The influence of crystallization route on the Bi4Ti3O12 thin films by chemical solution deposition technique

It is demonstrated that the crystallisation route influences greatly the film microstructure and its electrical properties. The six-layered films obtained by the intermediate crystallised layer route present better insulating properties, a higher coercive field, a lower dielectric constant and lower...

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Veröffentlicht in:Materials letters 2001-11, Vol.51 (3), p.240-244
Hauptverfasser: XIAO, Zhuo-Bing, WU, Xian-Ming, HONG WANG, ZHUO WANG, SHAN, Shu-Xia, MIN WANG
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container_issue 3
container_start_page 240
container_title Materials letters
container_volume 51
creator XIAO, Zhuo-Bing
WU, Xian-Ming
HONG WANG
ZHUO WANG
SHAN, Shu-Xia
MIN WANG
description It is demonstrated that the crystallisation route influences greatly the film microstructure and its electrical properties. The six-layered films obtained by the intermediate crystallised layer route present better insulating properties, a higher coercive field, a lower dielectric constant and lower remanent polarisation than for the films made from the intermediate amorphous layer route. 9 refs.
doi_str_mv 10.1016/S0167-577X(01)00297-X
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subjects Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science
rheology
Dielectric, piezoelectric, ferroelectric and antiferroelectric materials
Dielectrics, piezoelectrics, and ferroelectrics and their properties
Exact sciences and technology
Liquid phase epitaxy
deposition from liquid phases (melts, solutions, and surface layers on liquids)
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Niobates, titanates, tantalates, pzt ceramics, etc
Physics
title The influence of crystallization route on the Bi4Ti3O12 thin films by chemical solution deposition technique
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