Design and performance analysis of an optical profilometer for stand-off control
A prototype non-contact high-bandwidth optoelectronic probe for surface topology and laser materials processing stand off control is presented. Radiation from a low power laser beam is focused onto a workpiece surface; the spatial variation in the reflected irradiance is modelled. A Gaussian beam an...
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| Veröffentlicht in: | Measurement science & technology 1994-05, Vol.5 (5), p.517-525 |
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| container_title | Measurement science & technology |
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| creator | Abdullah, H A Chatwin, C R |
| description | A prototype non-contact high-bandwidth optoelectronic probe for surface topology and laser materials processing stand off control is presented. Radiation from a low power laser beam is focused onto a workpiece surface; the spatial variation in the reflected irradiance is modelled. A Gaussian beam and radiometric system model are investigated and compared with experimental results. The profilometer performed well on mild steel, galvanized steel, stainless steel, aluminium, nickel and rubber. (Original abstract-amended) |
| doi_str_mv | 10.1088/0957-0233/5/5/009 |
| format | Article |
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Radiation from a low power laser beam is focused onto a workpiece surface; the spatial variation in the reflected irradiance is modelled. A Gaussian beam and radiometric system model are investigated and compared with experimental results. The profilometer performed well on mild steel, galvanized steel, stainless steel, aluminium, nickel and rubber. (Original abstract-amended)</description><subject>Applied sciences</subject><subject>Exact sciences and technology</subject><subject>Industrial metrology. Testing</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Mechanical engineering. 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| fulltext | fulltext |
| identifier | ISSN: 0957-0233 |
| ispartof | Measurement science & technology, 1994-05, Vol.5 (5), p.517-525 |
| issn | 0957-0233 1361-6501 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_26337809 |
| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Applied sciences Exact sciences and technology Industrial metrology. Testing Instruments, apparatus, components and techniques common to several branches of physics and astronomy Mechanical engineering. Machine design Non-destructive testing: methods and equipments Optical instruments, equipment and techniques Physics |
| title | Design and performance analysis of an optical profilometer for stand-off control |
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