An approach to modeling total dose ionizing radiation effects in Hg(1-x)Cd(x)Te photodiodes using Pisces II-B

We have modified a 2D numerical device simulator to account for the electrical characteristics of mercury cadmium telluride (MCT), and compared the simulated current-voltage (I-V) results with measurements. For diodes not dominated by tunneling or other surface effects, the simulated curves match th...

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Veröffentlicht in:IEEE transactions on nuclear science 1993-12, Vol.40 (6), p.1597-1601
Hauptverfasser: Petrosky, J C, Howard, J W, Block, R C, Bhat, I, Stauber, M C
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container_issue 6
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container_title IEEE transactions on nuclear science
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creator Petrosky, J C
Howard, J W
Block, R C
Bhat, I
Stauber, M C
description We have modified a 2D numerical device simulator to account for the electrical characteristics of mercury cadmium telluride (MCT), and compared the simulated current-voltage (I-V) results with measurements. For diodes not dominated by tunneling or other surface effects, the simulated curves match the measurement within the experimental limitations. The modified code can now be used to investigate the changes in the I-V characteristics of irradiated diodes by adding the appropriate models. We show the results of an investigation of the band-to-band tunneling in these diodes, which theory predicts is a dominant current-producing mechanism after irradiation. The I-V curves closely match those of irradiated diodes if radiation-induced trapped surface charge is taken into account. (Author)
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fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_26142183</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>26142183</sourcerecordid><originalsourceid>FETCH-proquest_miscellaneous_261421833</originalsourceid><addsrcrecordid>eNqNjssKwjAQRbNQsD7-YVZSF4WmrWKXKoruXLiX0EzbSJrUTgrFrzcFP8DVnTOcGe6EBXHM91Ge5fmMzYleHrNtvA1YczAg2razoqjBWWisRK1M5WcnNEhLCMoa9Rl3nZBKOI-AZYmFI1AGrlXIo2FzkuGweSC0tXVWKv-GoKfx6q6o8HC7Rcclm5ZCE65-uWDry_lxuka-wLtHcs9mlLUWBm1Pz2THs4Tv0_Rv8QuEekqv</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>26142183</pqid></control><display><type>article</type><title>An approach to modeling total dose ionizing radiation effects in Hg(1-x)Cd(x)Te photodiodes using Pisces II-B</title><source>IEEE Electronic Library (IEL)</source><creator>Petrosky, J C ; Howard, J W ; Block, R C ; Bhat, I ; Stauber, M C</creator><creatorcontrib>Petrosky, J C ; Howard, J W ; Block, R C ; Bhat, I ; Stauber, M C</creatorcontrib><description>We have modified a 2D numerical device simulator to account for the electrical characteristics of mercury cadmium telluride (MCT), and compared the simulated current-voltage (I-V) results with measurements. For diodes not dominated by tunneling or other surface effects, the simulated curves match the measurement within the experimental limitations. The modified code can now be used to investigate the changes in the I-V characteristics of irradiated diodes by adding the appropriate models. We show the results of an investigation of the band-to-band tunneling in these diodes, which theory predicts is a dominant current-producing mechanism after irradiation. The I-V curves closely match those of irradiated diodes if radiation-induced trapped surface charge is taken into account. (Author)</description><identifier>ISSN: 0018-9499</identifier><language>eng</language><ispartof>IEEE transactions on nuclear science, 1993-12, Vol.40 (6), p.1597-1601</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784</link.rule.ids></links><search><creatorcontrib>Petrosky, J C</creatorcontrib><creatorcontrib>Howard, J W</creatorcontrib><creatorcontrib>Block, R C</creatorcontrib><creatorcontrib>Bhat, I</creatorcontrib><creatorcontrib>Stauber, M C</creatorcontrib><title>An approach to modeling total dose ionizing radiation effects in Hg(1-x)Cd(x)Te photodiodes using Pisces II-B</title><title>IEEE transactions on nuclear