Dielectric enhancement and Maxwell-Wagner effects in polycrystalline ferroelectric multilayered thin films
Dielectric enhancement was observed in polycrystalline BaTiO3 /Ba0.6Sr0.4TiO3 multilayered thin films deposited layer-by-layer on Pt/Ti/SiO2/Si substrates via pulsed laser deposition. The dielectric constant of the films was enhanced more than four times with the decrease of the individual layer thi...
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Veröffentlicht in: | Journal of physics. D, Applied physics Applied physics, 2001-10, Vol.34 (19), p.2935-2938 |
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container_title | Journal of physics. D, Applied physics |
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creator | Shen, Mingrong Ge, Shuibing Cao, Wenwu |
description | Dielectric enhancement was observed in polycrystalline BaTiO3 /Ba0.6Sr0.4TiO3 multilayered thin films deposited layer-by-layer on Pt/Ti/SiO2/Si substrates via pulsed laser deposition. The dielectric constant of the films was enhanced more than four times with the decrease of the individual layer thickness down to 30 nm, while the dielectric loss was kept at a low level comparable to that of the solid solution Ba0.8Sr0.2TiO3 thin films. The Maxwell-Wagner model is proposed to explain the experimental data, which can predict both the dielectric enhancement and frequency dependence when the individual layer thickness is more than 40 nm. (Author) |
doi_str_mv | 10.1088/0022-3727/34/19/301 |
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The dielectric constant of the films was enhanced more than four times with the decrease of the individual layer thickness down to 30 nm, while the dielectric loss was kept at a low level comparable to that of the solid solution Ba0.8Sr0.2TiO3 thin films. The Maxwell-Wagner model is proposed to explain the experimental data, which can predict both the dielectric enhancement and frequency dependence when the individual layer thickness is more than 40 nm. 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D, Applied physics</title><description>Dielectric enhancement was observed in polycrystalline BaTiO3 /Ba0.6Sr0.4TiO3 multilayered thin films deposited layer-by-layer on Pt/Ti/SiO2/Si substrates via pulsed laser deposition. The dielectric constant of the films was enhanced more than four times with the decrease of the individual layer thickness down to 30 nm, while the dielectric loss was kept at a low level comparable to that of the solid solution Ba0.8Sr0.2TiO3 thin films. The Maxwell-Wagner model is proposed to explain the experimental data, which can predict both the dielectric enhancement and frequency dependence when the individual layer thickness is more than 40 nm. (Author)</description><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Dielectric properties of solids and liquids</subject><subject>Dielectric thin films</subject><subject>Dielectric, piezoelectric, ferroelectric and antiferroelectric materials</subject><subject>Dielectrics, piezoelectrics, and ferroelectrics and their properties</subject><subject>Exact sciences and technology</subject><subject>Niobates, titanates, tantalates, pzt ceramics, etc</subject><subject>Permittivity (dielectric function)</subject><subject>Physics</subject><issn>0022-3727</issn><issn>1361-6463</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LxDAQhoMouK7-Ai89iAeh26Rp0-Yo6yeseFE8hjSduFnSD5Mu2n9vll3Wg-JpBuaZl5kHoXOCZwSXZYJxmsa0SIuEZgnhCcXkAE0IZSRmGaOHaLInjtGJ9yuMcc5KMkGrGwMW1OCMiqBdylZBA-0QybaOnuTXJ1gbv8n3FlwEWgfQR6aN-s6Oyo1-kNaaFiINznX7nGZtB2PlCA7qaFgGXhvb-FN0pKX1cLarU_R6d_syf4gXz_eP8-tFrGhJhlgyrTCnOM3rqmJZKnXowr2Z5AorWXBOOQfKpcoLltE811WteVHUlYJMUaBTdLnN7V33sQY_iMZ4FR6RLXRrL1LGOMM5DyDdgsp13jvQonemkW4UBIuNV7GxJjbWBM0E4SJ4DVsXu3jplbTaBWfG_6wSmheUBexqi5mu3w__yBN9rQM8-w3_d8Q31VmVIQ</recordid><startdate>20011007</startdate><enddate>20011007</enddate><creator>Shen, Mingrong</creator><creator>Ge, Shuibing</creator><creator>Cao, Wenwu</creator><general>IOP Publishing</general><general>Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20011007</creationdate><title>Dielectric enhancement and Maxwell-Wagner effects in polycrystalline ferroelectric multilayered thin films</title><author>Shen, Mingrong ; Ge, Shuibing ; Cao, Wenwu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c381t-a6fc093025dbb642af25d0004a9c0ca799399e39ac5764355fbdf977dbce4c3e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Dielectric properties of solids and liquids</topic><topic>Dielectric thin films</topic><topic>Dielectric, piezoelectric, ferroelectric and antiferroelectric materials</topic><topic>Dielectrics, piezoelectrics, and ferroelectrics and their properties</topic><topic>Exact sciences and technology</topic><topic>Niobates, titanates, tantalates, pzt ceramics, etc</topic><topic>Permittivity (dielectric function)</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shen, Mingrong</creatorcontrib><creatorcontrib>Ge, Shuibing</creatorcontrib><creatorcontrib>Cao, Wenwu</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of physics. D, Applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shen, Mingrong</au><au>Ge, Shuibing</au><au>Cao, Wenwu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dielectric enhancement and Maxwell-Wagner effects in polycrystalline ferroelectric multilayered thin films</atitle><jtitle>Journal of physics. D, Applied physics</jtitle><date>2001-10-07</date><risdate>2001</risdate><volume>34</volume><issue>19</issue><spage>2935</spage><epage>2938</epage><pages>2935-2938</pages><issn>0022-3727</issn><eissn>1361-6463</eissn><coden>JPAPBE</coden><abstract>Dielectric enhancement was observed in polycrystalline BaTiO3 /Ba0.6Sr0.4TiO3 multilayered thin films deposited layer-by-layer on Pt/Ti/SiO2/Si substrates via pulsed laser deposition. 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subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectric properties of solids and liquids Dielectric thin films Dielectric, piezoelectric, ferroelectric and antiferroelectric materials Dielectrics, piezoelectrics, and ferroelectrics and their properties Exact sciences and technology Niobates, titanates, tantalates, pzt ceramics, etc Permittivity (dielectric function) Physics |
title | Dielectric enhancement and Maxwell-Wagner effects in polycrystalline ferroelectric multilayered thin films |
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