Development of New Method for Materials Characterization at Elevated Temperatures by Transmission Electron Microscopy

The method is useful in order to accurately understand the internal configuration of miniaturized structure of materials that are obtained as a result of thermal processes. Such understanding is considered as a powerful tool in development of new materials with superb desired characteristics. Focusing on this fact, authors proceed with utilizing general-use electron microscope and have developed a method to make the high resolution observation at high temperatures. They have successfully created high resolution at the atomic level at 1800 deg C. Also using this technology authors could observe the atoms behavior of ceramics at 1500 deg C. The developed heating devices are of two types which are used for powder and bulk materials. However for atomic level of observation at high temperatures the image resolution of crystal lattice is set at 0.18 nm. Authors also have made it possible to conduct element analysis by EDX as well. In this technique the test specimen is directly attached to heater and as seen in the graphs, temperature characteristics indicate that for heating up to 1800 deg C only 2W is required.