Thickness and volume dependence of dielectric strength in advanced nanodielectric materials allowing for further size reduction of ultrahigh voltage capacitor prototypes

We have developed a high dielectric, nanocomposite material, MU100, for use in pulsed power applications that include dielectric loaded antennas and ultra-high voltage capacitors. This paper presents the electrical properties of the first full-scale capacitor prototype along with sub-element modules...

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Veröffentlicht in:Review of scientific instruments 2022-06, Vol.93 (6), p.064706-064706
Hauptverfasser: Schulte, E., Curry, R. D., Dickerson, S., Brown, L., Howard, A.
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container_issue 6
container_start_page 064706
container_title Review of scientific instruments
container_volume 93
creator Schulte, E.
Curry, R. D.
Dickerson, S.
Brown, L.
Howard, A.
description We have developed a high dielectric, nanocomposite material, MU100, for use in pulsed power applications that include dielectric loaded antennas and ultra-high voltage capacitors. This paper presents the electrical properties of the first full-scale capacitor prototype along with sub-element modules. Additionally, refinements in the development process have sparked interest in a third-generation capacitor that would use similar dimensions as the initial small-scale samples that recorded breakdown fields of 225 kV/cm on average with peak breakdown fields of 328 kV/cm. The dielectric constant of these large-scale capacitors was 160. These capacitor prototypes have demonstrated voltage hold off of 500 kV. Similarly, thin samples that operated at 35–40 kV had lifetimes without failure in excess of 800 000 discharges at 80% of their maximum rated field strength.
doi_str_mv 10.1063/5.0069682
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fullrecord <record><control><sourceid>proquest_scita</sourceid><recordid>TN_cdi_proquest_miscellaneous_2684104657</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2684104657</sourcerecordid><originalsourceid>FETCH-LOGICAL-c355t-c2b54472f1542d0753ac334e975533630811b1edd1ddaa0e7aed0bc26916da143</originalsourceid><addsrcrecordid>eNqd0c1q3DAQB3BREugm6aFvIOglKTiRrA_bxxDSDwj0kpzNrDReK_VKriRv2b5R37JaNtDSY3SZy2_-I2kIec_ZNWda3KhrxnSn2_oNWXHWdlWja3FCVowJWelGtm_JWUrPrBzF-Yr8fhyd-e4xJQre0l2Yli1SizN6i94gDQO1Dic0OTpDU47oN3mkzlOwOyjCUg8-_GO2kDE6mEriNIWfzm_oECIdlphHjDS5X0gj2sVkF_whf5lyhNFtxsP4DBukBmYwLpeuOYYc8n7GdEFOhxKK717qOXn6dP9496V6-Pb5693tQ2WEUrky9VpJ2dQDV7K2rFECjBASu0YpIbRgLedrjtZyawEYNoCWrU2tO64tcCnOyeUxt4z-sWDK_dYlg9MEHsOS-lq3kjOpVVPoh__oc1iiL7crqukkb0XXFnV1VCaGlCIO_RzdFuK-56w_LK1X_cvSiv14tKk8Hw4f9Dq8C_Ev7Gc7iD_4Eamg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2679418398</pqid></control><display><type>article</type><title>Thickness and volume dependence of dielectric strength in advanced nanodielectric materials allowing for further size reduction of ultrahigh voltage capacitor prototypes</title><source>AIP Journals Complete</source><source>Alma/SFX Local Collection</source><creator>Schulte, E. ; Curry, R. D. ; Dickerson, S. ; Brown, L. ; Howard, A.</creator><creatorcontrib>Schulte, E. ; Curry, R. D. ; Dickerson, S. ; Brown, L. ; Howard, A.</creatorcontrib><description>We have developed a high dielectric, nanocomposite material, MU100, for use in pulsed power applications that include dielectric loaded antennas and ultra-high voltage capacitors. This paper presents the electrical properties of the first full-scale capacitor prototype along with sub-element modules. Additionally, refinements in the development process have sparked interest in a third-generation capacitor that would use similar dimensions as the initial small-scale samples that recorded breakdown fields of 225 kV/cm on average with peak breakdown fields of 328 kV/cm. The dielectric constant of these large-scale capacitors was 160. These capacitor prototypes have demonstrated voltage hold off of 500 kV. Similarly, thin samples that operated at 35–40 kV had lifetimes without failure in excess of 800 000 discharges at 80% of their maximum rated field strength.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/5.0069682</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Breakdown ; Capacitors ; Dielectric strength ; Electrical properties ; Field strength ; Nanocomposites ; Prototypes ; Scientific apparatus &amp; instruments</subject><ispartof>Review of scientific instruments, 2022-06, Vol.93 (6), p.064706-064706</ispartof><rights>Author(s)</rights><rights>2022 Author(s). Published under an exclusive license by AIP Publishing.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c355t-c2b54472f1542d0753ac334e975533630811b1edd1ddaa0e7aed0bc26916da143</cites><orcidid>0000-0001-8329-9543 ; 0000-0002-8834-2608</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/5.0069682$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,776,780,790,4498,27901,27902,76353</link.rule.ids></links><search><creatorcontrib>Schulte, E.</creatorcontrib><creatorcontrib>Curry, R. D.</creatorcontrib><creatorcontrib>Dickerson, S.</creatorcontrib><creatorcontrib>Brown, L.</creatorcontrib><creatorcontrib>Howard, A.