Reliability estimation and tolerance limits for Laplace distribution based on censored samples
In this paper, we first present an estimator for the reliability function based on the best linear unbiased estimators (BLUEs) of the location and scale parameters, μ and σ, for the Laplace distribution based on Type-II censored samples. We show that this estimator is almost unbiased at varying leve...
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Veröffentlicht in: | Microelectronics and reliability 1996, Vol.36 (3), p.375-378 |
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creator | Balakrishnan, N. Chandramouleeswaran, M.P. |
description | In this paper, we first present an estimator for the reliability function based on the best linear unbiased estimators (BLUEs) of the location and scale parameters, μ and σ, for the Laplace distribution based on Type-II censored samples. We show that this estimator is almost unbiased at varying levels of reliability. Next, we determine through Monte Carlo simulations the values of the tolerance factor
t
γ
that are necessary for the construction of lower and upper tolerance limits for the distribution. We also illustrate how these tables for tolerance limits could be used to determine lower confidence limits for the reliability. Finally, we present an example to illustrate the methods of inference developed in this paper. |
doi_str_mv | 10.1016/0026-2714(95)00073-9 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_26349138</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>0026271495000739</els_id><sourcerecordid>26349138</sourcerecordid><originalsourceid>FETCH-LOGICAL-c335t-32068d776f044f4ba6f18f2f8cf9ad10dfa9901c418716817351436c7acd5c53</originalsourceid><addsrcrecordid>eNp9kMtKBDEQRYMoOI7-gYteiS5aU510urMRZPAFA4LMwpUhnQdE0g-TjODfm54Rl66qKM4tuAehc8DXgIHdYFyxsmqAXvL6CmPckJIfoAW0TVVyCm-HaPGHHKOTGD9mCAMs0Pur8U52zrv0XZiYXC-TG4dCDrpIozdBDsoU3vUuxcKOoVjLyct80i6m4Lrtju5kNLrIizJDHEPeo-wnb-IpOrLSR3P2O5do83C_WT2V65fH59XdulSE1KkkFWatbhpmMaWWdpJZaG1lW2W51IC1lZxjUDRXAtZCQ2qghKlGKl2rmizRxf7tFMbPba4heheV8V4OZtxGUTFCOZA2g3QPqjDGGIwVU8iVw7cALGaXYhYlZlGC12LnUvAcu93HTO7w5UwQUTmTzWgXjEpCj-7_Bz_7Fnwa</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>26349138</pqid></control><display><type>article</type><title>Reliability estimation and tolerance limits for Laplace distribution based on censored samples</title><source>Elsevier ScienceDirect Journals Complete</source><creator>Balakrishnan, N. ; Chandramouleeswaran, M.P.</creator><creatorcontrib>Balakrishnan, N. ; Chandramouleeswaran, M.P.</creatorcontrib><description>In this paper, we first present an estimator for the reliability function based on the best linear unbiased estimators (BLUEs) of the location and scale parameters, μ and σ, for the Laplace distribution based on Type-II censored samples. We show that this estimator is almost unbiased at varying levels of reliability. Next, we determine through Monte Carlo simulations the values of the tolerance factor
t
γ
that are necessary for the construction of lower and upper tolerance limits for the distribution. We also illustrate how these tables for tolerance limits could be used to determine lower confidence limits for the reliability. Finally, we present an example to illustrate the methods of inference developed in this paper.</description><identifier>ISSN: 0026-2714</identifier><identifier>EISSN: 1872-941X</identifier><identifier>DOI: 10.1016/0026-2714(95)00073-9</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><ispartof>Microelectronics and reliability, 1996, Vol.36 (3), p.375-378</ispartof><rights>1996</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c335t-32068d776f044f4ba6f18f2f8cf9ad10dfa9901c418716817351436c7acd5c53</citedby><cites>FETCH-LOGICAL-c335t-32068d776f044f4ba6f18f2f8cf9ad10dfa9901c418716817351436c7acd5c53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/0026271495000739$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,4010,27900,27901,27902,65306</link.rule.ids></links><search><creatorcontrib>Balakrishnan, N.</creatorcontrib><creatorcontrib>Chandramouleeswaran, M.P.</creatorcontrib><title>Reliability estimation and tolerance limits for Laplace distribution based on censored samples</title><title>Microelectronics and reliability</title><description>In this paper, we first present an estimator for the reliability function based on the best linear unbiased estimators (BLUEs) of the location and scale parameters, μ and σ, for the Laplace distribution based on Type-II censored samples. We show that this estimator is almost unbiased at varying levels of reliability. Next, we determine through Monte Carlo simulations the values of the tolerance factor
