X-ray photoelectron spectroscopy and scanning tunneling microscopy study of passive films formed on (100) Fe-18Cr-13Ni single-crystal surfaces

X-ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM) were combined to investigate the thickness, chemical composition, and structure of passive films formed in 0.5 M H sub 2 SO sub 4 on (100)Fe-18Cr-13Ni. The XPS measurements show that aging under polarization at +500 mV/SH...

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Veröffentlicht in:	Journal of the Electrochemical Society 1998-03, Vol.145 (3), p.909-920
Hauptverfasser:	MAURICE, V, YANG, W. P, MARCUS, P
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Corrosion Corrosion mechanisms Exact sciences and technology Metals. Metallurgy
Online-Zugang:	Volltext
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