</creatorcontrib><title>Thickness and volume dependence of dielectric strength in advanced nanodielectric materials allowing for further size reduction of ultrahigh voltage capacitor prototypes</title><title>Review of scientific instruments</title><description>We have developed a high dielectric, nanocomposite material, MU100, for use in pulsed power applications that include dielectric loaded antennas and ultra-high voltage capacitors. This paper presents the electrical properties of the first full-scale capacitor prototype along with sub-element modules. Additionally, refinements in the development process have sparked interest in a third-generation capacitor that would use similar dimensions as the initial small-scale samples that recorded breakdown fields of 225 kV/cm on average with peak breakdown fields of 328 kV/cm. The dielectric constant of these large-scale capacitors was 160. These capacitor prototypes have demonstrated voltage hold off of 500 kV. Similarly, thin samples that operated at 35–40 kV had lifetimes without failure in excess of 800 000 discharges at 80% of their maximum rated field strength.</description><subject>Breakdown</subject><subject>Capacitors</subject><subject>Dielectric strength</subject><subject>Electrical properties</subject><subject>Field strength</subject><subject>Nanocomposites</subject><subject>Prototypes</subject><subject>Scientific apparatus &amp; instruments</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNqd0c1q3DAQB3BREugm6aFvIOglKTiRrA_bxxDSDwj0kpzNrDReK_VKriRv2b5R37JaNtDSY3SZy2_-I2kIec_ZNWda3KhrxnSn2_oNWXHWdlWja3FCVowJWelGtm_JWUrPrBzF-Yr8fhyd-e4xJQre0l2Yli1SizN6i94gDQO1Dic0OTpDU47oN3mkzlOwOyjCUg8-_GO2kDE6mEriNIWfzm_oECIdlphHjDS5X0gj2sVkF_whf5lyhNFtxsP4DBukBmYwLpeuOYYc8n7GdEFOhxKK717qOXn6dP9496V6-Pb5693tQ2WEUrky9VpJ2dQDV7K2rFECjBASu0YpIbRgLedrjtZyawEYNoCWrU2tO64tcCnOyeUxt4z-sWDK_dYlg9MEHsOS-lq3kjOpVVPoh__oc1iiL7crqukkb0XXFnV1VCaGlCIO_RzdFuK-56w_LK1X_cvSiv14tKk8Hw4f9Dq8C_Ev7Gc7iD_4Eamg</recordid><startdate>20220601</startdate><enddate>20220601</enddate><creator>Schulte, E.</creator><creator>Curry, R. D.</creator><creator>Dickerson, S.</creator><creator>Brown, L.</creator><creator>Howard, A.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0001-8329-9543</orcidid><orcidid>https://orcid.org/0000-0002-8834-2608</orcidid></search><sort><creationdate>20220601</creationdate><title>Thickness and volume dependence of dielectric strength in advanced nanodielectric materials allowing for further size reduction of ultrahigh voltage capacitor prototypes</title><author>Schulte, E. ; Curry, R. D. ; Dickerson, S. ; Brown, L. ; Howard, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c355t-c2b54472f1542d0753ac334e975533630811b1edd1ddaa0e7aed0bc26916da143</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Breakdown</topic><topic>Capacitors</topic><topic>Dielectric strength</topic><topic>Electrical properties</topic><topic>Field strength</topic><topic>Nanocomposites</topic><topic>Prototypes</topic><topic>Scientific apparatus &amp; instruments</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Schulte, E.</creatorcontrib><creatorcontrib>Curry, R. D.</creatorcontrib><creatorcontrib>Dickerson, S.</creatorcontrib><creatorcontrib>Brown, L.</creatorcontrib><creatorcontrib>Howard, A.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Schulte, E.</au><au>Curry, R. D.</au><au>Dickerson, S.</au><au>Brown, L.</au><au>Howard, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Thickness and volume dependence of dielectric strength in advanced nanodielectric materials allowing for further size reduction of ultrahigh voltage capacitor prototypes</atitle><jtitle>Review of scientific instruments</jtitle><date>2022-06-01</date><risdate>2022</risdate><volume>93</volume><issue>6</issue><spage>064706</spage><epage>064706</epage><pages>064706-064706</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>We have developed a high dielectric, nanocomposite material, MU100, for use in pulsed power applications that include dielectric loaded antennas and ultra-high voltage capacitors. This paper presents the electrical properties of the first full-scale capacitor prototype along with sub-element modules. Additionally, refinements in the development process have sparked interest in a third-generation capacitor that would use similar dimensions as the initial small-scale samples that recorded breakdown fields of 225 kV/cm on average with peak breakdown fields of 328 kV/cm. The dielectric constant of these large-scale capacitors was 160. These capacitor prototypes have demonstrated voltage hold off of 500 kV. Similarly, thin samples that operated at 35–40 kV had lifetimes without failure in excess of 800 000 discharges at 80% of their maximum rated field strength.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/5.0069682</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0001-8329-9543</orcidid><orcidid>https://orcid.org/0000-0002-8834-2608</orcidid><oa>free_for_read</oa></addata></record>
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source AIP Journals Complete; Alma/SFX Local Collection
subjects Breakdown
Capacitors
Dielectric strength
Electrical properties
Field strength
Nanocomposites
Prototypes
Scientific apparatus & instruments
title Thickness and volume dependence of dielectric strength in advanced nanodielectric materials allowing for further size reduction of ultrahigh voltage capacitor prototypes
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-21T19%3A54%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_scita&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Thickness%20and%20volume%20dependence%20of%20dielectric%20strength%20in%20advanced%20nanodielectric%20materials%20allowing%20for%20further%20size%20reduction%20of%20ultrahigh%20voltage%20capacitor%20prototypes&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Schulte,%20E.&rft.date=2022-06-01&rft.volume=93&rft.issue=6&rft.spage=064706&rft.epage=064706&rft.pages=064706-064706&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/5.0069682&rft_dat=%3Cproquest_scita%3E2684104657%3C/proquest_scita%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2679418398&rft_id=info:pmid/&rfr_iscdi=true