t
γ
that are necessary for the construction of lower and upper tolerance limits for the distribution. We also illustrate how these tables for tolerance limits could be used to determine lower confidence limits for the reliability. Finally, we present an example to illustrate the methods of inference developed in this paper.</description><issn>0026-2714</issn><issn>1872-941X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><recordid>eNp9kMtKBDEQRYMoOI7-gYteiS5aU510urMRZPAFA4LMwpUhnQdE0g-TjODfm54Rl66qKM4tuAehc8DXgIHdYFyxsmqAXvL6CmPckJIfoAW0TVVyCm-HaPGHHKOTGD9mCAMs0Pur8U52zrv0XZiYXC-TG4dCDrpIozdBDsoU3vUuxcKOoVjLyct80i6m4Lrtju5kNLrIizJDHEPeo-wnb-IpOrLSR3P2O5do83C_WT2V65fH59XdulSE1KkkFWatbhpmMaWWdpJZaG1lW2W51IC1lZxjUDRXAtZCQ2qghKlGKl2rmizRxf7tFMbPba4heheV8V4OZtxGUTFCOZA2g3QPqjDGGIwVU8iVw7cALGaXYhYlZlGC12LnUvAcu93HTO7w5UwQUTmTzWgXjEpCj-7_Bz_7Fnwa</recordid><startdate>1996</startdate><enddate>1996</enddate><creator>Balakrishnan, N.</creator><creator>Chandramouleeswaran, M.P.</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>1996</creationdate><title>Reliability estimation and tolerance limits for Laplace distribution based on censored samples</title><author>Balakrishnan, N. ; Chandramouleeswaran, M.P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c335t-32068d776f044f4ba6f18f2f8cf9ad10dfa9901c418716817351436c7acd5c53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Balakrishnan, N.</creatorcontrib><creatorcontrib>Chandramouleeswaran, M.P.</creatorcontrib><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>Microelectronics and reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Balakrishnan, N.</au><au>Chandramouleeswaran, M.P.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reliability estimation and tolerance limits for Laplace distribution based on censored samples</atitle><jtitle>Microelectronics and reliability</jtitle><date>1996</date><risdate>1996</risdate><volume>36</volume><issue>3</issue><spage>375</spage><epage>378</epage><pages>375-378</pages><issn>0026-2714</issn><eissn>1872-941X</eissn><abstract>In this paper, we first present an estimator for the reliability function based on the best linear unbiased estimators (BLUEs) of the location and scale parameters, μ and σ, for the Laplace distribution based on Type-II censored samples. We show that this estimator is almost unbiased at varying levels of reliability. Next, we determine through Monte Carlo simulations the values of the tolerance factor
t
γ
that are necessary for the construction of lower and upper tolerance limits for the distribution. We also illustrate how these tables for tolerance limits could be used to determine lower confidence limits for the reliability. Finally, we present an example to illustrate the methods of inference developed in this paper.</abstract><pub>Elsevier Ltd</pub><doi>10.1016/0026-2714(95)00073-9</doi><tpages>4</tpages></addata></record> |
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title | Reliability estimation and tolerance limits for Laplace distribution based on censored samples |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T16%3A57%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Reliability%20estimation%20and%20tolerance%20limits%20for%20Laplace%20distribution%20based%20on%20censored%20samples&rft.jtitle=Microelectronics%20and%20reliability&rft.au=Balakrishnan,%20N.&rft.date=1996&rft.volume=36&rft.issue=3&rft.spage=375&rft.epage=378&rft.pages=375-378&rft.issn=0026-2714&rft.eissn=1872-941X&rft_id=info:doi/10.1016/0026-2714(95)00073-9&rft_dat=%3Cproquest_cross%3E26349138%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=26349138&rft_id=info:pmid/&rft_els_id=0026271495000739&rfr_iscdi=true |