Effective medium optical modelling of indium tin oxide nanocrystal films
Doped semiconductor nanocrystal-based thin films are widely used for many applications, such as screens, electrochromic windows, light emitting diodes, and solar cells. Herein, we have employed spectroscopic ellipsometry to measure and model the complex dielectric response of indium tin oxide films...
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Veröffentlicht in: | Physical chemistry chemical physics : PCCP 2022-03, Vol.24 (9), p.5317-5322 |
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creator | Sygletou, Maria Marangi, Fabio Varas, Stefano Chiasera, Alessandro Canepa, Maurizio Scotognella, Francesco Bisio, Francesco |
description | Doped semiconductor nanocrystal-based thin films are widely used for many applications, such as screens, electrochromic windows, light emitting diodes, and solar cells. Herein, we have employed spectroscopic ellipsometry to measure and model the complex dielectric response of indium tin oxide films fabricated by nanocrystal deposition and sintering. The films could be modelled as Bruggemann effective media, allowing estimation of the nanoscale interstitial porosity of the structure. The effective dielectric constants show the possibility of tuning the plasma frequency and the epsilon-near zero condition of the film.
We measure and model the complex dielectric response of indium tin oxide films fabricated by nanocrystal deposition and sintering. |
doi_str_mv | 10.1039/d1cp05897e |
format | Article |
fullrecord | <record><control><sourceid>proquest_rsc_p</sourceid><recordid>TN_cdi_proquest_miscellaneous_2631642529</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2635095822</sourcerecordid><originalsourceid>FETCH-LOGICAL-c373t-3c7a40168d38eaff37c023cd7b5d0f0407f13f317f630620a4bd0834a48e330b3</originalsourceid><addsrcrecordid>eNpd0U1LxDAQBuAgiruuXrwrBS8iVCedtE2Psq6usKAHPZc0TSRL29SmFfffm_1wBU8zMA_D8A4h5xRuKWB2V1LZQsyzVB2QMWUJhhlwdrjv02RETpxbAgCNKR6TEcaUc8qyMZnPtFayN18qqFVphjqwbW-kqILalqqqTPMRWB2YZjPrTRPYb1OqoBGNld3K9V5qU9XulBxpUTl1tqsT8v44e5vOw8XL0_P0fhFKTLEPUaaCAU14iVwJrTGVEKEs0yIuQQODVFPUSFOdICQRCFaUwJEJxhUiFDgh19u9bWc_B-X6vDZO-ktFo-zg8ihBmrAojjJPr_7RpR26xl-3VjFkMY8ir262SnbWuU7pvO1MLbpVTiFf55s_0OnrJt-Zx5e7lUPh89rT30A9uNiCzsn99O9B-APoJ34N</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2635095822</pqid></control><display><type>article</type><title>Effective medium optical modelling of indium tin oxide nanocrystal films</title><source>Royal Society Of Chemistry Journals 2008-</source><source>Alma/SFX Local Collection</source><creator>Sygletou, Maria ; Marangi, Fabio ; Varas, Stefano ; Chiasera, Alessandro ; Canepa, Maurizio ; Scotognella, Francesco ; Bisio, Francesco</creator><creatorcontrib>Sygletou, Maria ; Marangi, Fabio ; Varas, Stefano ; Chiasera, Alessandro ; Canepa, Maurizio ; Scotognella, Francesco ; Bisio, Francesco</creatorcontrib><description>Doped semiconductor nanocrystal-based thin films are widely used for many applications, such as screens, electrochromic windows, light emitting diodes, and solar cells. Herein, we have employed spectroscopic ellipsometry to measure and model the complex dielectric response of indium tin oxide films fabricated by nanocrystal deposition and sintering. The films could be modelled as Bruggemann effective media, allowing estimation of the nanoscale interstitial porosity of the structure. The effective dielectric constants show the possibility of tuning the plasma frequency and the epsilon-near zero condition of the film.
