The crack tip strain field of AISI 4340: Part I: Measurement technique

This is the first paper in a study on the influence of the environment on the crack tip strain field for AISI 4340. A stressing stage for the environmental scanning electron microscope (ESEM) was constructed which was capable of applying loads up to 60 kN to fracture-mechanics samples. The measureme...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Journal of materials science 1999-10, Vol.34 (20), p.4909-4920
Hauptverfasser:	KINAEV, N. N, COUSENS, D. R, ATRENS, A
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithms Applied sciences Chemical etching Crack tips Electron microscopes Error analysis Exact sciences and technology Fractures Image processing Materials science Mathematical analysis Measurement techniques Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology Metals. Metallurgy Organic chemistry Strain
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!