Microstructure of polycrystalline Ti and its microelectrochemical properties by means of electron-backscattering diffraction (EBSD)
The electrochemical behaviour of polycrystalline materials is determined usually by grain orientations. The correlation between crystallographic orientation and electrochemical behaviour is examined on titanium as example by combining microelectrochemical techniques with orientation measurements car...
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| Veröffentlicht in: | Electrochimica acta 2001-09, Vol.47 (1), p.149-160 |
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| creator | König, U Davepon, B |
| description | The electrochemical behaviour of polycrystalline materials is determined usually by grain orientations. The correlation between crystallographic orientation and electrochemical behaviour is examined on titanium as example by combining microelectrochemical techniques with orientation measurements carried out with electron-backscattering diffraction (EBSD). The results will be compared with former experiments in which crystallographic data were analysed with anisotropy microellipsometry (AME). Whereas AME is only capable to determine a single Euler angle
Φ, EBSD analysis reveals all three Euler angles. For a clear crystallographic determination of the metal surface on hexagonal titanium, it is sufficient to determine the Euler angles
Φ and
ϕ
2. The angle
ϕ
1 can be neglected. For
Φ |
| doi_str_mv | 10.1016/S0013-4686(01)00572-2 |
| format | Article |
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Φ, EBSD analysis reveals all three Euler angles. For a clear crystallographic determination of the metal surface on hexagonal titanium, it is sufficient to determine the Euler angles
Φ and
ϕ
2. The angle
ϕ
1 can be neglected. For
Φ<45°, the angle
ϕ
2 has an almost negligible influence on the electrochemical behaviour. The oxide layer thickness can be characterised by the analysis of the EBSD pattern quality. Due to the fact that oxide films on different titanium grains show different interference colours, it is possible to correlate interference colours of oxide films formed at
U=15 V with the crystallographic orientation of the underlying grains which have been determined by EBSD orientation mapping. With the help of this orientation/colour correlation, the grain orientations can be estimated quickly with a microscope.</description><identifier>ISSN: 0013-4686</identifier><identifier>EISSN: 1873-3859</identifier><identifier>DOI: 10.1016/S0013-4686(01)00572-2</identifier><identifier>CODEN: ELCAAV</identifier><language>eng</language><publisher>Oxford: Elsevier Ltd</publisher><subject>Anisotropy microellipsometry ; Chemistry ; Cross-disciplinary physics: materials science; rheology ; Electrochemistry ; Electrodes: preparations and properties ; Electron-backscattering diffraction ; Euler angles ; Exact sciences and technology ; General and physical chemistry ; Grain orientation ; Materials science ; Other electrodes ; Other topics in materials science ; Photoresist electrodes ; Physics ; Polycrystalline Ti ; Semiconductor properties of TiO 2</subject><ispartof>Electrochimica acta, 2001-09, Vol.47 (1), p.149-160</ispartof><rights>2001 Elsevier Science Ltd</rights><rights>2002 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c434t-fc8e44a331f275a8dd798b911c616824cfc520136c86ce426b1bccac083817b13</citedby><cites>FETCH-LOGICAL-c434t-fc8e44a331f275a8dd798b911c616824cfc520136c86ce426b1bccac083817b13</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0013468601005722$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,3537,23909,23910,25118,27901,27902,65534</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=14139801$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>König, U</creatorcontrib><creatorcontrib>Davepon, B</creatorcontrib><title>Microstructure of polycrystalline Ti and its microelectrochemical properties by means of electron-backscattering diffraction (EBSD)</title><title>Electrochimica acta</title><description>The electrochemical behaviour of polycrystalline materials is determined usually by grain orientations. The correlation between crystallographic orientation and electrochemical behaviour is examined on titanium as example by combining microelectrochemical techniques with orientation measurements carried out with electron-backscattering diffraction (EBSD). The results will be compared with former experiments in which crystallographic data were analysed with anisotropy microellipsometry (AME). Whereas AME is only capable to determine a single Euler angle
Φ, EBSD analysis reveals all three Euler angles. For a clear crystallographic determination of the metal surface on hexagonal titanium, it is sufficient to determine the Euler angles
Φ and
ϕ
2. The angle
ϕ
1 can be neglected. For
Φ<45°, the angle
ϕ
2 has an almost negligible influence on the electrochemical behaviour. The oxide layer thickness can be characterised by the analysis of the EBSD pattern quality. Due to the fact that oxide films on different titanium grains show different interference colours, it is possible to correlate interference colours of oxide films formed at
