Energy bands in quantum confined silicon light-emitting diodes
Measurements of the temperature dependence of the current-voltage characteristics of heterojunction light-emitting diodes fabricated by depositing indium tin oxide onto the surface of electrochemically etched p-type silicon (porous silicon) are presented, and the results are compared with those for...
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Veröffentlicht in: | Applied physics letters 1993-07, Vol.63 (1), p.45-47 |
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creator | MARUSKA, H. P NAMAVAR, F KALKHORAN, N. M |
description | Measurements of the temperature dependence of the current-voltage characteristics of heterojunction light-emitting diodes fabricated by depositing indium tin oxide onto the surface of electrochemically etched p-type silicon (porous silicon) are presented, and the results are compared with those for adjacent devices formed on nonprocessed bulk silicon. The barrier height for the diodes which exhibit quantum confinement effects was determined to be 0.42 eV. Unlike the bulk silicon devices, the diodes prepared on porous silicon did not manifest a photovoltaic effect. These observations allow us to present a potential energy diagram for porous silicon heterojunction diodes which indicates barriers in both the conduction band and the valence band. |
doi_str_mv | 10.1063/1.109745 |
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P ; NAMAVAR, F ; KALKHORAN, N. M</creator><creatorcontrib>MARUSKA, H. P ; NAMAVAR, F ; KALKHORAN, N. M</creatorcontrib><description>Measurements of the temperature dependence of the current-voltage characteristics of heterojunction light-emitting diodes fabricated by depositing indium tin oxide onto the surface of electrochemically etched p-type silicon (porous silicon) are presented, and the results are compared with those for adjacent devices formed on nonprocessed bulk silicon. The barrier height for the diodes which exhibit quantum confinement effects was determined to be 0.42 eV. Unlike the bulk silicon devices, the diodes prepared on porous silicon did not manifest a photovoltaic effect. These observations allow us to present a potential energy diagram for porous silicon heterojunction diodes which indicates barriers in both the conduction band and the valence band.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.109745</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville, NY: American Institute of Physics</publisher><subject>Applied sciences ; Electronics ; Exact sciences and technology ; Optoelectronic devices ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>Applied physics letters, 1993-07, Vol.63 (1), p.45-47</ispartof><rights>1994 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c287t-999f86ffb6cfb1243504e489c1ca83779bc47a44921dffa8e53455dc1df2fb193</citedby><cites>FETCH-LOGICAL-c287t-999f86ffb6cfb1243504e489c1ca83779bc47a44921dffa8e53455dc1df2fb193</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=3818869$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>MARUSKA, H. P</creatorcontrib><creatorcontrib>NAMAVAR, F</creatorcontrib><creatorcontrib>KALKHORAN, N. M</creatorcontrib><title>Energy bands in quantum confined silicon light-emitting diodes</title><title>Applied physics letters</title><description>Measurements of the temperature dependence of the current-voltage characteristics of heterojunction light-emitting diodes fabricated by depositing indium tin oxide onto the surface of electrochemically etched p-type silicon (porous silicon) are presented, and the results are compared with those for adjacent devices formed on nonprocessed bulk silicon. The barrier height for the diodes which exhibit quantum confinement effects was determined to be 0.42 eV. Unlike the bulk silicon devices, the diodes prepared on porous silicon did not manifest a photovoltaic effect. These observations allow us to present a potential energy diagram for porous silicon heterojunction diodes which indicates barriers in both the conduction band and the valence band.</description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Optoelectronic devices</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. 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M</creator><general>American Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>19930705</creationdate><title>Energy bands in quantum confined silicon light-emitting diodes</title><author>MARUSKA, H. P ; NAMAVAR, F ; KALKHORAN, N. M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c287t-999f86ffb6cfb1243504e489c1ca83779bc47a44921dffa8e53455dc1df2fb193</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1993</creationdate><topic>Applied sciences</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Optoelectronic devices</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>MARUSKA, H. P</creatorcontrib><creatorcontrib>NAMAVAR, F</creatorcontrib><creatorcontrib>KALKHORAN, N. M</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>MARUSKA, H. P</au><au>NAMAVAR, F</au><au>KALKHORAN, N. M</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Energy bands in quantum confined silicon light-emitting diodes</atitle><jtitle>Applied physics letters</jtitle><date>1993-07-05</date><risdate>1993</risdate><volume>63</volume><issue>1</issue><spage>45</spage><epage>47</epage><pages>45-47</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>Measurements of the temperature dependence of the current-voltage characteristics of heterojunction light-emitting diodes fabricated by depositing indium tin oxide onto the surface of electrochemically etched p-type silicon (porous silicon) are presented, and the results are compared with those for adjacent devices formed on nonprocessed bulk silicon. The barrier height for the diodes which exhibit quantum confinement effects was determined to be 0.42 eV. Unlike the bulk silicon devices, the diodes prepared on porous silicon did not manifest a photovoltaic effect. These observations allow us to present a potential energy diagram for porous silicon heterojunction diodes which indicates barriers in both the conduction band and the valence band.</abstract><cop>Melville, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.109745</doi><tpages>3</tpages></addata></record> |
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subjects | Applied sciences Electronics Exact sciences and technology Optoelectronic devices Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
title | Energy bands in quantum confined silicon light-emitting diodes |
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