PZT-based piezoelectric composites via a modified sol–gel route
A novel hybrid sol–gel approach is developed to prepare composite PZT films in the thickness range 1–20 μm at relatively low sintering temperatures (
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| Veröffentlicht in: | Journal of the European Ceramic Society 2001, Vol.21 (10), p.1535-1538 |
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| container_end_page | 1538 |
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| container_issue | 10 |
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| container_title | Journal of the European Ceramic Society |
| container_volume | 21 |
| creator | Kholkin, A.L. Yarmarkin, V.K. Wu, A. Avdeev, M. Vilarinho, P.M. Baptista, J.L. |
| description | A novel hybrid sol–gel approach is developed to prepare composite PZT films in the thickness range 1–20 μm at relatively low sintering temperatures ( |
| doi_str_mv | 10.1016/S0955-2219(01)00058-9 |
| format | Article |
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In this approach, a dip-coating method (thickness<5 μm) is used to deposit films from a sol–gel solution with dispersed PZT powder. Thicker films (>5 μm) are fabricated using sedimentation of the PZT powder onto Pt-coated Si substrates with a subsequent multiple infiltration of powder coatings with PZT sol–gel solution. Dielectric and ferroelectric properties of thick films are studied and discussed in the framework of existing models of composites.</description><identifier>ISSN: 0955-2219</identifier><identifier>EISSN: 1873-619X</identifier><identifier>DOI: 10.1016/S0955-2219(01)00058-9</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><subject>Coating techniques ; Composite materials ; Composites ; Dielectric properties ; Ferroelectricity ; Film preparation ; PZT ; Silicon ; Sintering ; Sol-gels ; Sol–gel method ; Substrates ; Thickness measurement</subject><ispartof>Journal of the European Ceramic Society, 2001, Vol.21 (10), p.1535-1538</ispartof><rights>2001</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c369t-b7e9c9186e06c49c26ab7171ce702aa940f2a638dac2f317354716e09ac6b603</citedby><cites>FETCH-LOGICAL-c369t-b7e9c9186e06c49c26ab7171ce702aa940f2a638dac2f317354716e09ac6b603</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0955221901000589$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,4010,27900,27901,27902,65306</link.rule.ids></links><search><contributor>WCA</contributor><creatorcontrib>Kholkin, A.L.</creatorcontrib><creatorcontrib>Yarmarkin, V.K.</creatorcontrib><creatorcontrib>Wu, A.</creatorcontrib><creatorcontrib>Avdeev, M.</creatorcontrib><creatorcontrib>Vilarinho, P.M.</creatorcontrib><creatorcontrib>Baptista, J.L.</creatorcontrib><title>PZT-based piezoelectric composites via a modified sol–gel route</title><title>Journal of the European Ceramic Society</title><description>A novel hybrid sol–gel approach is developed to prepare composite PZT films in the thickness range 1–20 μm at relatively low sintering temperatures (<600°C). In this approach, a dip-coating method (thickness<5 μm) is used to deposit films from a sol–gel solution with dispersed PZT powder. Thicker films (>5 μm) are fabricated using sedimentation of the PZT powder onto Pt-coated Si substrates with a subsequent multiple infiltration of powder coatings with PZT sol–gel solution. Dielectric and ferroelectric properties of thick films are studied and discussed in the framework of existing models of composites.