$Oxidation of Sn Thin Films to SnO2. Micro-Raman Mapping and X-ray Diffraction Studies$

Oxidation of Sn Thin Films to SnO2. Micro-Raman Mapping and X-ray Diffraction Studies

The oxidation of tin layers deposited onto alumina substrates is investigated with the aim to identify the different steps of the process and obtain information on the sample homogeneity, phase segregation, and degree of oxidation. It is shown that at least three phases coexist at 450 °C, Sn, SnO, a...

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Veröffentlicht in:	Journal of materials research 1998-09, Vol.13 (9), p.2457-2460
Hauptverfasser:	Sangaletti, Luigi, Depero, Laura E., Allieri, Brigida, Pioselli, Francesca, Comini, Elisabetta, Sberveglieri, Giorgio, Zocchi, Marcello
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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