A review of testing methods for mixed-signal ICs

Recent developments in Application Specific Integrated Circuits (ASICs), which contain analogue as well as digital components on-chip, has meant an upsurge of interest in the problems of testing. Much successful research has already been carried out in fault-testing digital ICs, but although several...

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Veröffentlicht in:	Microelectronics 1993-10, Vol.24 (6), p.663-674
Hauptverfasser:	Harvey, R.J.A., Bratt, A.H., Dorey, A.P.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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