Correlation of giant magnetoresistance with interfacial roughness in Co/Cu superlattices
We investigate the relationship between the magnetoresistance and the interfacial roughness of Co/Cu superlattices whose interface structures are varied by changing sputtering methods, varying sputtering gas pressure and annealing temperatures. X-ray diffraction (XRD) experiments have revealed that...
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| Veröffentlicht in: | Japanese Journal of Applied Physics 1994-11, Vol.33 (11), p.6173-6178 |
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| container_end_page | 6178 |
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| container_issue | 11 |
| container_start_page | 6173 |
| container_title | Japanese Journal of Applied Physics |
| container_volume | 33 |
| creator | UEDA, H KITAKAMI, O SHIMADA, Y GOTO, Y YAMAMOTO, M |
| description | We investigate the relationship between the magnetoresistance and the interfacial roughness of Co/Cu
superlattices whose interface structures are varied by changing sputtering methods, varying sputtering gas pressure
and annealing temperatures. X-ray diffraction (XRD) experiments have revealed that the root mean square roughness
determined from low-angle XRD spectra is a good measure to evaluate the interfacial roughness which determines the
areal occupation of antiferromagnetically coupled regions and the magnetoresistance ratio. |
| doi_str_mv | 10.1143/jjap.33.6173 |
| format | Article |
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superlattices whose interface structures are varied by changing sputtering methods, varying sputtering gas pressure
and annealing temperatures. X-ray diffraction (XRD) experiments have revealed that the root mean square roughness
determined from low-angle XRD spectra is a good measure to evaluate the interfacial roughness which determines the
areal occupation of antiferromagnetically coupled regions and the magnetoresistance ratio.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/jjap.33.6173</identifier><identifier>CODEN: JJAPA5</identifier><language>eng</language><publisher>Tokyo: Japanese journal of applied physics</publisher><subject>Applied sciences ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Electrical properties of specific thin films ; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures ; Electronic transport phenomena in thin films and low-dimensional structures ; Exact sciences and technology ; Galvanomagnetic and other magnetotransport effects (including thermomagnetic effects) ; Metal and metallic alloys ; Metals and metallic alloys ; Metals. Metallurgy ; Physics ; Solid surfaces and solid-solid interfaces ; Surface structure and topography ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><ispartof>Japanese Journal of Applied Physics, 1994-11, Vol.33 (11), p.6173-6178</ispartof><rights>1995 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c429t-e4e4f46bb2bb3412c3f622d51dd854e265e291ea7b9c11813b297aeb93f74b1a3</citedby><cites>FETCH-LOGICAL-c429t-e4e4f46bb2bb3412c3f622d51dd854e265e291ea7b9c11813b297aeb93f74b1a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=3327916$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>UEDA, H</creatorcontrib><creatorcontrib>KITAKAMI, O</creatorcontrib><creatorcontrib>SHIMADA, Y</creatorcontrib><creatorcontrib>GOTO, Y</creatorcontrib><creatorcontrib>YAMAMOTO, M</creatorcontrib><title>Correlation of giant magnetoresistance with interfacial roughness in Co/Cu superlattices</title><title>Japanese Journal of Applied Physics</title><description>We investigate the relationship between the magnetoresistance and the interfacial roughness of Co/Cu
superlattices whose interface structures are varied by changing sputtering methods, varying sputtering gas pressure
and annealing temperatures. X-ray diffraction (XRD) experiments have revealed that the root mean square roughness
determined from low-angle XRD spectra is a good measure to evaluate the interfacial roughness which determines the