We measure and model the complex dielectric response of indium tin oxide films fabricated by nanocrystal deposition and sintering.</description><identifier>ISSN: 1463-9076</identifier><identifier>EISSN: 1463-9084</identifier><identifier>DOI: 10.1039/d1cp05897e</identifier><identifier>PMID: 35188149</identifier><language>eng</language><publisher>England: Royal Society of Chemistry</publisher><subject>Electrochromism ; Indium tin oxides ; Light emitting diodes ; Nanocrystals ; Oxide coatings ; Photovoltaic cells ; Plasma frequencies ; Sintering (powder metallurgy) ; Solar cells ; Spectroellipsometry ; Thin films</subject><ispartof>Physical chemistry chemical physics : PCCP, 2022-03, Vol.24 (9), p.5317-5322</ispartof><rights>Copyright Royal Society of Chemistry 2022</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c373t-3c7a40168d38eaff37c023cd7b5d0f0407f13f317f630620a4bd0834a48e330b3</citedby><cites>FETCH-LOGICAL-c373t-3c7a40168d38eaff37c023cd7b5d0f0407f13f317f630620a4bd0834a48e330b3</cites><orcidid>0000-0003-2781-2116 ; 0000-0002-5148-1233 ; 0000-0002-7046-5001 ; 0000-0003-2691-3986</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/35188149$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Sygletou, Maria</creatorcontrib><creatorcontrib>Marangi, Fabio</creatorcontrib><creatorcontrib>Varas, Stefano</creatorcontrib><creatorcontrib>Chiasera, Alessandro</creatorcontrib><creatorcontrib>Canepa, Maurizio</creatorcontrib><creatorcontrib>Scotognella, Francesco</creatorcontrib><creatorcontrib>Bisio, Francesco</creatorcontrib><title>Effective medium optical modelling of indium tin oxide nanocrystal films</title><title>Physical chemistry chemical physics : PCCP</title><addtitle>Phys Chem Chem Phys</addtitle><description>Doped semiconductor nanocrystal-based thin films are widely used for many applications, such as screens, electrochromic windows, light emitting diodes, and solar cells. Herein, we have employed spectroscopic ellipsometry to measure and model the complex dielectric response of indium tin oxide films fabricated by nanocrystal deposition and sintering. The films could be modelled as Bruggemann effective media, allowing estimation of the nanoscale interstitial porosity of the structure. The effective dielectric constants show the possibility of tuning the plasma frequency and the epsilon-near zero condition of the film.
We measure and model the complex dielectric response of indium tin oxide films fabricated by nanocrystal deposition and sintering.</description><subject>Electrochromism</subject><subject>Indium tin oxides</subject><subject>Light emitting diodes</subject><subject>Nanocrystals</subject><subject>Oxide coatings</subject><subject>Photovoltaic cells</subject><subject>Plasma frequencies</subject><subject>Sintering (powder metallurgy)</subject><subject>Solar cells</subject><subject>Spectroellipsometry</subject><subject>Thin films</subject><issn>1463-9076</issn><issn>1463-9084</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNpd0U1LxDAQBuAgiruuXrwrBS8iVCedtE2Psq6usKAHPZc0TSRL29SmFfffm_1wBU8zMA_D8A4h5xRuKWB2V1LZQsyzVB2QMWUJhhlwdrjv02RETpxbAgCNKR6TEcaUc8qyMZnPtFayN18qqFVphjqwbW-kqILalqqqTPMRWB2YZjPrTRPYb1OqoBGNld3K9V5qU9XulBxpUTl1tqsT8v44e5vOw8XL0_P0fhFKTLEPUaaCAU14iVwJrTGVEKEs0yIuQQODVFPUSFOdICQRCFaUwJEJxhUiFDgh19u9bWc_B-X6vDZO-ktFo-zg8ihBmrAojjJPr_7RpR26xl-3VjFkMY8ir262SnbWuU7pvO1MLbpVTiFf55s_0OnrJt-Zx5e7lUPh89rT30A9uNiCzsn99O9B-APoJ34N</recordid><startdate>20220302</startdate><enddate>20220302</enddate><creator>Sygletou, Maria</creator><creator>Marangi, Fabio</creator><creator>Varas, Stefano</creator><creator>Chiasera, Alessandro</creator><creator>Canepa, Maurizio</creator><creator>Scotognella, Francesco</creator><creator>Bisio, Francesco</creator><general>Royal Society of