The influence of crystallization route on the Bi4Ti3O12 thin films by chemical solution deposition technique

It is demonstrated that the crystallisation route influences greatly the film microstructure and its electrical properties. The six-layered films obtained by the intermediate crystallised layer route present better insulating properties, a higher coercive field, a lower dielectric constant and lower...

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Veröffentlicht in:	Materials letters 2001-11, Vol.51 (3), p.240-244
Hauptverfasser:	XIAO, Zhuo-Bing, WU, Xian-Ming, HONG WANG, ZHUO WANG, SHAN, Shu-Xia, MIN WANG
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Dielectric, piezoelectric, ferroelectric and antiferroelectric materials Dielectrics, piezoelectrics, and ferroelectrics and their properties Exact sciences and technology Liquid phase epitaxy deposition from liquid phases (melts, solutions, and surface layers on liquids) Materials science Methods of deposition of films and coatings film growth and epitaxy Niobates, titanates, tantalates, pzt ceramics, etc Physics
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Zusammenfassung:	It is demonstrated that the crystallisation route influences greatly the film microstructure and its electrical properties. The six-layered films obtained by the intermediate crystallised layer route present better insulating properties, a higher coercive field, a lower dielectric constant and lower remanent polarisation than for the films made from the intermediate amorphous layer route. 9 refs.
ISSN:	0167-577X 1873-4979
DOI:	10.1016/S0167-577X(01)00297-X