areal occupation of antiferromagnetically coupled regions and the magnetoresistance ratio.</description><subject>Applied sciences</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Electrical properties of specific thin films</subject><subject>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</subject><subject>Electronic transport phenomena in thin films and low-dimensional structures</subject><subject>Exact sciences and technology</subject><subject>Galvanomagnetic and other magnetotransport effects (including thermomagnetic effects)</subject><subject>Metal and metallic alloys</subject><subject>Metals and metallic alloys</subject><subject>Metals. Metallurgy</subject><subject>Physics</subject><subject>Solid surfaces and solid-solid interfaces</subject><subject>Surface structure and topography</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1994</creationdate><recordtype>article</recordtype><recordid>eNo9kE1LAzEQhoMoWKs3f0AO4sltNx-b7R7L4lcp6EHBW0jSSZuy3dQki_jvTWnxNMzwvA_Di9AtKSeEcDbdbtV-wthEkJqdoRFhvC54KapzNCpLSgreUHqJrmLc5lVUnIzQV-tDgE4l53vsLV471Se8U-sekg8QXUyqN4B_XNpg1ycIVhmnOhz8sN70EGO-4tZP2wHHYQ8hq5IzEK_RhVVdhJvTHKPPp8eP9qVYvj2_tvNlYThtUgEcuOVCa6o144QaZgWlq4qsVrOKQ_4SaENA1boxhMwI07SpFeiG2ZprotgY3R-9--C_B4hJ7lw00HWqBz9ESQWjIisz-HAETfAxBrByH9xOhV9JSnmoTy4W83fJmDzUl_G7k1dFozobcg0u_mcYo3VDBPsDsmVxKg</recordid><startdate>19941101</startdate><enddate>19941101</enddate><creator>UEDA, H</creator><creator>KITAKAMI, O</creator><creator>SHIMADA, Y</creator><creator>GOTO, Y</creator><creator>YAMAMOTO, M</creator><general>Japanese journal of applied physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>H8G</scope><scope>JG9</scope></search><sort><creationdate>19941101</creationdate><title>Correlation of giant magnetoresistance with interfacial roughness in Co/Cu superlattices</title><author>UEDA, H ; KITAKAMI, O ; SHIMADA, Y ; GOTO, Y ; YAMAMOTO, M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c429t-e4e4f46bb2bb3412c3f622d51dd854e265e291ea7b9c11813b297aeb93f74b1a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1994</creationdate><topic>Applied sciences</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Electrical properties of specific thin films</topic><topic>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</topic><topic>Electronic transport phenomena in thin films and low-dimensional structures</topic><topic>Exact sciences and technology</topic><topic>Galvanomagnetic and other magnetotransport effects (including thermomagnetic effects)</topic><topic>Metal and metallic alloys</topic><topic>Metals and metallic alloys</topic><topic>Metals. Metallurgy</topic><topic>Physics</topic><topic>Solid surfaces and solid-solid interfaces</topic><topic>Surface structure and topography</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>UEDA, H</creatorcontrib><creatorcontrib>KITAKAMI, O</creatorcontrib><creatorcontrib>SHIMADA, Y</creatorcontrib><creatorcontrib>GOTO, Y</creatorcontrib><creatorcontrib>YAMAMOTO, M</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Copper Technical Reference Library</collection><collection>Materials Research Database</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>UEDA, H</au><au>KITAKAMI, O</au><au>SHIMADA, Y</au><au>GOTO, Y</au><au>YAMAMOTO, M</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Correlation of giant magnetoresistance with interfacial roughness in Co/Cu superlattices</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>1994-11-01</date><risdate>1994</risdate><volume>33</volume><issue>11</issue><spage>6173</spage><epage>6178</epage><pages>6173-6178</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPA5</coden><abstract>We investigate the relationship between the magnetoresistance and the interfacial roughness of Co/Cu
superlattices whose interface structures are varied by changing sputtering methods, varying sputtering gas pressure
and annealing temperatures. X-ray diffraction (XRD) experiments have revealed that the root mean square roughness
determined from low-angle XRD spectra is a good measure to evaluate the interfacial roughness which determines the
areal occupation of antiferromagnetically coupled regions and the magnetoresistance ratio.</abstract><cop>Tokyo</cop><pub>Japanese journal of applied physics</pub><doi>10.1143/jjap.33.6173</doi><tpages>6</tpages></addata></record> |
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| ispartof | Japanese Journal of Applied Physics, 1994-11, Vol.33 (11), p.6173-6178 |
| issn | 0021-4922 1347-4065 |
| language | eng |
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| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Electrical properties of specific thin films Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Electronic transport phenomena in thin films and low-dimensional structures Exact sciences and technology Galvanomagnetic and other magnetotransport effects (including thermomagnetic effects) Metal and metallic alloys Metals and metallic alloys Metals. Metallurgy Physics Solid surfaces and solid-solid interfaces Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
| title | Correlation of giant magnetoresistance with interfacial roughness in Co/Cu superlattices |
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