led to the leakage current density (10 super(-7) A/cm super(2)) of BST films an order lower than that on RuO sub(2). The leakage current was not sensitive to the composition of the SCR electrodes, while the dielectric constant of the BST thin film capacitor ranged from 160 to 280 depending on the Sr/Ca ratio in SCR electrodes. The BST/SCR (Sr/Ca identical with 7/3) system resulted in a 5-nm thick interfacial layer. Furthermore, the interfacial layer turned out to be partially crystallized according to the lattice image taken by an HRTEM. It is believed that such enhancement in electrical properties of BST films could be induced by the improvement of interfacial characteristics through structural matching.</description><issn>0022-2461</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><recordid>eNpjYeA0MDAy0jUyMTPkYOAqLs4yMDAwNTcy5GTwdM1JTS4pykxOzFEoKMovSC0qyUwtVshPU9BwStQJLtIMyfRXKC5N0jDWVMjPU9AILtJxTtQMKoULpoL156ek8jCwpiXmFKfyQmluBjU31xBnD12gsYWlqcUl8bmZxcmpOTmJean5pcXxRmaWFoaWRibGRCsEACu_PAE</recordid><startdate>19990101</startdate><enddate>19990101</enddate><creator>Son, Seung Young</creator><creator>Kim, Boum Seock</creator><creator>Oh, Se Hoon</creator><creator>Choi, Duck Kyun</creator><creator>Yoo, Cha Young</creator><creator>Lee, Sang In</creator><creator>Dai, Z R</creator><creator>Ohuchi, Fumio S</creator><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19990101</creationdate><title>Electrical properties of (Ba,Sr)TiO sub(3) on (Sr,Ca)RuO sub(3) electrode</title><author>Son, Seung Young ; Kim, Boum Seock ; Oh, Se Hoon ; Choi, Duck Kyun ; Yoo, Cha Young ; Lee, Sang In ; Dai, Z R ; Ohuchi, Fumio S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_269819243</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Son, Seung Young</creatorcontrib><creatorcontrib>Kim, Boum Seock</creatorcontrib><creatorcontrib>Oh, Se Hoon</creatorcontrib><creatorcontrib>Choi, Duck Kyun</creatorcontrib><creatorcontrib>Yoo, Cha Young</creatorcontrib><creatorcontrib>Lee, Sang In</creatorcontrib><creatorcontrib>Dai, Z R</creatorcontrib><creatorcontrib>Ohuchi, Fumio S</creatorcontrib><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Son, Seung Young</au><au>Kim, Boum Seock</au><au>Oh, Se Hoon</au><au>Choi, Duck Kyun</au><au>Yoo, Cha Young</au><au>Lee, Sang In</au><au>Dai, Z R</au><au>Ohuchi, Fumio S</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electrical properties of (Ba,Sr)TiO sub(3) on (Sr,Ca)RuO sub(3) electrode</atitle><jtitle>Journal of materials science</jtitle><date>1999-01-01</date><risdate>1999</risdate><volume>34</volume><issue>24</issue><spage>6115</spage><epage>6119</epage><pages>6115-6119</pages><issn>0022-2461</issn><abstract>A perovskite (Sr,Ca)RuO sub(3) [SCR] electrode has been explored in order to utilize its advantages in structural match with (Ba,Sr)TiO sub(3) [BST] films, which may enhance the electrical properties of BST films. The SCR electrode led to the leakage current density (10 super(-7) A/cm super(2)) of BST films an order lower than that on RuO sub(2). The leakage current was not sensitive to the composition of the SCR electrodes, while the dielectric constant of the BST thin film capacitor ranged from 160 to 280 depending on the Sr/Ca ratio in SCR electrodes. The BST/SCR (Sr/Ca identical with 7/3) system resulted in a 5-nm thick interfacial layer. Furthermore, the interfacial layer turned out to be partially crystallized according to the lattice image taken by an HRTEM. It is believed that such enhancement in electrical properties of BST films could be induced by the improvement of interfacial characteristics through structural matching.</abstract></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0022-2461 |
ispartof | Journal of materials science, 1999-01, Vol.34 (24), p.6115-6119 |
issn | 0022-2461 |
language | eng |
recordid | cdi_proquest_miscellaneous_26981924 |
source | SpringerLink Journals - AutoHoldings |
title | Electrical properties of (Ba,Sr)TiO sub(3) on (Sr,Ca)RuO sub(3) electrode |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T12%3A51%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electrical%20properties%20of%20(Ba,Sr)TiO%20sub(3)%20on%20(Sr,Ca)RuO%20sub(3)%20electrode&rft.jtitle=Journal%20of%20materials%20science&rft.au=Son,%20Seung%20Young&rft.date=1999-01-01&rft.volume=34&rft.issue=24&rft.spage=6115&rft.epage=6119&rft.pages=6115-6119&rft.issn=0022-2461&rft_id=info:doi/&rft_dat=%3Cproquest%3E26981924%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=26981924&rft_id=info:pmid/&rfr_iscdi=true |