Surface characterization
A review of the literature on surface characterization is presented. The review includes sections on ion spectrometry, electron spectroscopy, proximal probes, optical characterization of surfaces and x-ray techniques.
Gespeichert in:
| Veröffentlicht in: | Analytical chemistry (Washington) 1993-06, Vol.65 (12), p.311-333 |
|---|---|
| Hauptverfasser: | , , , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 333 |
|---|---|
| container_issue | 12 |
| container_start_page | 311 |
| container_title | Analytical chemistry (Washington) |
| container_volume | 65 |
| creator | McGuire, G. E Ray, M. A Simko, Steven J Perkins, F. Keith Brandow, Susan L Dobisz, Elizabeth A Nemanich, R. J Chourasia, A. R Chopra, D. R |
| description | A review of the literature on surface characterization is presented. The review includes sections on ion spectrometry, electron spectroscopy, proximal probes, optical characterization of surfaces and x-ray techniques. |
| doi_str_mv | 10.1021/ac00060a016 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_26242613</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>26242613</sourcerecordid><originalsourceid>FETCH-LOGICAL-a388t-35f1dcf18e4c43497013150eb4d0ea361fe70e5e79d2f0df47bdb7ed8dcd97523</originalsourceid><addsrcrecordid>eNpt0E1LAzEQBuAgCtbqyYtHEdGDrM4ku5vsUepHxYJiKx5Dmg_cunZrsgvqrzeypYp4Gph5ZngZQnYRThEonikNADkowHyN9DCjkORC0HXSi32WUA6wSbZCmAEgRtQje-PWO6Xtvn5WXunG-vJTNWU93yYbTlXB7ixrnzxeXU4Gw2R0d30zOB8lignRJCxzaLRDYVOdsrTggAwzsNPUgFUsR2c52MzywlAHxqV8aqbcGmG0KXhGWZ8cdXcXvn5rbWjkaxm0rSo1t3UbJM1pSnNkER78gbO69fOYTVLkokDKREQnHdK-DsFbJxe-fFX-QyLI7xfJXy-K-nB5UgWtKufVXJdhtZIKEGmBkSUdK0Nj31dj5V9kzhnP5OR-LB_okLOLWyafoj_uvNLhJ-R_Ab4ACRd-ng</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>217891238</pqid></control><display><type>article</type><title>Surface characterization</title><source>American Chemical Society Journals</source><creator>McGuire, G. E ; Ray, M. A ; Simko, Steven J ; Perkins, F. Keith ; Brandow, Susan L ; Dobisz, Elizabeth A ; Nemanich, R. J ; Chourasia, A. R ; Chopra, D. R</creator><creatorcontrib>McGuire, G. E ; Ray, M. A ; Simko, Steven J ; Perkins, F. Keith ; Brandow, Susan L ; Dobisz, Elizabeth A ; Nemanich, R. J ; Chourasia, A. R ; Chopra, D. R</creatorcontrib><description>A review of the literature on surface characterization is presented. The review includes sections on ion spectrometry, electron spectroscopy, proximal probes, optical characterization of surfaces and x-ray techniques.</description><identifier>ISSN: 0003-2700</identifier><identifier>EISSN: 1520-6882</identifier><identifier>DOI: 10.1021/ac00060a016</identifier><identifier>CODEN: ANCHAM</identifier><language>eng</language><publisher>Washington, DC: American Chemical Society</publisher><subject>Analytical chemistry ; Chemistry ; Electrons ; Exact sciences and technology ; General, instrumentation ; Ions ; Scientific imaging ; X-rays</subject><ispartof>Analytical chemistry (Washington), 1993-06, Vol.65 (12), p.311-333</ispartof><rights>1993 INIST-CNRS</rights><rights>Copyright American Chemical Society Jun 15, 1993</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a388t-35f1dcf18e4c43497013150eb4d0ea361fe70e5e79d2f0df47bdb7ed8dcd97523</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/ac00060a016$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/ac00060a016$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>314,776,780,2752,27053,27901,27902,56713,56763</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=4808491$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>McGuire, G. E</creatorcontrib><creatorcontrib>Ray, M. A</creatorcontrib><creatorcontrib>Simko, Steven J</creatorcontrib><creatorcontrib>Perkins, F. Keith</creatorcontrib><creatorcontrib>Brandow, Susan L</creatorcontrib><creatorcontrib>Dobisz, Elizabeth A</creatorcontrib><creatorcontrib>Nemanich, R. J</creatorcontrib><creatorcontrib>Chourasia, A. R</creatorcontrib><creatorcontrib>Chopra, D. R</creatorcontrib><title>Surface characterization</title><title>Analytical chemistry (Washington)</title><addtitle>Anal. Chem</addtitle><description>A review of the literature on surface characterization is presented. The review includes sections on ion spectrometry, electron spectroscopy, proximal probes, optical characterization of surfaces and x-ray techniques.