</description><subject>Coating techniques</subject><subject>Composite materials</subject><subject>Composites</subject><subject>Dielectric properties</subject><subject>Ferroelectricity</subject><subject>Film preparation</subject><subject>PZT</subject><subject>Silicon</subject><subject>Sintering</subject><subject>Sol-gels</subject><subject>Sol–gel method</subject><subject>Substrates</subject><subject>Thickness measurement</subject><issn>0955-2219</issn><issn>1873-619X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNqFkM1Kw0AURgdRsFYfQchKdBG9d5JMMispxT8oKNiFuBkmkxsZSTpxJi3oynfwDX0SUytuu7qb8x24h7FjhHMEFBePILMs5hzlKeAZAGRFLHfYCIs8iQXKp102-kf22UEIrwCYg5QjNnl4nselDlRFnaUPRw2Z3lsTGdd2LtieQrSyOtJR6ypb24ELrvn-_HqhJvJu2dMh26t1E-jo747Z_PpqPr2NZ_c3d9PJLDaJkH1c5iSNxEIQCJNKw4Uuc8zRUA5ca5lCzbVIikobXieYJ1ma4wBLbUQpIBmzk4228-5tSaFXrQ2GmkYvyC2D4kJCxhOxHcRBjCkOYLYBjXcheKpV522r_btCUOuw6jesWldTgOo3rJLD7nKzo-HblSWvgrG0MFRZP8RTlbNbDD_Jv3_8</recordid><startdate>2001</startdate><enddate>2001</enddate><creator>Kholkin, A.L.</creator><creator>Yarmarkin, V.K.</creator><creator>Wu, A.</creator><creator>Avdeev, M.</creator><creator>Vilarinho, P.M.</creator><creator>Baptista, J.L.</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>2001</creationdate><title>PZT-based piezoelectric composites via a modified sol–gel route</title><author>Kholkin, A.L. ; Yarmarkin, V.K. ; Wu, A. ; Avdeev, M. ; Vilarinho, P.M. ; Baptista, J.L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c369t-b7e9c9186e06c49c26ab7171ce702aa940f2a638dac2f317354716e09ac6b603</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Coating techniques</topic><topic>Composite materials</topic><topic>Composites</topic><topic>Dielectric properties</topic><topic>Ferroelectricity</topic><topic>Film preparation</topic><topic>PZT</topic><topic>Silicon</topic><topic>Sintering</topic><topic>Sol-gels</topic><topic>Sol–gel method</topic><topic>Substrates</topic><topic>Thickness measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kholkin, A.L.</creatorcontrib><creatorcontrib>Yarmarkin, V.K.</creatorcontrib><creatorcontrib>Wu, A.</creatorcontrib><creatorcontrib>Avdeev, M.</creatorcontrib><creatorcontrib>Vilarinho, P.M.</creatorcontrib><creatorcontrib>Baptista, J.L.</creatorcontrib><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of the European Ceramic Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kholkin, A.L.</au><au>Yarmarkin, V.K.</au><au>Wu, A.</au><au>Avdeev, M.</au><au>Vilarinho, P.M.</au><au>Baptista, J.L.</au><au>WCA</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>PZT-based piezoelectric composites via a modified sol–gel route</atitle><jtitle>Journal of the European Ceramic Society</jtitle><date>2001</date><risdate>2001</risdate><volume>21</volume><issue>10</issue><spage>1535</spage><epage>1538</epage><pages>1535-1538</pages><issn>0955-2219</issn><eissn>1873-619X</eissn><abstract>A novel hybrid sol–gel approach is developed to prepare composite PZT films in the thickness range 1–20 μm at relatively low sintering temperatures (<600°C). In this approach, a dip-coating method (thickness<5 μm) is used to deposit films from a sol–gel solution with dispersed PZT powder. Thicker films (>5 μm) are fabricated using sedimentation of the PZT powder onto Pt-coated Si substrates with a subsequent multiple infiltration of powder coatings with PZT sol–gel solution. Dielectric and ferroelectric properties of thick films are studied and discussed in the framework of existing models of composites.</abstract><pub>Elsevier Ltd</pub><doi>10.1016/S0955-2219(01)00058-9</doi><tpages>4</tpages></addata></record> |
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| ispartof | Journal of the European Ceramic Society, 2001, Vol.21 (10), p.1535-1538 |
| issn | 0955-2219 1873-619X |
| language | eng |
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| source | Elsevier ScienceDirect Journals |
| subjects | Coating techniques Composite materials Composites Dielectric properties Ferroelectricity Film preparation PZT Silicon Sintering Sol-gels Sol–gel method Substrates Thickness measurement |
| title | PZT-based piezoelectric composites via a modified sol–gel route |
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