U=15 V with the crystallographic orientation of the underlying grains which have been determined by EBSD orientation mapping. With the help of this orientation/colour correlation, the grain orientations can be estimated quickly with a microscope.</description><subject>Anisotropy microellipsometry</subject><subject>Chemistry</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Electrochemistry</subject><subject>Electrodes: preparations and properties</subject><subject>Electron-backscattering diffraction</subject><subject>Euler angles</subject><subject>Exact sciences and technology</subject><subject>General and physical chemistry</subject><subject>Grain orientation</subject><subject>Materials science</subject><subject>Other electrodes</subject><subject>Other topics in materials science</subject><subject>Photoresist electrodes</subject><subject>Physics</subject><subject>Polycrystalline Ti</subject><subject>Semiconductor properties of TiO 2</subject><issn>0013-4686</issn><issn>1873-3859</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNqFkE1v1DAQhi0EEkvpT0DyBdQeQj1xYntPCEqBSkU9tJwtZzIBg9dZbC_SnvnjON0VHDmNRnrm430YewHiNQhQF3dCgGw6ZdSZgHMhet027SO2AqNlI02_fsxWf5Gn7FnO34UQWmmxYr8_e0xzLmmHZZeIzxPfzmGPaZ-LC8FH4veeuzhyXzLfLDAFwpJm_Ea1dYFv07ylVDxlPuz5hlzMy5ojFpvB4Y-MrhRKPn7lo5-m5LD4OfKzq3d378-fsyeTC5lOj_WEfflwdX_5qbm5_Xh9-famwU52pZnQUNc5KWFqde_MOOq1GdYAqECZtsMJ-7bGVGgUUteqAQZEh8JIA3oAecJeHfbWj3_uKBe78RkpBBdp3mXbKq0NgKlgfwAXNTnRZLfJb1zaWxB2UW4flNvFpxVgH5Tbts69PB5wNXCoMSP6_G-4A7k2YnnkzYGjmvaXp2QzeopIo09Vmh1n_59LfwDif5gY</recordid><startdate>20010901</startdate><enddate>20010901</enddate><creator>König, U</creator><creator>Davepon, B</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20010901</creationdate><title>Microstructure of polycrystalline Ti and its microelectrochemical properties by means of electron-backscattering diffraction (EBSD)</title><author>König, U ; Davepon, B</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c434t-fc8e44a331f275a8dd798b911c616824cfc520136c86ce426b1bccac083817b13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Anisotropy microellipsometry</topic><topic>Chemistry</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Electrochemistry</topic><topic>Electrodes: preparations and properties</topic><topic>Electron-backscattering diffraction</topic><topic>Euler angles</topic><topic>Exact sciences and technology</topic><topic>General and physical chemistry</topic><topic>Grain orientation</topic><topic>Materials science</topic><topic>Other electrodes</topic><topic>Other topics in materials science</topic><topic>Photoresist electrodes</topic><topic>Physics</topic><topic>Polycrystalline Ti</topic><topic>Semiconductor properties of TiO 2</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>König, U</creatorcontrib><creatorcontrib>Davepon, B</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Electrochimica acta</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>König, U</au><au>Davepon, B</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Microstructure of polycrystalline Ti and its microelectrochemical properties by means of electron-backscattering diffraction (EBSD)</atitle><jtitle>Electrochimica acta</jtitle><date>2001-09-01</date><risdate>2001</risdate><volume>47</volume><issue>1</issue><spage>149</spage><epage>160</epage><pages>149-160</pages><issn>0013-4686</issn><eissn>1873-3859</eissn><coden>ELCAAV</coden><abstract>The electrochemical behaviour of polycrystalline materials is determined usually by grain orientations. The correlation between crystallographic orientation and electrochemical behaviour is examined on titanium as example by combining microelectrochemical techniques with orientation measurements carried out with electron-backscattering diffraction (EBSD). The results will be compared with former experiments in which crystallographic data were analysed with anisotropy microellipsometry (AME). Whereas AME is only capable to determine a single Euler angle
Φ, EBSD analysis reveals all three Euler angles. For a clear crystallographic determination of the metal surface on hexagonal titanium, it is sufficient to determine the Euler angles
Φ and
ϕ
2. The angle
ϕ
1 can be neglected. For
Φ<45°, the angle
ϕ
2 has an almost negligible influence on the electrochemical behaviour. The oxide layer thickness can be characterised by the analysis of the EBSD pattern quality. Due to the fact that oxide films on different titanium grains show different interference colours, it is possible to correlate interference colours of oxide films formed at
U=15 V with the crystallographic orientation of the underlying grains which have been determined by EBSD orientation mapping. With the help of this orientation/colour correlation, the grain orientations can be estimated quickly with a microscope.</abstract><cop>Oxford</cop><pub>Elsevier Ltd</pub><doi>10.1016/S0013-4686(01)00572-2</doi><tpages>12</tpages></addata></record> |
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| source | Elsevier ScienceDirect Journals |
| subjects | Anisotropy microellipsometry Chemistry Cross-disciplinary physics: materials science rheology Electrochemistry Electrodes: preparations and properties Electron-backscattering diffraction Euler angles Exact sciences and technology General and physical chemistry Grain orientation Materials science Other electrodes Other topics in materials science Photoresist electrodes Physics Polycrystalline Ti Semiconductor properties of TiO 2 |
| title | Microstructure of polycrystalline Ti and its microelectrochemical properties by means of electron-backscattering diffraction (EBSD) |
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