High-voltage, double-gate devices on silicon-on-insulator
This paper reviews several silicon-on-insulator power technologies, and compares them to those of bulk silicon and wide band-gap material. The concept of double-gate for thin-film SOI power devices is brought into historical context. Several criteria for the proper choice of technology are discussed...
Gespeichert in:
Veröffentlicht in: | Microelectronic engineering 2001-11, Vol.59 (1), p.461-468 |
---|---|
1. Verfasser: | |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 468 |
---|---|
container_issue | 1 |
container_start_page | 461 |
container_title | Microelectronic engineering |
container_volume | 59 |
creator | Zingg, René P |
description | This paper reviews several silicon-on-insulator power technologies, and compares them to those of bulk silicon and wide band-gap material. The concept of double-gate for thin-film SOI power devices is brought into historical context. Several criteria for the proper choice of technology are discussed, and typical applications presented. Some aspects on the implementation of novel technology are reviewed, and an outlook on discrete power semiconductors and power integrated circuits given. |
doi_str_mv | 10.1016/S0167-9317(01)00644-X |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_26770955</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S016793170100644X</els_id><sourcerecordid>26770955</sourcerecordid><originalsourceid>FETCH-LOGICAL-c368t-632ca73c48e0569fbf7bd1961e15a9ee120a09240efb355b2064eae0165516953</originalsourceid><addsrcrecordid>eNqFkE1LxDAQhoMouK7-BKEXRcFo0jRpcxJZ_IIFDyrsLaTpdI1kmzVpF_z3Zj_QozDMMPDMvDMvQqeUXFNCxc1rSiWWjJYXhF4SIooCz_bQiFYlw5yLah-NfpFDdBTjJ0l9QaoRkk92_oFX3vV6DldZ44faAZ7rHrIGVtZAzHyXReus8R1OYbs4ON37cIwOWu0inOzqGL0_3L9NnvD05fF5cjfFhomqx4LlRpfMFBUQLmRbt2XdUCkoUK4lAM2JJjIvCLQ147zO0_mgId3HORWSszE63-5dBv81QOzVwkYDzukO_BBVLsqSSL4G-RY0wccYoFXLYBc6fCtK1NootTFKrV1QhKqNUWqW5s52Ajoa7dqgO2Pj33BBc0HzKnG3Ww7StysLQUVjoTPQ2ACmV423_yj9ADF-e7A</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>26770955</pqid></control><display><type>article</type><title>High-voltage, double-gate devices on silicon-on-insulator</title><source>Elsevier ScienceDirect Journals</source><creator>Zingg, René P</creator><creatorcontrib>Zingg, René P</creatorcontrib><description>This paper reviews several silicon-on-insulator power technologies, and compares them to those of bulk silicon and wide band-gap material. The concept of double-gate for thin-film SOI power devices is brought into historical context. Several criteria for the proper choice of technology are discussed, and typical applications presented. Some aspects on the implementation of novel technology are reviewed, and an outlook on discrete power semiconductors and power integrated circuits given.</description><identifier>ISSN: 0167-9317</identifier><identifier>EISSN: 1873-5568</identifier><identifier>DOI: 10.1016/S0167-9317(01)00644-X</identifier><identifier>CODEN: MIENEF</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Applied sciences ; DMOS ; Electronics ; Exact sciences and technology ; High voltage ; Other multijunction devices. Power transistors. Thyristors ; RESURF ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Silicon limit ; SOI ; Specific on-resistance ; Super-junctions</subject><ispartof>Microelectronic engineering, 2001-11, Vol.59 (1), p.461-468</ispartof><rights>2001 Elsevier Science B.V.</rights><rights>2002 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c368t-632ca73c48e0569fbf7bd1961e15a9ee120a09240efb355b2064eae0165516953</citedby><cites>FETCH-LOGICAL-c368t-632ca73c48e0569fbf7bd1961e15a9ee120a09240efb355b2064eae0165516953</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S016793170100644X$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,3536,23910,23911,25119,27903,27904,65309</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=14126128$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Zingg, René P</creatorcontrib><title>High-voltage, double-gate devices on silicon-on-insulator</title><title>Microelectronic engineering</title><description>This paper reviews several silicon-on-insulator power technologies, and compares them to those of bulk silicon and wide band-gap material. The concept of double-gate for thin-film SOI power devices is brought into historical context. Several criteria for the proper choice of technology are discussed, and typical applications presented. Some aspects on the implementation of novel technology are reviewed, and an outlook on discrete power semiconductors and power integrated circuits given.