Scanning tunneling microscopy and spectroscopy of tin oxide films

SnO 2 thick films have been studied with scanning tunneling microscopy and spectroscopy. Topographic images revealed grains with an average diameter of about 100 nm and roughness of 50 nm. Tunneling current-voltage characteristics measured indicate that these small grains present a non rectifying be...

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Veröffentlicht in:	Journal of the European Ceramic Society 2001-08, Vol.21 (8), p.1115-1119
Hauptverfasser:	Castro, M.S, Suárez, M.P, Aldao, C.M
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Conductivity of specific materials Conductivity phenomena in semiconductors and insulators Defects Defects and impurities in crystals microstructure Electrical properties Electronic transport in condensed matter Exact sciences and technology General equipment and techniques Grain boundaries Instruments, apparatus, components and techniques common to several branches of physics and astronomy Low-field transport and mobility piezoresistance Physics Sensors Sensors (chemical, optical, electrical, movement, gas, etc.) remote sensing SnO 2 Structure of solids and liquids crystallography
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