science</title><description>We have modified a 2D numerical device simulator to account for the electrical characteristics of mercury cadmium telluride (MCT), and compared the simulated current-voltage (I-V) results with measurements. For diodes not dominated by tunneling or other surface effects, the simulated curves match the measurement within the experimental limitations. The modified code can now be used to investigate the changes in the I-V characteristics of irradiated diodes by adding the appropriate models. We show the results of an investigation of the band-to-band tunneling in these diodes, which theory predicts is a dominant current-producing mechanism after irradiation. The I-V curves closely match those of irradiated diodes if radiation-induced trapped surface charge is taken into account. (Author)</description><issn>0018-9499</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1993</creationdate><recordtype>article</recordtype><recordid>eNqNjssKwjAQRbNQsD7-YVZSF4WmrWKXKoruXLiX0EzbSJrUTgrFrzcFP8DVnTOcGe6EBXHM91Ge5fmMzYleHrNtvA1YczAg2razoqjBWWisRK1M5WcnNEhLCMoa9Rl3nZBKOI-AZYmFI1AGrlXIo2FzkuGweSC0tXVWKv-GoKfx6q6o8HC7Rcclm5ZCE65-uWDry_lxuka-wLtHcs9mlLUWBm1Pz2THs4Tv0_Rv8QuEekqv</recordid><startdate>19931201</startdate><enddate>19931201</enddate><creator>Petrosky, J C</creator><creator>Howard, J W</creator><creator>Block, R C</creator><creator>Bhat, I</creator><creator>Stauber, M C</creator><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>19931201</creationdate><title>An approach to modeling total dose ionizing radiation effects in Hg(1-x)Cd(x)Te photodiodes using Pisces II-B</title><author>Petrosky, J C ; Howard, J W ; Block, R C ; Bhat, I ; Stauber, M C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_261421833</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1993</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Petrosky, J C</creatorcontrib><creatorcontrib>Howard, J W</creatorcontrib><creatorcontrib>Block, R C</creatorcontrib><creatorcontrib>Bhat, I</creatorcontrib><creatorcontrib>Stauber, M C</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Petrosky, J C</au><au>Howard, J W</au><au>Block, R C</au><au>Bhat, I</au><au>Stauber, M C</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An approach to modeling total dose ionizing radiation effects in Hg(1-x)Cd(x)Te photodiodes using Pisces II-B</atitle><jtitle>IEEE transactions on nuclear science</jtitle><date>1993-12-01</date><risdate>1993</risdate><volume>40</volume><issue>6</issue><spage>1597</spage><epage>1601</epage><pages>1597-1601</pages><issn>0018-9499</issn><abstract>We have modified a 2D numerical device simulator to account for the electrical characteristics of mercury cadmium telluride (MCT), and compared the simulated current-voltage (I-V) results with measurements. For diodes not dominated by tunneling or other surface effects, the simulated curves match the measurement within the experimental limitations. The modified code can now be used to investigate the changes in the I-V characteristics of irradiated diodes by adding the appropriate models. We show the results of an investigation of the band-to-band tunneling in these diodes, which theory predicts is a dominant current-producing mechanism after irradiation. The I-V curves closely match those of irradiated diodes if radiation-induced trapped surface charge is taken into account. (Author)</abstract></addata></record>
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title An approach to modeling total dose ionizing radiation effects in Hg(1-x)Cd(x)Te photodiodes using Pisces II-B
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T06%3A04%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=An%20approach%20to%20modeling%20total%20dose%20ionizing%20radiation%20effects%20in%20Hg(1-x)Cd(x)Te%20photodiodes%20using%20Pisces%20II-B&rft.jtitle=IEEE%20transactions%20on%20nuclear%20science&rft.au=Petrosky,%20J%20C&rft.date=1993-12-01&rft.volume=40&rft.issue=6&rft.spage=1597&rft.epage=1601&rft.pages=1597-1601&rft.issn=0018-9499&rft_id=info:doi/&rft_dat=%3Cproquest%3E26142183%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=26142183&rft_id=info:pmid/&rfr_iscdi=true