Chemistry</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0003-2781-2116</orcidid><orcidid>https://orcid.org/0000-0002-5148-1233</orcidid><orcidid>https://orcid.org/0000-0002-7046-5001</orcidid><orcidid>https://orcid.org/0000-0003-2691-3986</orcidid></search><sort><creationdate>20220302</creationdate><title>Effective medium optical modelling of indium tin oxide nanocrystal films</title><author>Sygletou, Maria ; Marangi, Fabio ; Varas, Stefano ; Chiasera, Alessandro ; Canepa, Maurizio ; Scotognella, Francesco ; Bisio, Francesco</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c373t-3c7a40168d38eaff37c023cd7b5d0f0407f13f317f630620a4bd0834a48e330b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Electrochromism</topic><topic>Indium tin oxides</topic><topic>Light emitting diodes</topic><topic>Nanocrystals</topic><topic>Oxide coatings</topic><topic>Photovoltaic cells</topic><topic>Plasma frequencies</topic><topic>Sintering (powder metallurgy)</topic><topic>Solar cells</topic><topic>Spectroellipsometry</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sygletou, Maria</creatorcontrib><creatorcontrib>Marangi, Fabio</creatorcontrib><creatorcontrib>Varas, Stefano</creatorcontrib><creatorcontrib>Chiasera, Alessandro</creatorcontrib><creatorcontrib>Canepa, Maurizio</creatorcontrib><creatorcontrib>Scotognella, Francesco</creatorcontrib><creatorcontrib>Bisio, Francesco</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Physical chemistry chemical physics : PCCP</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sygletou, Maria</au><au>Marangi, Fabio</au><au>Varas, Stefano</au><au>Chiasera, Alessandro</au><au>Canepa, Maurizio</au><au>Scotognella, Francesco</au><au>Bisio, Francesco</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effective medium optical modelling of indium tin oxide nanocrystal films</atitle><jtitle>Physical chemistry chemical physics : PCCP</jtitle><addtitle>Phys Chem Chem Phys</addtitle><date>2022-03-02</date><risdate>2022</risdate><volume>24</volume><issue>9</issue><spage>5317</spage><epage>5322</epage><pages>5317-5322</pages><issn>1463-9076</issn><eissn>1463-9084</eissn><abstract>Doped semiconductor nanocrystal-based thin films are widely used for many applications, such as screens, electrochromic windows, light emitting diodes, and solar cells. Herein, we have employed spectroscopic ellipsometry to measure and model the complex dielectric response of indium tin oxide films fabricated by nanocrystal deposition and sintering. The films could be modelled as Bruggemann effective media, allowing estimation of the nanoscale interstitial porosity of the structure. The effective dielectric constants show the possibility of tuning the plasma frequency and the epsilon-near zero condition of the film.
We measure and model the complex dielectric response of indium tin oxide films fabricated by nanocrystal deposition and sintering.</abstract><cop>England</cop><pub>Royal Society of Chemistry</pub><pmid>35188149</pmid><doi>10.1039/d1cp05897e</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0003-2781-2116</orcidid><orcidid>https://orcid.org/0000-0002-5148-1233</orcidid><orcidid>https://orcid.org/0000-0002-7046-5001</orcidid><orcidid>https://orcid.org/0000-0003-2691-3986</orcidid><oa>free_for_read</oa></addata></record> |
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source | Royal Society Of Chemistry Journals 2008-; Alma/SFX Local Collection |
subjects | Electrochromism Indium tin oxides Light emitting diodes Nanocrystals Oxide coatings Photovoltaic cells Plasma frequencies Sintering (powder metallurgy) Solar cells Spectroellipsometry Thin films |
title | Effective medium optical modelling of indium tin oxide nanocrystal films |
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