Copper phthalocyanine-titanium oxide multilayers
Copper phthalocyanine-titanium oxide (CuPc-TiOx) heteromultilayers have been fabricated by evaporation and reactive evaporation techniques, and their structural and optoelectronic properties investigated. X-ray diffraction and secondary ion mass spectroscopy confirm the formation of a clear alternat...
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| Veröffentlicht in: | Journal of applied physics 1994-04, Vol.75 (8), p.4055-4059 |
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| container_issue | 8 |
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| container_title | Journal of applied physics |
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| creator | Takada, J. Awaji, H. Koshioka, M. Nevin, W. A. Imanishi, M. Fukada, N. |
| description | Copper phthalocyanine-titanium oxide (CuPc-TiOx) heteromultilayers have been fabricated by evaporation and reactive evaporation techniques, and their structural and optoelectronic properties investigated. X-ray diffraction and secondary ion mass spectroscopy confirm the formation of a clear alternating layered structure on a nanometer scale. An interface roughness of 7 Å has been achieved for a multilayer with an artificial period of 40 Å. Atomic force microscopy at scratched edges of the multilayers reveal double-layered structures of TiOx on CuPc, indicating the existence of two kinds of interface. Transverse photoconduction measurements on samples deposited on SnO2-coated glass, using a back electrode of Al, show the occurrence of electron transfer from CuPc to TiOx at the interfaces. |
| doi_str_mv | 10.1063/1.356029 |
| format | Article |
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A. ; Imanishi, M. ; Fukada, N.</creator><creatorcontrib>Takada, J. ; Awaji, H. ; Koshioka, M. ; Nevin, W. A. ; Imanishi, M. ; Fukada, N.</creatorcontrib><description>Copper phthalocyanine-titanium oxide (CuPc-TiOx) heteromultilayers have been fabricated by evaporation and reactive evaporation techniques, and their structural and optoelectronic properties investigated. X-ray diffraction and secondary ion mass spectroscopy confirm the formation of a clear alternating layered structure on a nanometer scale. An interface roughness of 7 Å has been achieved for a multilayer with an artificial period of 40 Å. Atomic force microscopy at scratched edges of the multilayers reveal double-layered structures of TiOx on CuPc, indicating the existence of two kinds of interface. Transverse photoconduction measurements on samples deposited on SnO2-coated glass, using a back electrode of Al, show the occurrence of electron transfer from CuPc to TiOx at the interfaces.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.356029</identifier><language>eng</language><ispartof>Journal of applied physics, 1994-04, Vol.75 (8), p.4055-4059</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c322t-a00f4df4b0c21ee4a1f003098e0a93a06bd9f49bd1eae642ce5db6322b85d3a83</citedby><cites>FETCH-LOGICAL-c322t-a00f4df4b0c21ee4a1f003098e0a93a06bd9f49bd1eae642ce5db6322b85d3a83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Takada, J.</creatorcontrib><creatorcontrib>Awaji, H.</creatorcontrib><creatorcontrib>Koshioka, M.</creatorcontrib><creatorcontrib>Nevin, W. 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Atomic force microscopy at scratched edges of the multilayers reveal double-layered structures of TiOx on CuPc, indicating the existence of two kinds of interface. Transverse photoconduction measurements on samples deposited on SnO2-coated glass, using a back electrode of Al, show the occurrence of electron transfer from CuPc to TiOx at the interfaces.</abstract><doi>10.1063/1.356029</doi><tpages>5</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0021-8979 |
| ispartof | Journal of applied physics, 1994-04, Vol.75 (8), p.4055-4059 |
| issn | 0021-8979 1089-7550 |
| language | eng |
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| source | AIP Digital Archive |
| title | Copper phthalocyanine-titanium oxide multilayers |
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