</description><subject>Applied sciences</subject><subject>DMOS</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>High voltage</subject><subject>Other multijunction devices. Power transistors. Thyristors</subject><subject>RESURF</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Silicon limit</subject><subject>SOI</subject><subject>Specific on-resistance</subject><subject>Super-junctions</subject><issn>0167-9317</issn><issn>1873-5568</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNqFkE1LxDAQhoMouK7-BKEXRcFo0jRpcxJZ_IIFDyrsLaTpdI1kmzVpF_z3Zj_QozDMMPDMvDMvQqeUXFNCxc1rSiWWjJYXhF4SIooCz_bQiFYlw5yLah-NfpFDdBTjJ0l9QaoRkk92_oFX3vV6DldZ44faAZ7rHrIGVtZAzHyXReus8R1OYbs4ON37cIwOWu0inOzqGL0_3L9NnvD05fF5cjfFhomqx4LlRpfMFBUQLmRbt2XdUCkoUK4lAM2JJjIvCLQ147zO0_mgId3HORWSszE63-5dBv81QOzVwkYDzukO_BBVLsqSSL4G-RY0wccYoFXLYBc6fCtK1NootTFKrV1QhKqNUWqW5s52Ajoa7dqgO2Pj33BBc0HzKnG3Ww7StysLQUVjoTPQ2ACmV423_yj9ADF-e7A</recordid><startdate>20011101</startdate><enddate>20011101</enddate><creator>Zingg, René P</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20011101</creationdate><title>High-voltage, double-gate devices on silicon-on-insulator</title><author>Zingg, René P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c368t-632ca73c48e0569fbf7bd1961e15a9ee120a09240efb355b2064eae0165516953</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Applied sciences</topic><topic>DMOS</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>High voltage</topic><topic>Other multijunction devices. Power transistors. Thyristors</topic><topic>RESURF</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Silicon limit</topic><topic>SOI</topic><topic>Specific on-resistance</topic><topic>Super-junctions</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zingg, René P</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microelectronic engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zingg, René P</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High-voltage, double-gate devices on silicon-on-insulator</atitle><jtitle>Microelectronic engineering</jtitle><date>2001-11-01</date><risdate>2001</risdate><volume>59</volume><issue>1</issue><spage>461</spage><epage>468</epage><pages>461-468</pages><issn>0167-9317</issn><eissn>1873-5568</eissn><coden>MIENEF</coden><abstract>This paper reviews several silicon-on-insulator power technologies, and compares them to those of bulk silicon and wide band-gap material. The concept of double-gate for thin-film SOI power devices is brought into historical context. Several criteria for the proper choice of technology are discussed, and typical applications presented. Some aspects on the implementation of novel technology are reviewed, and an outlook on discrete power semiconductors and power integrated circuits given.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/S0167-9317(01)00644-X</doi><tpages>8</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0167-9317 |
ispartof | Microelectronic engineering, 2001-11, Vol.59 (1), p.461-468 |
issn | 0167-9317 1873-5568 |
language | eng |
recordid | cdi_proquest_miscellaneous_26770955 |
source | Elsevier ScienceDirect Journals |
subjects | Applied sciences DMOS Electronics Exact sciences and technology High voltage Other multijunction devices. Power transistors. Thyristors RESURF Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Silicon limit SOI Specific on-resistance Super-junctions |
title | High-voltage, double-gate devices on silicon-on-insulator |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T05%3A10%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=High-voltage,%20double-gate%20devices%20on%20silicon-on-insulator&rft.jtitle=Microelectronic%20engineering&rft.au=Zingg,%20Ren%C3%A9%20P&rft.date=2001-11-01&rft.volume=59&rft.issue=1&rft.spage=461&rft.epage=468&rft.pages=461-468&rft.issn=0167-9317&rft.eissn=1873-5568&rft.coden=MIENEF&rft_id=info:doi/10.1016/S0167-9317(01)00644-X&rft_dat=%3Cproquest_cross%3E26770955%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=26770955&rft_id=info:pmid/&rft_els_id=S016793170100644X&rfr_iscdi=true |