</description><subject>Analytical chemistry</subject><subject>Chemistry</subject><subject>Electrons</subject><subject>Exact sciences and technology</subject><subject>General, instrumentation</subject><subject>Ions</subject><subject>Scientific imaging</subject><subject>X-rays</subject><issn>0003-2700</issn><issn>1520-6882</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1993</creationdate><recordtype>article</recordtype><recordid>eNpt0E1LAzEQBuAgCtbqyYtHEdGDrM4ku5vsUepHxYJiKx5Dmg_cunZrsgvqrzeypYp4Gph5ZngZQnYRThEonikNADkowHyN9DCjkORC0HXSi32WUA6wSbZCmAEgRtQje-PWO6Xtvn5WXunG-vJTNWU93yYbTlXB7ixrnzxeXU4Gw2R0d30zOB8lignRJCxzaLRDYVOdsrTggAwzsNPUgFUsR2c52MzywlAHxqV8aqbcGmG0KXhGWZ8cdXcXvn5rbWjkaxm0rSo1t3UbJM1pSnNkER78gbO69fOYTVLkokDKREQnHdK-DsFbJxe-fFX-QyLI7xfJXy-K-nB5UgWtKufVXJdhtZIKEGmBkSUdK0Nj31dj5V9kzhnP5OR-LB_okLOLWyafoj_uvNLhJ-R_Ab4ACRd-ng</recordid><startdate>19930615</startdate><enddate>19930615</enddate><creator>McGuire, G. E</creator><creator>Ray, M. A</creator><creator>Simko, Steven J</creator><creator>Perkins, F. Keith</creator><creator>Brandow, Susan L</creator><creator>Dobisz, Elizabeth A</creator><creator>Nemanich, R. J</creator><creator>Chourasia, A. R</creator><creator>Chopra, D. R</creator><general>American Chemical Society</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QO</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7TA</scope><scope>7TB</scope><scope>7TM</scope><scope>7U5</scope><scope>7U7</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H8G</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>P64</scope></search><sort><creationdate>19930615</creationdate><title>Surface characterization</title><author>McGuire, G. E ; Ray, M. A ; Simko, Steven J ; Perkins, F. Keith ; Brandow, Susan L ; Dobisz, Elizabeth A ; Nemanich, R. J ; Chourasia, A. R ; Chopra, D. R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a388t-35f1dcf18e4c43497013150eb4d0ea361fe70e5e79d2f0df47bdb7ed8dcd97523</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1993</creationdate><topic>Analytical chemistry</topic><topic>Chemistry</topic><topic>Electrons</topic><topic>Exact sciences and technology</topic><topic>General, instrumentation</topic><topic>Ions</topic><topic>Scientific imaging</topic><topic>X-rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>McGuire, G. E</creatorcontrib><creatorcontrib>Ray, M. A</creatorcontrib><creatorcontrib>Simko, Steven J</creatorcontrib><creatorcontrib>Perkins, F. Keith</creatorcontrib><creatorcontrib>Brandow, Susan L</creatorcontrib><creatorcontrib>Dobisz, Elizabeth A</creatorcontrib><creatorcontrib>Nemanich, R. J</creatorcontrib><creatorcontrib>Chourasia, A. R</creatorcontrib><creatorcontrib>Chopra, D. R</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Biotechnology Research Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Nucleic Acids Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Toxicology Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Copper Technical Reference Library</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>Analytical chemistry (Washington)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>McGuire, G. E</au><au>Ray, M. A</au><au>Simko, Steven J</au><au>Perkins, F. Keith</au><au>Brandow, Susan L</au><au>Dobisz, Elizabeth A</au><au>Nemanich, R. J</au><au>Chourasia, A. R</au><au>Chopra, D. R</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Surface characterization</atitle><jtitle>Analytical chemistry (Washington)</jtitle><addtitle>Anal. Chem</addtitle><date>1993-06-15</date><risdate>1993</risdate><volume>65</volume><issue>12</issue><spage>311</spage><epage>333</epage><pages>311-333</pages><issn>0003-2700</issn><eissn>1520-6882</eissn><coden>ANCHAM</coden><abstract>A review of the literature on surface characterization is presented. The review includes sections on ion spectrometry, electron spectroscopy, proximal probes, optical characterization of surfaces and x-ray techniques.</abstract><cop>Washington, DC</cop><pub>American Chemical Society</pub><doi>10.1021/ac00060a016</doi><tpages>23</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-2700 |
| ispartof | Analytical chemistry (Washington), 1993-06, Vol.65 (12), p.311-333 |
| issn | 0003-2700 1520-6882 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_26242613 |
| source | American Chemical Society Journals |
| subjects | Analytical chemistry Chemistry Electrons Exact sciences and technology General, instrumentation Ions Scientific imaging X-rays |
| title | Surface characterization |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T08%3A10%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Surface%20characterization&rft.jtitle=Analytical%20chemistry%20(Washington)&rft.au=McGuire,%20G.%20E&rft.date=1993-06-15&rft.volume=65&rft.issue=12&rft.spage=311&rft.epage=333&rft.pages=311-333&rft.issn=0003-2700&rft.eissn=1520-6882&rft.coden=ANCHAM&rft_id=info:doi/10.1021/ac00060a016&rft_dat=%3Cproquest_cross%3E26242613%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=217891238&rft_id=info:pmid/&rfr_iscdi=true |